高性能微处理器的过渡测试

23rd IEEE VLSI Test Symposium (VTS'05) Pub Date : 2005-05-01 DOI:10.1109/VTS.2005.87

Yi-Shing Chang, S. Chakravarty, Hiep Hoang, N. Thorpe, Khen Wee

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引用次数: 16

摘要

讨论了在微处理器大批量生产测试背景下基于扫描的过渡测试的范围和必要性。提出了一种基于闩锁设计的过渡故障分类方法。最后，我们讨论了一个硅实验，以了解基于扫描的转换测试的最基本问题，即它们的鲁棒性。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Transition tests for high performance microprocessors

The scope and need for scan based transition tests in the context of high volume manufacturing testing of microprocessors is discussed. A classification of transition faults for latch based design is presented. Finally, we discuss a silicon experiment to understand the most fundamental issue of scan based transition testing viz. their robustness.

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23rd IEEE VLSI Test Symposium (VTS'05)

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