{"title":"Algorithms to test PSF and coupling faults in random access memories","authors":"R. Rajsuman","doi":"10.1109/MT.1993.263150","DOIUrl":null,"url":null,"abstract":"With the growing complexity of semiconductor memories a good understanding of memory fault models becomes very important. In this paper, the author discusses the coupling and pattern sensitive fault (PSF) models in detail. Test algorithms to cover these faults are given. Pros and cons of different test algorithms are discussed and validity of fault models is examined.<<ETX>>","PeriodicalId":248811,"journal":{"name":"Records of the 1993 IEEE International Workshop on Memory Testing","volume":"129 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1993-08-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Records of the 1993 IEEE International Workshop on Memory Testing","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MT.1993.263150","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
With the growing complexity of semiconductor memories a good understanding of memory fault models becomes very important. In this paper, the author discusses the coupling and pattern sensitive fault (PSF) models in detail. Test algorithms to cover these faults are given. Pros and cons of different test algorithms are discussed and validity of fault models is examined.<>
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