{"title":"Exact aliasing computation and/or aliasing free design for RAM BIST","authors":"V. Yarmolik, M. Nicolaidis","doi":"10.1109/MT.1993.263155","DOIUrl":null,"url":null,"abstract":"Signature analyzers are very efficient output response compactors in BIST techniques. The only limitation of signature analysis is the fault coverage reduction (aliasing) due to the information loss inherent to any data compaction. In this paper, in order to increase the effectiveness of RAM BIST, the authors take advantage from the regularity of the RAM test algorithms and show that exact aliasing computation and/or aliasing free signature analysis can be achieved in RAM BIST.<<ETX>>","PeriodicalId":248811,"journal":{"name":"Records of the 1993 IEEE International Workshop on Memory Testing","volume":"74 3","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1993-08-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Records of the 1993 IEEE International Workshop on Memory Testing","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MT.1993.263155","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
Signature analyzers are very efficient output response compactors in BIST techniques. The only limitation of signature analysis is the fault coverage reduction (aliasing) due to the information loss inherent to any data compaction. In this paper, in order to increase the effectiveness of RAM BIST, the authors take advantage from the regularity of the RAM test algorithms and show that exact aliasing computation and/or aliasing free signature analysis can be achieved in RAM BIST.<>
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