{"title":"用于微波控制的InGaAs开关晶体管","authors":"M. Shokrani, V. Kapoor","doi":"10.1109/ICIPRM.1993.380593","DOIUrl":null,"url":null,"abstract":"InGaAs insulated-gate FETs (IGFETs) with 1.2 /spl mu/m gate lengths have been designed, fabricated and characterized as switch devices for microwave control applications in switched and phase shifter circuits. The devices employed a plasma deposited silicon dioxide gate insulator and had multiple airbridged source regions. The control voltage was applied to the gate through a on chip 5 current k/spl Omega/ mesa resistor to RF isolate the device from the gate supply. The effect of increased gate leakage current on device performance due to the leakage path created by the gate bias resistor is discussed. Three different gate widths of 300 /spl mu/m, 600/spl mu/m and 1200/spl mu/m were investigated to examine the tradeoff between low on state and high off state capacitance. The DC current-voltage (I-V) characteristics as well as small signal scattering parameter (S-parameter) measurement results from 2-20 GHz are presented. The equivalent circuit models of the InGaAs switch FET fitted to the experimentally measured S-parameters are also given.<<ETX>>","PeriodicalId":186256,"journal":{"name":"1993 (5th) International Conference on Indium Phosphide and Related Materials","volume":"41 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1993-04-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"InGaAs switch transistors for microwave control applications\",\"authors\":\"M. Shokrani, V. Kapoor\",\"doi\":\"10.1109/ICIPRM.1993.380593\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"InGaAs insulated-gate FETs (IGFETs) with 1.2 /spl mu/m gate lengths have been designed, fabricated and characterized as switch devices for microwave control applications in switched and phase shifter circuits. The devices employed a plasma deposited silicon dioxide gate insulator and had multiple airbridged source regions. The control voltage was applied to the gate through a on chip 5 current k/spl Omega/ mesa resistor to RF isolate the device from the gate supply. The effect of increased gate leakage current on device performance due to the leakage path created by the gate bias resistor is discussed. Three different gate widths of 300 /spl mu/m, 600/spl mu/m and 1200/spl mu/m were investigated to examine the tradeoff between low on state and high off state capacitance. The DC current-voltage (I-V) characteristics as well as small signal scattering parameter (S-parameter) measurement results from 2-20 GHz are presented. The equivalent circuit models of the InGaAs switch FET fitted to the experimentally measured S-parameters are also given.<<ETX>>\",\"PeriodicalId\":186256,\"journal\":{\"name\":\"1993 (5th) International Conference on Indium Phosphide and Related Materials\",\"volume\":\"41 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1993-04-19\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1993 (5th) International Conference on Indium Phosphide and Related Materials\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICIPRM.1993.380593\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1993 (5th) International Conference on Indium Phosphide and Related Materials","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICIPRM.1993.380593","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
InGaAs switch transistors for microwave control applications
InGaAs insulated-gate FETs (IGFETs) with 1.2 /spl mu/m gate lengths have been designed, fabricated and characterized as switch devices for microwave control applications in switched and phase shifter circuits. The devices employed a plasma deposited silicon dioxide gate insulator and had multiple airbridged source regions. The control voltage was applied to the gate through a on chip 5 current k/spl Omega/ mesa resistor to RF isolate the device from the gate supply. The effect of increased gate leakage current on device performance due to the leakage path created by the gate bias resistor is discussed. Three different gate widths of 300 /spl mu/m, 600/spl mu/m and 1200/spl mu/m were investigated to examine the tradeoff between low on state and high off state capacitance. The DC current-voltage (I-V) characteristics as well as small signal scattering parameter (S-parameter) measurement results from 2-20 GHz are presented. The equivalent circuit models of the InGaAs switch FET fitted to the experimentally measured S-parameters are also given.<>