{"title":"Focused Ion Beam Failure Analysis and Circuit Edit Applications.","authors":"R. Shul, M. Rye, Subhei Shaar, W. Zortman","doi":"10.2172/1834988","DOIUrl":"https://doi.org/10.2172/1834988","url":null,"abstract":"","PeriodicalId":146224,"journal":{"name":"Proposed for presentation at the Raytheon Tech Conference held October 28, 2020 in Tucson, Az, US.","volume":"307 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122306445","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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