InAlAs/InP单质和双质异质结构的光学特性

M. Garcia Perez, T. Benyattou, A. Tabata, G. Guillot, M. Sacilotti, P. Abraham, Y. Monteil, J. Tardy
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引用次数: 0

摘要

作者报道了单(InP/InAlAs)和双(InP/InAlAs/InP)异质结构的低温光致发光研究。样品采用650℃常压金属有机气相外延生长。在单一异质结构上,由于InP II型直接界面上的InAlAs,在1.2 eV处观察到众所周知的发射。在双异质结构上,观察到1.3 eV的新发射。研究了激发功率和电场对这一转变的影响。给出了对斜面样品进行光学测量的结果。结果表明,这种发射与界面复合有关,两者的界面不是等效的
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Optical characterization of InAlAs/InP single and double heterostructures
The authors report low temperature photoluminescence studies of single (InP/InAlAs) and double (InP/InAlAs/InP) heterostructures. The samples were grown by atmospheric pressure metal organic vapor phase epitaxy at 650/spl deg/C. On the single heterostructure, the well known emission was observed at 1.2 eV due to InAlAs on InP type II direct interface. On the double heterostructure, a new emission at 1.3 eV has been observed. The influence of the excitation power and the electric field was investigated on this transition. Optical measurement results are presented carried out on a bevelled sample. The results show that this emission is related to an interface recombination and that both interfaces are not equivalent.<>
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