{"title":"An inexpensive method of detecting localised parametric defects in static RAM","authors":"Y. Savaria, C. Thibeault","doi":"10.1109/MT.1993.263143","DOIUrl":null,"url":null,"abstract":"The author presents an effective method of testing spot defects causing delay faults in SRAM circuits, without having to perform a full speed test of every single cell in a chip. The method is based on the detection of spot defects through the imbalance they cause to memory cells by transforming the imbalance effect into a permanent error. Such tests may be performed at a low speed, while retaining an excellent ability to detect non-catastrophic spot defects.<<ETX>>","PeriodicalId":248811,"journal":{"name":"Records of the 1993 IEEE International Workshop on Memory Testing","volume":"927 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1993-08-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Records of the 1993 IEEE International Workshop on Memory Testing","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MT.1993.263143","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3
Abstract
The author presents an effective method of testing spot defects causing delay faults in SRAM circuits, without having to perform a full speed test of every single cell in a chip. The method is based on the detection of spot defects through the imbalance they cause to memory cells by transforming the imbalance effect into a permanent error. Such tests may be performed at a low speed, while retaining an excellent ability to detect non-catastrophic spot defects.<>
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