用瞬态光谱技术研究未掺杂半绝缘低碳砷化镓的深层受体态

F. Dubecký, J. Darmo, J. Betkó, G. Papaioannou, V. Ioannou, M. Baurngartner
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引用次数: 2

摘要

利用PICTS和Photo-DLTS研究了低碳半绝缘未掺杂GaAs的深态。Hall和Photo-Hall测量证明了在Photo-DLTS光谱中观察到的峰是由于电子从深层供体态发射的。在PICTS光谱中获得的其他峰归因于表观能级为E/sub pa/ /spl ap/ 0.18、0.19、0.21和0.5 eV的受体态空穴发射。除0.5 eV水平外,其总浓度的最小值约为1 × 10/sup 15/ cm/sup -3/。探测光谱中占主导振幅的0.5 eV能级峰值与EL2/sup +/++/双给体态的空穴发射有关。0.19和0.21很可能与双受体Ga/sub / As/反位缺陷有关。
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Study of deep acceptor states in undoped Semi-insulating GaAs with low carbon content by transient spectroscopy techniques
Deep states in undoped semi-insulating GaAs with low carbon content were investigated by PICTS and Photo-DLTS. Hall and Photo-Hall measurements proved that peaks observed in Photo-DLTS spectra are due to the electron emission from deep donor states. Other peaks obtained in PICTS spectra were attributed to the hole emission from acceptor states with the apparent energy levels E/sub pa/ /spl ap/ 0.18, 0.19, 0.21, 0.5 eV. A minimal value of their total concentration except of 0.5 eV level was estimated at about 1x10/sup 15/ cm/sup -3/. The peak of 0.5 eV level with dominant amplitude in detected spectra correlates with the hole emission from EL2/sup +/++/ double donor state. The 0.19 and 0.21 levels are most probably related to the double acceptor Ga/sub As/ antisite.defect.
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