{"title":"Radiation and life test procedures for military and aerospace memory components","authors":"R. Chrusciel","doi":"10.1109/MT.1993.263139","DOIUrl":null,"url":null,"abstract":"The author presents part qualification, characterization and testing procedures for memory (static/dynamic RAM) components, intended for military and aerospace use. The procedures provide quick and low cost evaluation of commercial technology transferred to mil/aerospace systems.<<ETX>>","PeriodicalId":248811,"journal":{"name":"Records of the 1993 IEEE International Workshop on Memory Testing","volume":"36 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1993-08-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Records of the 1993 IEEE International Workshop on Memory Testing","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MT.1993.263139","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
The author presents part qualification, characterization and testing procedures for memory (static/dynamic RAM) components, intended for military and aerospace use. The procedures provide quick and low cost evaluation of commercial technology transferred to mil/aerospace systems.<>
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