{"title":"Session details: Opening and methodologies","authors":"N. Taft","doi":"10.1145/3244808","DOIUrl":"https://doi.org/10.1145/3244808","url":null,"abstract":"","PeriodicalId":339638,"journal":{"name":"Proceedings of the first ACM SIGCOMM workshop on Measurements up the stack","volume":"28 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-08-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121890896","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Session details: Getting input from users","authors":"Jaeyeon Jung","doi":"10.1145/3244809","DOIUrl":"https://doi.org/10.1145/3244809","url":null,"abstract":"","PeriodicalId":339638,"journal":{"name":"Proceedings of the first ACM SIGCOMM workshop on Measurements up the stack","volume":"182 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-08-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121024515","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Session details: Measuring at the edge","authors":"R. Teixeira","doi":"10.1145/3244811","DOIUrl":"https://doi.org/10.1145/3244811","url":null,"abstract":"","PeriodicalId":339638,"journal":{"name":"Proceedings of the first ACM SIGCOMM workshop on Measurements up the stack","volume":"6 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-08-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124421833","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Session details: Correlating lower-layer measurement with user perception","authors":"D. Choffnes","doi":"10.1145/3244810","DOIUrl":"https://doi.org/10.1145/3244810","url":null,"abstract":"","PeriodicalId":339638,"journal":{"name":"Proceedings of the first ACM SIGCOMM workshop on Measurements up the stack","volume":"56 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-08-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125251330","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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