{"title":"Functional testing of RAMs by random testing simulation","authors":"M. Ashtijou, Fusheng Chen","doi":"10.1109/MT.1993.263151","DOIUrl":null,"url":null,"abstract":"An algorithm for random testing of functional faults in RAMs based on the modification of a random testing experiment algorithm is developed. To examine the effectiveness of the algorithm for the testing of stuck-at faults, inversion 2-coupling faults, and type 1 active neighborhood pattern sensitive faults on a reduced memory model, the authors present a simulation package.<<ETX>>","PeriodicalId":248811,"journal":{"name":"Records of the 1993 IEEE International Workshop on Memory Testing","volume":"123 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1993-08-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Records of the 1993 IEEE International Workshop on Memory Testing","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MT.1993.263151","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
An algorithm for random testing of functional faults in RAMs based on the modification of a random testing experiment algorithm is developed. To examine the effectiveness of the algorithm for the testing of stuck-at faults, inversion 2-coupling faults, and type 1 active neighborhood pattern sensitive faults on a reduced memory model, the authors present a simulation package.<>
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