{"title":"Latest developments in liquid metal jet technology x-ray sources","authors":"A. Adibhatla","doi":"10.1117/12.2593981","DOIUrl":"https://doi.org/10.1117/12.2593981","url":null,"abstract":"","PeriodicalId":114930,"journal":{"name":"Advances in X-Ray/EUV Optics and Components XVI","volume":"4 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-08-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116813448","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Due to its outstanding thermal properties and low x-ray loss diamond had been considered a material for x-ray refractive optics for a long time. Several diamond lens prototypes had been produced by various groups and tested at different light sources. However a commercial grade diamond lens is not yet on the market. Because of the large number of complex fabrication steps involved (packaging, laser ablation, polishing and metrology) combined with stringent accuracy requirements (1 micron standard deviation from the designed paraboloid shape) diamond lenses are not consistent from one to another. In this paper we will review the recent progress in lens development and share results demonstrating that a beamline-ready diamond refractive lens is now available.
{"title":"Beamline-ready diamond x-ray lens","authors":"S. Antipov, E. Gomez, T. Roth, R. Celestre","doi":"10.1117/12.2595470","DOIUrl":"https://doi.org/10.1117/12.2595470","url":null,"abstract":"Due to its outstanding thermal properties and low x-ray loss diamond had been considered a material for x-ray refractive optics for a long time. Several diamond lens prototypes had been produced by various groups and tested at different light sources. However a commercial grade diamond lens is not yet on the market. Because of the large number of complex fabrication steps involved (packaging, laser ablation, polishing and metrology) combined with stringent accuracy requirements (1 micron standard deviation from the designed paraboloid shape) diamond lenses are not consistent from one to another. \u0000In this paper we will review the recent progress in lens development and share results demonstrating that a beamline-ready diamond refractive lens is now available.","PeriodicalId":114930,"journal":{"name":"Advances in X-Ray/EUV Optics and Components XVI","volume":"58 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126555469","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Takato Inoue, Yuka Nishioka, S. Matsuyama, J. Sonoyama, K. Akiyama, H. Nakamori, Y. Sano, Y. Kohmura, M. Yabashi, T. Ishikawa, L. Assoufid, K. Yamauchi
We have developed an X-ray zoom condenser optical system using deformable mirrors that can adjust the beam size by deformation of their shape. The shapes of deformable mirrors are changed by a combination of mechanical and piezoelectric bending. Large deformations up to third order polynomials are achieved by mechanical bending. More precise shapes are achieved by piezoelectric bimorph mirror. However, because both ends of the mirror are mechanically clamped, capability of deformation by piezoelectric bending is lower than that of free-standing piezoelectric bimorph mirrors. So, we propose a bending method that tunes the mechanical bending conditions to intentionally leave the optimized shape error to be easily compensated by the piezoelectric bending process.
{"title":"Optimization of mirror deformation strategy using mechanical and piezoelectric bending system","authors":"Takato Inoue, Yuka Nishioka, S. Matsuyama, J. Sonoyama, K. Akiyama, H. Nakamori, Y. Sano, Y. Kohmura, M. Yabashi, T. Ishikawa, L. Assoufid, K. Yamauchi","doi":"10.1117/12.2594944","DOIUrl":"https://doi.org/10.1117/12.2594944","url":null,"abstract":"We have developed an X-ray zoom condenser optical system using deformable mirrors that can adjust the beam size by deformation of their shape. The shapes of deformable mirrors are changed by a combination of mechanical and piezoelectric bending. Large deformations up to third order polynomials are achieved by mechanical bending. More precise shapes are achieved by piezoelectric bimorph mirror. However, because both ends of the mirror are mechanically clamped, capability of deformation by piezoelectric bending is lower than that of free-standing piezoelectric bimorph mirrors. So, we propose a bending method that tunes the mechanical bending conditions to intentionally leave the optimized shape error to be easily compensated by the piezoelectric bending process.","PeriodicalId":114930,"journal":{"name":"Advances in X-Ray/EUV Optics and Components XVI","volume":"2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124130937","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Yoshio Ichii, Hiromi Okada, S. Aono, Masahiko Kanaoka, Takato Inoue, S. Matsuyama, K. Yamauchi
PZT (lead zirconate titanate)-glued bimorph deformable mirrors are widely used in hard x-ray regimes[1], however, they have not yet been used in soft X-ray regimes because they are less compatible for usage under high vacuum. Therefore, we have developed a glue-free bimorph deformable mirror, in which silver nanoparticles were employed to bond PZT actuators to mirror substrates[2]. In this study, we achieved a 2 nm figure error on an elliptical shape of a glue-free deformable mirror. We evaluated the figure change characteristics due to humidity and temperature increasing at the ultrafine figure error condition.
