一种BISR(内置自我修复)电路，用于具有多个冗余的嵌入式存储器

ICVC '99. 6th International Conference on VLSI and CAD (Cat. No.99EX361) Pub Date : 1999-10-26 DOI:10.1109/ICVC.1999.821012

Heon C. Kim, Dong-Soon Yi, Jin-Young Park, Chang-hyun Cho

{"title":"一种BISR(内置自我修复)电路，用于具有多个冗余的嵌入式存储器","authors":"Heon C. Kim, Dong-Soon Yi, Jin-Young Park, Chang-hyun Cho","doi":"10.1109/ICVC.1999.821012","DOIUrl":null,"url":null,"abstract":"This paper presents an efficient repair algorithm for embedded memory with multiple redundancies and a BISR (built-in self-repair) circuit using the proposed algorithm. While there are many repair algorithms which have good repair capability, their complexity is too high to implement. We present a repair algorithm which has good repair capability with little hardware overhead.","PeriodicalId":13415,"journal":{"name":"ICVC '99. 6th International Conference on VLSI and CAD (Cat. No.99EX361)","volume":"24 1","pages":"602-605"},"PeriodicalIF":0.0000,"publicationDate":"1999-10-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"51","resultStr":"{\"title\":\"A BISR (built-in self-repair) circuit for embedded memory with multiple redundancies\",\"authors\":\"Heon C. Kim, Dong-Soon Yi, Jin-Young Park, Chang-hyun Cho\",\"doi\":\"10.1109/ICVC.1999.821012\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents an efficient repair algorithm for embedded memory with multiple redundancies and a BISR (built-in self-repair) circuit using the proposed algorithm. While there are many repair algorithms which have good repair capability, their complexity is too high to implement. We present a repair algorithm which has good repair capability with little hardware overhead.\",\"PeriodicalId\":13415,\"journal\":{\"name\":\"ICVC '99. 6th International Conference on VLSI and CAD (Cat. No.99EX361)\",\"volume\":\"24 1\",\"pages\":\"602-605\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1999-10-26\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"51\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"ICVC '99. 6th International Conference on VLSI and CAD (Cat. No.99EX361)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICVC.1999.821012\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"ICVC '99. 6th International Conference on VLSI and CAD (Cat. No.99EX361)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICVC.1999.821012","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 51

摘要

本文提出了一种多冗余嵌入式存储器的有效修复算法，并利用该算法设计了一个内置自修复电路。虽然有许多修复算法具有良好的修复能力，但它们的复杂度太高，难以实现。提出了一种修复算法，该算法具有良好的修复能力，硬件开销小。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

查看原文

微信好友朋友圈 QQ好友复制链接

本刊更多论文

A BISR (built-in self-repair) circuit for embedded memory with multiple redundancies

This paper presents an efficient repair algorithm for embedded memory with multiple redundancies and a BISR (built-in self-repair) circuit using the proposed algorithm. While there are many repair algorithms which have good repair capability, their complexity is too high to implement. We present a repair algorithm which has good repair capability with little hardware overhead.

求助全文

通过发布文献求助，成功后即可免费获取论文全文。去求助

来源期刊

ICVC '99. 6th International Conference on VLSI and CAD (Cat. No.99EX361)

自引率

0.00%

发文量