静电屏蔽tsv抑制堆叠ic间耦合

Y. Araga, K. Kikuchi, M. Aoyagi
{"title":"静电屏蔽tsv抑制堆叠ic间耦合","authors":"Y. Araga, K. Kikuchi, M. Aoyagi","doi":"10.1109/3DIC48104.2019.9058862","DOIUrl":null,"url":null,"abstract":"Multi chip modules (MCMs) employing three-dimensionally stacked ICs (3DS-ICs) are expected to be the integration method to achieve high performance by integrating memories and processors densely. In such a densely assembled modules, crosstalk between closely placed 3DS-ICs like a stacked memories and processors. In this study, we propose a shielding method using through-silicon vias (TSVs) to suppress stack-to-stack crosstalk, we created MCM model for 3-D electromagnetic solver and simulated result showed good noise suppression effect, simulation result also showed higher suppression ratio as larger number of stacked ICs.","PeriodicalId":440556,"journal":{"name":"2019 International 3D Systems Integration Conference (3DIC)","volume":"22 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Electrostatic Shield TSVs to Suppress Coupling Among Stacked ICs\",\"authors\":\"Y. Araga, K. Kikuchi, M. Aoyagi\",\"doi\":\"10.1109/3DIC48104.2019.9058862\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Multi chip modules (MCMs) employing three-dimensionally stacked ICs (3DS-ICs) are expected to be the integration method to achieve high performance by integrating memories and processors densely. In such a densely assembled modules, crosstalk between closely placed 3DS-ICs like a stacked memories and processors. In this study, we propose a shielding method using through-silicon vias (TSVs) to suppress stack-to-stack crosstalk, we created MCM model for 3-D electromagnetic solver and simulated result showed good noise suppression effect, simulation result also showed higher suppression ratio as larger number of stacked ICs.\",\"PeriodicalId\":440556,\"journal\":{\"name\":\"2019 International 3D Systems Integration Conference (3DIC)\",\"volume\":\"22 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2019-10-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2019 International 3D Systems Integration Conference (3DIC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/3DIC48104.2019.9058862\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 International 3D Systems Integration Conference (3DIC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/3DIC48104.2019.9058862","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

摘要

利用三维堆叠集成电路(3ds - ic)的多芯片模块(mcm)有望成为将存储器和处理器密集集成在一起,实现高性能的集成方法。在这样一个密集组装的模块中,紧密放置的3d - ic之间的串扰就像堆叠的存储器和处理器。在本研究中,我们提出了一种利用硅通孔(tsv)来抑制串扰的屏蔽方法,并建立了三维电磁求解器的MCM模型,仿真结果显示出良好的噪声抑制效果,并且随着堆叠ic数量的增加,抑制比也会提高。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
Electrostatic Shield TSVs to Suppress Coupling Among Stacked ICs
Multi chip modules (MCMs) employing three-dimensionally stacked ICs (3DS-ICs) are expected to be the integration method to achieve high performance by integrating memories and processors densely. In such a densely assembled modules, crosstalk between closely placed 3DS-ICs like a stacked memories and processors. In this study, we propose a shielding method using through-silicon vias (TSVs) to suppress stack-to-stack crosstalk, we created MCM model for 3-D electromagnetic solver and simulated result showed good noise suppression effect, simulation result also showed higher suppression ratio as larger number of stacked ICs.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
A Graph-Based Model of Micro-Transfer Printing for Cost-Optimized Heterogeneous 2.5D Systems Growth Optimization of Multi-Layer Graphene for Thermal-TSV Application in 3D-LSI Investigation of the Influence of Material Properties on Warpage and Solder Joint Reliability of 2.5D & FO Package Fraunhofer's Initial and Ongoing Contributions in 3D IC Integration Electrostatic Shield TSVs to Suppress Coupling Among Stacked ICs
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1