Jiang Cao, D. Logoteta, Sibel Ozkaya, B. Biel, A. Cresti, M. Pala, D. Esseni
{"title":"范德华隧道晶体管的计算研究:基本方面与设计挑战","authors":"Jiang Cao, D. Logoteta, Sibel Ozkaya, B. Biel, A. Cresti, M. Pala, D. Esseni","doi":"10.1109/IEDM.2015.7409684","DOIUrl":null,"url":null,"abstract":"We propose a model Hamiltonian for van der Waals tunnel transistors relying on a few physical parameters that we calibrate against DFT band structure calculations. This approach allowed us to develop a fully three-dimensional (3-D) NEGF based simulator and to investigate fundamental and design aspects related to van der Waals tunnel transistors, such as: (a) area and edge tunneling components, and scaling with device area; (b) impact of top gate alignment and back-oxide thickness on the device performance; (c) influence of inelastic phonon scattering on the device operation and sub-threshold swing; (d) benchmarking of switching energy and delay.","PeriodicalId":336637,"journal":{"name":"2015 IEEE International Electron Devices Meeting (IEDM)","volume":"6 6 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"11","resultStr":"{\"title\":\"A computational study of van der Waals tunnel transistors: Fundamental aspects and design challenges\",\"authors\":\"Jiang Cao, D. Logoteta, Sibel Ozkaya, B. Biel, A. Cresti, M. Pala, D. Esseni\",\"doi\":\"10.1109/IEDM.2015.7409684\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We propose a model Hamiltonian for van der Waals tunnel transistors relying on a few physical parameters that we calibrate against DFT band structure calculations. This approach allowed us to develop a fully three-dimensional (3-D) NEGF based simulator and to investigate fundamental and design aspects related to van der Waals tunnel transistors, such as: (a) area and edge tunneling components, and scaling with device area; (b) impact of top gate alignment and back-oxide thickness on the device performance; (c) influence of inelastic phonon scattering on the device operation and sub-threshold swing; (d) benchmarking of switching energy and delay.\",\"PeriodicalId\":336637,\"journal\":{\"name\":\"2015 IEEE International Electron Devices Meeting (IEDM)\",\"volume\":\"6 6 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2015-12-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"11\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2015 IEEE International Electron Devices Meeting (IEDM)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IEDM.2015.7409684\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 IEEE International Electron Devices Meeting (IEDM)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IEDM.2015.7409684","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A computational study of van der Waals tunnel transistors: Fundamental aspects and design challenges
We propose a model Hamiltonian for van der Waals tunnel transistors relying on a few physical parameters that we calibrate against DFT band structure calculations. This approach allowed us to develop a fully three-dimensional (3-D) NEGF based simulator and to investigate fundamental and design aspects related to van der Waals tunnel transistors, such as: (a) area and edge tunneling components, and scaling with device area; (b) impact of top gate alignment and back-oxide thickness on the device performance; (c) influence of inelastic phonon scattering on the device operation and sub-threshold swing; (d) benchmarking of switching energy and delay.