{"title":"VLSI Design for Testability","authors":"Edward J. McCluskey","doi":"10.2514/6.1984-2713","DOIUrl":"https://doi.org/10.2514/6.1984-2713","url":null,"abstract":"","PeriodicalId":164639,"journal":{"name":"1984 Symposium on VLSI Technology. Digest of Technical Papers","volume":"16 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1984-12-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121255373","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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