测量和提高数字电路行为描述可测试性的方法

J. Santucci, G. Dray, M. Boumédine, N. Giambiasi
{"title":"测量和提高数字电路行为描述可测试性的方法","authors":"J. Santucci, G. Dray, M. Boumédine, N. Giambiasi","doi":"10.1109/ATS.1992.224448","DOIUrl":null,"url":null,"abstract":"The authors present an approach to reduce the cost of test pattern generation of behavioral descriptions. This approach utilizes a group of methods allowing the designer to assess and to enhance the testability of behavioral descriptions.<<ETX>>","PeriodicalId":208029,"journal":{"name":"Proceedings First Asian Test Symposium (ATS `92)","volume":"59 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1992-11-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"Methods to measure and to enhance the testability of behavioral descriptions of digital circuits\",\"authors\":\"J. Santucci, G. Dray, M. Boumédine, N. Giambiasi\",\"doi\":\"10.1109/ATS.1992.224448\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The authors present an approach to reduce the cost of test pattern generation of behavioral descriptions. This approach utilizes a group of methods allowing the designer to assess and to enhance the testability of behavioral descriptions.<<ETX>>\",\"PeriodicalId\":208029,\"journal\":{\"name\":\"Proceedings First Asian Test Symposium (ATS `92)\",\"volume\":\"59 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1992-11-26\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings First Asian Test Symposium (ATS `92)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ATS.1992.224448\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings First Asian Test Symposium (ATS `92)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ATS.1992.224448","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 4

摘要

提出了一种降低行为描述测试模式生成成本的方法。这种方法利用了一组方法,允许设计者评估并增强行为描述的可测试性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
Methods to measure and to enhance the testability of behavioral descriptions of digital circuits
The authors present an approach to reduce the cost of test pattern generation of behavioral descriptions. This approach utilizes a group of methods allowing the designer to assess and to enhance the testability of behavioral descriptions.<>
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
Localization and aftereffect of automatic test generation A practical approach for the diagnosis of a MIMD network A complement-based fast algorithm to generate universal test sets for combinational function blocks A control constrained test scheduling approach for VLSI circuits Techniques for reducing hardware requirement of self checking combinational circuits
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1