{"title":"用于DDR SDRAM控制器应用的全数字延迟锁环","authors":"Ching-Che Chung, Pao-Lung Chen, Chen-Yi Lee","doi":"10.1109/VDAT.2006.258159","DOIUrl":null,"url":null,"abstract":"This paper presents an all-digital delay-locked loop (DLL) for DDR SDRAM controller applications. The presented all-digital, cell-based, DLL-based five-phase multi-phase clock generator can generate the required fixed timing delay (tSD) for DDR SDRAM controller to capture the output data (DQ) correctly. The proposed DLL-based multi-phase clock generator architecture can lock to the harmonic of input clock period and still get a correct multi-phase clock output. Hence the design challenges to build a high resolution delay line with minimum intrinsic delay can be reduced. Simulation results and chip measurement results show that the proposed DLL can generate desired tSD delay with error < 7.6%. The power consumption of the proposed DLL is 4.1mW (at DDR-200) and is 9.0mW (at DDR-400)","PeriodicalId":356198,"journal":{"name":"2006 International Symposium on VLSI Design, Automation and Test","volume":"124 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2006-04-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"15","resultStr":"{\"title\":\"An All-Digital Delay-Locked Loop for DDR SDRAM Controller Applications\",\"authors\":\"Ching-Che Chung, Pao-Lung Chen, Chen-Yi Lee\",\"doi\":\"10.1109/VDAT.2006.258159\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents an all-digital delay-locked loop (DLL) for DDR SDRAM controller applications. The presented all-digital, cell-based, DLL-based five-phase multi-phase clock generator can generate the required fixed timing delay (tSD) for DDR SDRAM controller to capture the output data (DQ) correctly. The proposed DLL-based multi-phase clock generator architecture can lock to the harmonic of input clock period and still get a correct multi-phase clock output. Hence the design challenges to build a high resolution delay line with minimum intrinsic delay can be reduced. Simulation results and chip measurement results show that the proposed DLL can generate desired tSD delay with error < 7.6%. The power consumption of the proposed DLL is 4.1mW (at DDR-200) and is 9.0mW (at DDR-400)\",\"PeriodicalId\":356198,\"journal\":{\"name\":\"2006 International Symposium on VLSI Design, Automation and Test\",\"volume\":\"124 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2006-04-26\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"15\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2006 International Symposium on VLSI Design, Automation and Test\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/VDAT.2006.258159\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2006 International Symposium on VLSI Design, Automation and Test","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VDAT.2006.258159","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
An All-Digital Delay-Locked Loop for DDR SDRAM Controller Applications
This paper presents an all-digital delay-locked loop (DLL) for DDR SDRAM controller applications. The presented all-digital, cell-based, DLL-based five-phase multi-phase clock generator can generate the required fixed timing delay (tSD) for DDR SDRAM controller to capture the output data (DQ) correctly. The proposed DLL-based multi-phase clock generator architecture can lock to the harmonic of input clock period and still get a correct multi-phase clock output. Hence the design challenges to build a high resolution delay line with minimum intrinsic delay can be reduced. Simulation results and chip measurement results show that the proposed DLL can generate desired tSD delay with error < 7.6%. The power consumption of the proposed DLL is 4.1mW (at DDR-200) and is 9.0mW (at DDR-400)