{"title":"Introduction to FIB and applications: Plasma FIB and laser.","authors":"JosephTan Michael","doi":"10.2172/1870975","DOIUrl":"https://doi.org/10.2172/1870975","url":null,"abstract":"","PeriodicalId":116030,"journal":{"name":"Proposed for presentation at the CCEM Lecture Series on Electron and Ion Microscopy held June 7-11, 2021 in Hamilton , Ontario, Canado.","volume":"53 2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123460826","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
京公网安备 11010802042870号
京ICP备2023020795号-1
扫码关注我们
求助内容：
应助结果提醒方式：