集成高性能双工作功能逻辑CMOS晶体管与密集的8F/sup 2/垂直DRAM单元

R. Rengarajan, R. Malik, Haining Yang, W. Yan, R. Ramachandran, Boyong He, R. Divakaruni, Yujun Li
{"title":"集成高性能双工作功能逻辑CMOS晶体管与密集的8F/sup 2/垂直DRAM单元","authors":"R. Rengarajan, R. Malik, Haining Yang, W. Yan, R. Ramachandran, Boyong He, R. Divakaruni, Yujun Li","doi":"10.1109/VLSIT.2002.1015387","DOIUrl":null,"url":null,"abstract":"In this paper, we report on integration of high performance dual workfunction logic CMOS transistors with a commodity 8F/sup 2/ vertical DRAM cell for high performance stand-alone DRAM and low-cost low-power embedded DRAM applications. Key process integration features that exploit novel aspects of the vertical DRAM cell to enable a high performance embedded DRAM technology are presented. The impact of pre-metal-dielectric reflow thermal budget on dual workfunction CMOS device characteristics is discussed.","PeriodicalId":103040,"journal":{"name":"2002 Symposium on VLSI Technology. Digest of Technical Papers (Cat. No.01CH37303)","volume":"9 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2002-06-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Integration of high performance dual workfunction logic CMOS transistors with a dense 8F/sup 2/ vertical DRAM cell\",\"authors\":\"R. Rengarajan, R. Malik, Haining Yang, W. Yan, R. Ramachandran, Boyong He, R. Divakaruni, Yujun Li\",\"doi\":\"10.1109/VLSIT.2002.1015387\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper, we report on integration of high performance dual workfunction logic CMOS transistors with a commodity 8F/sup 2/ vertical DRAM cell for high performance stand-alone DRAM and low-cost low-power embedded DRAM applications. Key process integration features that exploit novel aspects of the vertical DRAM cell to enable a high performance embedded DRAM technology are presented. The impact of pre-metal-dielectric reflow thermal budget on dual workfunction CMOS device characteristics is discussed.\",\"PeriodicalId\":103040,\"journal\":{\"name\":\"2002 Symposium on VLSI Technology. Digest of Technical Papers (Cat. No.01CH37303)\",\"volume\":\"9 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2002-06-11\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2002 Symposium on VLSI Technology. Digest of Technical Papers (Cat. No.01CH37303)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/VLSIT.2002.1015387\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2002 Symposium on VLSI Technology. Digest of Technical Papers (Cat. No.01CH37303)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VLSIT.2002.1015387","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

摘要

在本文中,我们报告了高性能双工作功能逻辑CMOS晶体管与商用8F/sup 2/垂直DRAM单元的集成,用于高性能独立DRAM和低成本低功耗嵌入式DRAM应用。提出了利用垂直DRAM单元的新方面来实现高性能嵌入式DRAM技术的关键工艺集成特性。讨论了金属前介质再流热收支对双功函数CMOS器件特性的影响。
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Integration of high performance dual workfunction logic CMOS transistors with a dense 8F/sup 2/ vertical DRAM cell
In this paper, we report on integration of high performance dual workfunction logic CMOS transistors with a commodity 8F/sup 2/ vertical DRAM cell for high performance stand-alone DRAM and low-cost low-power embedded DRAM applications. Key process integration features that exploit novel aspects of the vertical DRAM cell to enable a high performance embedded DRAM technology are presented. The impact of pre-metal-dielectric reflow thermal budget on dual workfunction CMOS device characteristics is discussed.
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