Modeling of faulty behavior of ECL storage elements

Abstract

Bipolar emitter coupled logic (ECL) devices can now be fabricated at very high densities and much lower power consumption. Behavior of two different ECL storage element implementations are examined in the presence of physical faults. While fault models for some implementations of CMOS storage elements have been examined, not much attention has been paid to ECL storage elements. The conventional stuck-at fault model termed minimal fault model assumes that an input (output) of a storage element can be stuck-at-1 or 0. The minimal fault model may not model the behavior under certain physical failures in a storage element. The enhanced fault model providing higher coverage of physical failures is presented.<>