{"title":"Ultrafine figuring for glue-free deformable mirror","authors":"Yoshio Ichii, Hiromi Okada, S. Aono, Masahiko Kanaoka, Takato Inoue, S. Matsuyama, K. Yamauchi","doi":"10.1117/12.2594418","DOIUrl":"https://doi.org/10.1117/12.2594418","url":null,"abstract":"PZT (lead zirconate titanate)-glued bimorph deformable mirrors are widely used in hard x-ray regimes[1], however, they have not yet been used in soft X-ray regimes because they are less compatible for usage under high vacuum. Therefore, we have developed a glue-free bimorph deformable mirror, in which silver nanoparticles were employed to bond PZT actuators to mirror substrates[2]. In this study, we achieved a 2 nm figure error on an elliptical shape of a glue-free deformable mirror. We evaluated the figure change characteristics due to humidity and temperature increasing at the ultrafine figure error condition.","PeriodicalId":114930,"journal":{"name":"Advances in X-Ray/EUV Optics and Components XVI","volume":"12 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133572084","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
C. Ferrari, R. Lolli, B. Salmaso, G. Pareschi, G. Tagliaferri, S. Basso, D. Spiga, E. Giro
A new type of x-ray facility, the Beam Expander Testing x-ray facility (BEaTriX), has been designed and is now under construction at INAF– Osservatorio Astronomico di Brera (Merate, Italy) to perform the acceptance tests of the silicon pore optics modules of the ATHENA X-ray telescope. Crystals of high perfection and large dimensions are needed in order to obtain a wide beam (20 × 6 cm2) with an X-ray divergence <0.5 arcseconds and a x-ray energy purity DeltaE/E<10-5. To generate x-ray diffracted beams at an X-ray energy of 1.49 keV, ammonium dihydrogen phosphate (ADP) crystals have been considered among other possible choices, because of their reported crystal quality and because they can be grown at sufficiently large size. In the present paper, the results of the characterization of crystalline quality and lattice planarity of a 20 × 20 × 2 mm3 ADP sample are reported.
{"title":"Characterization of ADP crystals for soft x-ray optics of the Beam Expander Testing X-ray facility (BEaTriX)","authors":"C. Ferrari, R. Lolli, B. Salmaso, G. Pareschi, G. Tagliaferri, S. Basso, D. Spiga, E. Giro","doi":"10.1117/12.2595143","DOIUrl":"https://doi.org/10.1117/12.2595143","url":null,"abstract":"A new type of x-ray facility, the Beam Expander Testing x-ray facility (BEaTriX), has been designed and is now under construction at INAF– Osservatorio Astronomico di Brera (Merate, Italy) to perform the acceptance tests of the silicon pore optics modules of the ATHENA X-ray telescope. Crystals of high perfection and large dimensions are needed in order to obtain a wide beam (20 × 6 cm2) with an X-ray divergence <0.5 arcseconds and a x-ray energy purity DeltaE/E<10-5. To generate x-ray diffracted beams at an X-ray energy of 1.49 keV, ammonium dihydrogen phosphate (ADP) crystals have been considered among other possible choices, because of their reported crystal quality and because they can be grown at sufficiently large size. In the present paper, the results of the characterization of crystalline quality and lattice planarity of a 20 × 20 × 2 mm3 ADP sample are reported.","PeriodicalId":114930,"journal":{"name":"Advances in X-Ray/EUV Optics and Components XVI","volume":"17 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126030513","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Akinari Ito, G. Yamaguchi, Takafumi Watanabe, Y. Takeo, K. Tamura, Yusuke Takehara, Ayumu Takigawa, T. Kanoh, Ryusei Yamaguchi, Naoki Ishida, T. Kume, Y. Matsuzawa, T. Saito, K. Hiraguri, I. Mitsuishi, H. Hashizume, H. Mimura
Wolter mirrors work as imaging optics of X-ray telescopes. We have been developing a Wolter mirror for the FOXSI-4 project in 2023 using a high-precision Ni electroforming process. The figure accuracy of mirrors is one of the main factors determining the spatial resolution in X-ray imaging. In this study, we optimized the electrodeposition conditions from the viewpoint of the uniformity of film thickness. The simulation model was developed to correctly predict the film thickness distribution before fabrication, whose parameters and boundary conditions were determined through electrochemical experiments. The model calculates the distribution of current density on the surface of the cathode by finite element analysis. In this paper, we report the current status of the electroforming process specializing in Wolter mirrors in X-ray telescopes.
