{"title":"Effective tests for memories based on faults models for low PPM defects","authors":"D. Lam, S. Y. Khim","doi":"10.1109/MT.1993.263142","DOIUrl":null,"url":null,"abstract":"The authors describe how an understanding of failure modes and models allows better test algorithms and patterns to be generated to screen out those type of failures without lowering the general yield. Much of this understanding comes about only after extensive electrical analysis. A few case studies experienced by the authors are presented.<<ETX>>","PeriodicalId":248811,"journal":{"name":"Records of the 1993 IEEE International Workshop on Memory Testing","volume":"46 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1993-08-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Records of the 1993 IEEE International Workshop on Memory Testing","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MT.1993.263142","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
The authors describe how an understanding of failure modes and models allows better test algorithms and patterns to be generated to screen out those type of failures without lowering the general yield. Much of this understanding comes about only after extensive electrical analysis. A few case studies experienced by the authors are presented.<>
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