Pub Date : 2019-08-30DOI: 10.1002/9781119417651.app2
{"title":"Appendix 2: Table of Binding Energies Accessible with Al Kα Radiation","authors":"","doi":"10.1002/9781119417651.app2","DOIUrl":"https://doi.org/10.1002/9781119417651.app2","url":null,"abstract":"","PeriodicalId":137671,"journal":{"name":"An Introduction to Surface Analysis by XPS and AES","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-08-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130079325","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2019-08-30DOI: 10.1002/9781119417651.app3
{"title":"Appendix 3: Documentary Standards in Surface Analysis","authors":"","doi":"10.1002/9781119417651.app3","DOIUrl":"https://doi.org/10.1002/9781119417651.app3","url":null,"abstract":"","PeriodicalId":137671,"journal":{"name":"An Introduction to Surface Analysis by XPS and AES","volume":"10 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-08-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121622147","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2019-08-30DOI: 10.1002/9781119417651.ch3
{"title":"The Electron Spectrum","authors":"","doi":"10.1002/9781119417651.ch3","DOIUrl":"https://doi.org/10.1002/9781119417651.ch3","url":null,"abstract":"","PeriodicalId":137671,"journal":{"name":"An Introduction to Surface Analysis by XPS and AES","volume":"36 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-08-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127762447","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2019-08-30DOI: 10.1002/9781119417651.ch5
{"title":"Multi‐technique Analysis","authors":"","doi":"10.1002/9781119417651.ch5","DOIUrl":"https://doi.org/10.1002/9781119417651.ch5","url":null,"abstract":"","PeriodicalId":137671,"journal":{"name":"An Introduction to Surface Analysis by XPS and AES","volume":"2016 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-08-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128068157","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2019-08-30DOI: 10.1002/9781119417651.index
{"title":"Index","authors":"","doi":"10.1002/9781119417651.index","DOIUrl":"https://doi.org/10.1002/9781119417651.index","url":null,"abstract":"","PeriodicalId":137671,"journal":{"name":"An Introduction to Surface Analysis by XPS and AES","volume":"7 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-08-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134352118","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2019-08-30DOI: 10.1002/9781119417651.ch6
{"title":"The Sample","authors":"","doi":"10.1002/9781119417651.ch6","DOIUrl":"https://doi.org/10.1002/9781119417651.ch6","url":null,"abstract":"","PeriodicalId":137671,"journal":{"name":"An Introduction to Surface Analysis by XPS and AES","volume":"34 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-08-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130601540","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2019-08-30DOI: 10.1002/9781119417651.app1
{"title":"Appendix 1: Auger Electron Energies","authors":"","doi":"10.1002/9781119417651.app1","DOIUrl":"https://doi.org/10.1002/9781119417651.app1","url":null,"abstract":"","PeriodicalId":137671,"journal":{"name":"An Introduction to Surface Analysis by XPS and AES","volume":"32 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-08-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126330722","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Electron Spectrometer Design","authors":"J. Watts, J. Wolstenholme","doi":"10.1002/0470867930.CH2","DOIUrl":"https://doi.org/10.1002/0470867930.CH2","url":null,"abstract":"","PeriodicalId":137671,"journal":{"name":"An Introduction to Surface Analysis by XPS and AES","volume":"13 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2005-01-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114969396","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Comparison of XPS and AES with Other Analytical Techniques","authors":"J. Watts, J. Wolstenholme","doi":"10.1002/0470867930.CH6","DOIUrl":"https://doi.org/10.1002/0470867930.CH6","url":null,"abstract":"","PeriodicalId":137671,"journal":{"name":"An Introduction to Surface Analysis by XPS and AES","volume":"9 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2005-01-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127578522","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2003-01-07DOI: 10.1039/9781847550989-00136
T. Nelis, R. Payling, Neil W. Barneet
{"title":"Compositional Depth Profiling","authors":"T. Nelis, R. Payling, Neil W. Barneet","doi":"10.1039/9781847550989-00136","DOIUrl":"https://doi.org/10.1039/9781847550989-00136","url":null,"abstract":"","PeriodicalId":137671,"journal":{"name":"An Introduction to Surface Analysis by XPS and AES","volume":"30 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-01-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129685753","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
京公网安备 11010802042870号
京ICP备2023020795号-1
扫码关注我们
求助内容：
应助结果提醒方式：