变异容差的统计设计:延续摩尔定律的关键

2004 International Conference on Integrated Circuit Design and Technology (IEEE Cat. No.04EX866) Pub Date : 2004-10-04 DOI:10.1109/ICICDT.2004.1309939

T. Karnik, Vivek De, S. Borkar, T. Karnik

{"title":"变异容差的统计设计:延续摩尔定律的关键","authors":"T. Karnik, Vivek De, S. Borkar, T. Karnik","doi":"10.1109/ICICDT.2004.1309939","DOIUrl":null,"url":null,"abstract":"Future high performance microprocessor design with technology scaling beyond 90nm will face a major challenge - parameter variations. Design practice will have to change from deterministic design to statistical design for variation tolerance. This paper discusses process, voltage and temperature variations, and their impact on circuits and microarchitecture. Possible solutions to reduce the impact of parameter variations on digital and analog circuits, and to achieve higher target frequencies are also presented.","PeriodicalId":158994,"journal":{"name":"2004 International Conference on Integrated Circuit Design and Technology (IEEE Cat. No.04EX866)","volume":"62 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2004-10-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"31","resultStr":"{\"title\":\"Statistical design for variation tolerance: key to continued Moore's law\",\"authors\":\"T. Karnik, Vivek De, S. Borkar, T. Karnik\",\"doi\":\"10.1109/ICICDT.2004.1309939\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Future high performance microprocessor design with technology scaling beyond 90nm will face a major challenge - parameter variations. Design practice will have to change from deterministic design to statistical design for variation tolerance. This paper discusses process, voltage and temperature variations, and their impact on circuits and microarchitecture. Possible solutions to reduce the impact of parameter variations on digital and analog circuits, and to achieve higher target frequencies are also presented.\",\"PeriodicalId\":158994,\"journal\":{\"name\":\"2004 International Conference on Integrated Circuit Design and Technology (IEEE Cat. No.04EX866)\",\"volume\":\"62 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2004-10-04\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"31\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2004 International Conference on Integrated Circuit Design and Technology (IEEE Cat. No.04EX866)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICICDT.2004.1309939\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2004 International Conference on Integrated Circuit Design and Technology (IEEE Cat. No.04EX866)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICICDT.2004.1309939","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 31

摘要

未来的高性能微处理器设计与技术规模超过90纳米将面临主要挑战-参数变化。设计实践将不得不从确定性设计转变为变异容忍度的统计设计。本文讨论了工艺、电压和温度变化，以及它们对电路和微结构的影响。还提出了减少参数变化对数字和模拟电路的影响以及实现更高目标频率的可能解决方案。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

查看原文

微信好友朋友圈 QQ好友复制链接

本刊更多论文

Statistical design for variation tolerance: key to continued Moore's law

Future high performance microprocessor design with technology scaling beyond 90nm will face a major challenge - parameter variations. Design practice will have to change from deterministic design to statistical design for variation tolerance. This paper discusses process, voltage and temperature variations, and their impact on circuits and microarchitecture. Possible solutions to reduce the impact of parameter variations on digital and analog circuits, and to achieve higher target frequencies are also presented.

求助全文

通过发布文献求助，成功后即可免费获取论文全文。去求助

来源期刊

2004 International Conference on Integrated Circuit Design and Technology (IEEE Cat. No.04EX866)

自引率

0.00%

发文量