{"title":"基于值差的故障仿真","authors":"C. P. Wu, Chung-Len Lee, W. Shen","doi":"10.1109/ATS.1992.224431","DOIUrl":null,"url":null,"abstract":"The authors present a new concept: value difference, which is the difference of the faulty signal from the normal signal on a line, for fault simulation. Due to its saving of the event number, up to 41% saving of the simulation time is achieved. Both theoretical analysis and experimental result are provided.<<ETX>>","PeriodicalId":208029,"journal":{"name":"Proceedings First Asian Test Symposium (ATS `92)","volume":"29 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1992-11-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Fault simulation based on value difference\",\"authors\":\"C. P. Wu, Chung-Len Lee, W. Shen\",\"doi\":\"10.1109/ATS.1992.224431\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The authors present a new concept: value difference, which is the difference of the faulty signal from the normal signal on a line, for fault simulation. Due to its saving of the event number, up to 41% saving of the simulation time is achieved. Both theoretical analysis and experimental result are provided.<<ETX>>\",\"PeriodicalId\":208029,\"journal\":{\"name\":\"Proceedings First Asian Test Symposium (ATS `92)\",\"volume\":\"29 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1992-11-26\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings First Asian Test Symposium (ATS `92)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ATS.1992.224431\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings First Asian Test Symposium (ATS `92)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ATS.1992.224431","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
The authors present a new concept: value difference, which is the difference of the faulty signal from the normal signal on a line, for fault simulation. Due to its saving of the event number, up to 41% saving of the simulation time is achieved. Both theoretical analysis and experimental result are provided.<>