用行为模型进行复杂模拟电路老化模拟的第一步

2005 IEEE International Integrated Reliability Workshop Pub Date : 2005-10-17 DOI:10.1109/IRWS.2005.1609581

F. Marc, Y. Danto

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摘要

本文提出了一种新颖的电子电路和系统老化仿真方法。这种方法基于模拟和混合信号硬件描述语言(VHDL-AMS)的使用，使电路的行为描述成为可能，包括与电相关的老化现象。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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First steps toward ageing simulation of complex analogue circuits with behavioural modelling

This paper presents an original approach for ageing simulation of electronic circuits and systems. This approach is based on the use of an analogue and mixed signal hardware description language (VHDL-AMS) that make possible a behavioural description of the circuit including electrically-dependant ageing phenomena.

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2005 IEEE International Integrated Reliability Workshop

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