{"title":"军用和航空航天存储部件的辐射和寿命试验程序","authors":"R. Chrusciel","doi":"10.1109/MT.1993.263139","DOIUrl":null,"url":null,"abstract":"The author presents part qualification, characterization and testing procedures for memory (static/dynamic RAM) components, intended for military and aerospace use. The procedures provide quick and low cost evaluation of commercial technology transferred to mil/aerospace systems.<<ETX>>","PeriodicalId":248811,"journal":{"name":"Records of the 1993 IEEE International Workshop on Memory Testing","volume":"36 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1993-08-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Radiation and life test procedures for military and aerospace memory components\",\"authors\":\"R. Chrusciel\",\"doi\":\"10.1109/MT.1993.263139\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The author presents part qualification, characterization and testing procedures for memory (static/dynamic RAM) components, intended for military and aerospace use. The procedures provide quick and low cost evaluation of commercial technology transferred to mil/aerospace systems.<<ETX>>\",\"PeriodicalId\":248811,\"journal\":{\"name\":\"Records of the 1993 IEEE International Workshop on Memory Testing\",\"volume\":\"36 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1993-08-09\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Records of the 1993 IEEE International Workshop on Memory Testing\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/MT.1993.263139\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Records of the 1993 IEEE International Workshop on Memory Testing","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MT.1993.263139","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Radiation and life test procedures for military and aerospace memory components
The author presents part qualification, characterization and testing procedures for memory (static/dynamic RAM) components, intended for military and aerospace use. The procedures provide quick and low cost evaluation of commercial technology transferred to mil/aerospace systems.<>
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