Jen-Chieh Liu , Jian-Sheng Li , Yan-Xun Chen , Yu-Lung Lo
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引用次数: 0
Abstract
This study designs a vernier ring oscillator (VRO)-based time-to-digital converter (TDC), ensuring a proportional relationship between the timing resolutions of the coarse-tuning stage (CTS) and fine-tuning stage (FTS) under process, voltage, and temperature (PVT) variations. The design allows flexibility in extending the bit number to a wide input range during CTS. The timing resolutions of CTS and FTS were defined by the rise and fall times. Therefore, the timing ratio between CTS and FTS of VRO-based TDC remained constant under the PVT variations. This 14-bit TDC was fabricated using a 0.18 μm standard CMOS process with a core area of 45 μm × 200 μm. The measured timing resolution of the proposed VRO-based TDC was 125 ps, and the input range was from 10 to 200 ns. The DNL and INL values were less than ±0.244 and ± 0.336 LSB, respectively. The proposed VRO-based TDC was also integrated with a light sensor for Internet of Things applications.
期刊介绍:
Published since 1969, the Microelectronics Journal is an international forum for the dissemination of research and applications of microelectronic systems, circuits, and emerging technologies. Papers published in the Microelectronics Journal have undergone peer review to ensure originality, relevance, and timeliness. The journal thus provides a worldwide, regular, and comprehensive update on microelectronic circuits and systems.
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