{"title":"Improvement of figure accuracy of electroformed mirrors for x-ray telescopes","authors":"Akinari Ito, G. Yamaguchi, Takafumi Watanabe, Y. Takeo, K. Tamura, Yusuke Takehara, Ayumu Takigawa, T. Kanoh, Ryusei Yamaguchi, Naoki Ishida, T. Kume, Y. Matsuzawa, T. Saito, K. Hiraguri, I. Mitsuishi, H. Hashizume, H. Mimura","doi":"10.1117/12.2595124","DOIUrl":"https://doi.org/10.1117/12.2595124","url":null,"abstract":"Wolter mirrors work as imaging optics of X-ray telescopes. We have been developing a Wolter mirror for the FOXSI-4 project in 2023 using a high-precision Ni electroforming process. The figure accuracy of mirrors is one of the main factors determining the spatial resolution in X-ray imaging. In this study, we optimized the electrodeposition conditions from the viewpoint of the uniformity of film thickness. The simulation model was developed to correctly predict the film thickness distribution before fabrication, whose parameters and boundary conditions were determined through electrochemical experiments. The model calculates the distribution of current density on the surface of the cathode by finite element analysis. In this paper, we report the current status of the electroforming process specializing in Wolter mirrors in X-ray telescopes.","PeriodicalId":114930,"journal":{"name":"Advances in X-Ray/EUV Optics and Components XVI","volume":"97 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115026818","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Diamond has low x-ray absorption relative to refractive strength and outstanding thermal properties, making it well-suited for refractive optics for high-power (white beam) and monochromatic synchrotron x-rays. In addition, single-crystal diamond offers the advantage of preserving beam coherence, exploiting that property of high-brilliance and ultra-low emittance new sources such as the multi-bend-achromat upgrade of the Advanced Photon Source (APS). The small curvature-radius, bi-concave, diamond compound refractive lenses (CRLs) presented here were fabricated by femtosecond-laser ablation followed by optional polishing. Focusing tests were conducted with high-energy x-rays (~50 keV) in a long focal length configuration at the APS 1-ID beamline. A convex CRL for beam expansion is also presented.
{"title":"Diamond compound refractive lens tests with high-energy x-rays","authors":"S. Antipov, S. Shastri","doi":"10.1117/12.2595471","DOIUrl":"https://doi.org/10.1117/12.2595471","url":null,"abstract":"Diamond has low x-ray absorption relative to refractive strength and outstanding thermal properties, making it well-suited for refractive optics for high-power (white beam) and monochromatic synchrotron x-rays. In addition, single-crystal diamond offers the advantage of preserving beam coherence, exploiting that property of high-brilliance and ultra-low emittance new sources such as the multi-bend-achromat upgrade of the Advanced Photon Source (APS). The small curvature-radius, bi-concave, diamond compound refractive lenses (CRLs) presented here were fabricated by femtosecond-laser ablation followed by optional polishing. Focusing tests were conducted with high-energy x-rays (~50 keV) in a long focal length configuration at the APS 1-ID beamline. A convex CRL for beam expansion is also presented.","PeriodicalId":114930,"journal":{"name":"Advances in X-Ray/EUV Optics and Components XVI","volume":"22 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133411359","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Inverse Compton scattering x-ray source for research, industry, and medical applications","authors":"B. Hornberger, J. Kasahara","doi":"10.1117/12.2593613","DOIUrl":"https://doi.org/10.1117/12.2593613","url":null,"abstract":"","PeriodicalId":114930,"journal":{"name":"Advances in X-Ray/EUV Optics and Components XVI","volume":"46 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131913093","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
M. Schlie, J. Graf, F. Hertlein, P. Radcliffe, J. Wiesmann, C. Michaelsen
In this talk, we will summarize the key parameters for combining multilayer optics and microfocus tubes to achieve collimated or focused X-ray sources with high brilliance. The main part of the talk will explain the application-dependent design and capabilities of our newly developed custom metal-ceramic tubes and how to match them with our advanced multilayer optics. Stand-alone custom tubes and optics made possible by the advanced knowledge of the two centerpieces of the source will also be covered. Applications include crystallography, detector calibration, or as a tool at synchrotrons during downtime or con-struction periods.
{"title":"Coordinated development of tubes and optics: new possibilities for x-ray sources","authors":"M. Schlie, J. Graf, F. Hertlein, P. Radcliffe, J. Wiesmann, C. Michaelsen","doi":"10.1117/12.2600153","DOIUrl":"https://doi.org/10.1117/12.2600153","url":null,"abstract":"In this talk, we will summarize the key parameters for combining multilayer optics and microfocus tubes to achieve collimated or focused X-ray sources with high brilliance. The main part of the talk will explain the application-dependent design and capabilities of our newly developed custom metal-ceramic tubes and how to match them with our advanced multilayer optics. Stand-alone custom tubes and optics made possible by the advanced knowledge of the two centerpieces of the source will also be covered. Applications include crystallography, detector calibration, or as a tool at synchrotrons during downtime or con-struction periods.","PeriodicalId":114930,"journal":{"name":"Advances in X-Ray/EUV Optics and Components XVI","volume":"22 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123753875","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
京公网安备 11010802042870号
京ICP备2023020795号-1
扫码关注我们
求助内容：
应助结果提醒方式：