Pub Date : 1983-11-01DOI: 10.1109/ARFTG.1983.323566
W. E. Pastori
The AILTECH 2075 NoIse Galn Analyzer represents the letest effort of the Electronic instrumentatlon Dlvlslon (EID) of EATON Corporatlon in the field of recelver/amplifler iiolse parameter measurements. AS most of you know, E!D Is the successor organlzatlon to that segment of the original Alrborne Instruments Laboratory (AIL) that has ploneered dlrect reading nofse flgure instrumentatlon slnce the late 1940's.
{"title":"The Ailtech 2075 Noise Gain Analyzer","authors":"W. E. Pastori","doi":"10.1109/ARFTG.1983.323566","DOIUrl":"https://doi.org/10.1109/ARFTG.1983.323566","url":null,"abstract":"The AILTECH 2075 NoIse Galn Analyzer represents the letest effort of the Electronic instrumentatlon Dlvlslon (EID) of EATON Corporatlon in the field of recelver/amplifler iiolse parameter measurements. AS most of you know, E!D Is the successor organlzatlon to that segment of the original Alrborne Instruments Laboratory (AIL) that has ploneered dlrect reading nofse flgure instrumentatlon slnce the late 1940's.","PeriodicalId":347704,"journal":{"name":"22nd ARFTG Conference Digest","volume":"87 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1983-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"120970705","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1983-11-01DOI: 10.1109/ARFTG.1983.323562
Mike Cruz
The results of a Round Robin experiment measuring S21, S11, and S22 parameters on 10 db and 40 db attenuators using their DoD six-port systems was presented. The measurements were performed on the NBS experimental diode six-port system, the Sandia National Laboratories Six-port, and the DoD Primary Standards Laboratories Army (Redstowe Arsenal), Navy (Western Standards Laboratories, San Diego, CA.) and the Air Force (Newark AFB) six-port systems that were built by NBS. The agreement between the laboratories and the demonstrated stability of the six-port systems was encouraging for the Metrology Community.
{"title":"Measurement Results of a Six-Port Round Robin","authors":"Mike Cruz","doi":"10.1109/ARFTG.1983.323562","DOIUrl":"https://doi.org/10.1109/ARFTG.1983.323562","url":null,"abstract":"The results of a Round Robin experiment measuring S21, S11, and S22 parameters on 10 db and 40 db attenuators using their DoD six-port systems was presented. The measurements were performed on the NBS experimental diode six-port system, the Sandia National Laboratories Six-port, and the DoD Primary Standards Laboratories Army (Redstowe Arsenal), Navy (Western Standards Laboratories, San Diego, CA.) and the Air Force (Newark AFB) six-port systems that were built by NBS. The agreement between the laboratories and the demonstrated stability of the six-port systems was encouraging for the Metrology Community.","PeriodicalId":347704,"journal":{"name":"22nd ARFTG Conference Digest","volume":"428 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1983-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116278968","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1983-11-01DOI: 10.1109/ARFTG.1983.323559
M. de la Chapelle, J. Gulick, R. Eisenhart
This paper describes the advantages of microwave measurement automation in the research laboratory, the implementation costs, and the specific requirements of the automated test system. A discussion of the need to develop versatile software that can be applied to a variety of different experiments is also included. We present a detailed account of the general program developed to automate a microwave amplifier or oscillator experiment featuring real time displaying of all parameters on the CRT, and the ability to plot any recorded parameter as a function of another. The results of an automated experiment to measure the circuit Q of an injection locked oscillator are shown as examples.
{"title":"Automated Microwave Measurements in the Research Laboratory Environment","authors":"M. de la Chapelle, J. Gulick, R. Eisenhart","doi":"10.1109/ARFTG.1983.323559","DOIUrl":"https://doi.org/10.1109/ARFTG.1983.323559","url":null,"abstract":"This paper describes the advantages of microwave measurement automation in the research laboratory, the implementation costs, and the specific requirements of the automated test system. A discussion of the need to develop versatile software that can be applied to a variety of different experiments is also included. We present a detailed account of the general program developed to automate a microwave amplifier or oscillator experiment featuring real time displaying of all parameters on the CRT, and the ability to plot any recorded parameter as a function of another. The results of an automated experiment to measure the circuit Q of an injection locked oscillator are shown as examples.","PeriodicalId":347704,"journal":{"name":"22nd ARFTG Conference Digest","volume":"42 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1983-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134288269","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1983-11-01DOI: 10.1109/ARFTG.1983.323568
H. Stinehelfer
The performance of a circulator is analyzed by using the transmission delay distortion (TDD) method and separating the results. The complex transmission parameters, when converted to the Time-domain, give indication as to the circuit delay which the signal has experienced.
{"title":"\"Transmission Analysis of a Circulator\"","authors":"H. Stinehelfer","doi":"10.1109/ARFTG.1983.323568","DOIUrl":"https://doi.org/10.1109/ARFTG.1983.323568","url":null,"abstract":"The performance of a circulator is analyzed by using the transmission delay distortion (TDD) method and separating the results. The complex transmission parameters, when converted to the Time-domain, give indication as to the circuit delay which the signal has experienced.","PeriodicalId":347704,"journal":{"name":"22nd ARFTG Conference Digest","volume":"4 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1983-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130486029","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1983-11-01DOI: 10.1109/ARFTG.1983.323561
E. Jones
The requirements, for which a general purpose automatic pulse measuring system (APMS) must meet to be a useful tool, are given. This paper will attempt to convince the test equipment manufacturing community that there is a real market for an APMS and the development of a standard "off-the-shelf" APMS should begin now to meet future testing quotas.
{"title":"The Requirements for a General Purpose Automatic Pulse Measuring System","authors":"E. Jones","doi":"10.1109/ARFTG.1983.323561","DOIUrl":"https://doi.org/10.1109/ARFTG.1983.323561","url":null,"abstract":"The requirements, for which a general purpose automatic pulse measuring system (APMS) must meet to be a useful tool, are given. This paper will attempt to convince the test equipment manufacturing community that there is a real market for an APMS and the development of a standard \"off-the-shelf\" APMS should begin now to meet future testing quotas.","PeriodicalId":347704,"journal":{"name":"22nd ARFTG Conference Digest","volume":"46 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1983-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130442967","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1983-11-01DOI: 10.1109/ARFTG.1983.323565
F. Levins
A recently developed software package for a computer controlled scalar network measurement system allows a microwave engineer or technician to create custom programs for use by semi-skilled operators using an automated test bench.
{"title":"\"A High Level Microwave Measurement Language\"","authors":"F. Levins","doi":"10.1109/ARFTG.1983.323565","DOIUrl":"https://doi.org/10.1109/ARFTG.1983.323565","url":null,"abstract":"A recently developed software package for a computer controlled scalar network measurement system allows a microwave engineer or technician to create custom programs for use by semi-skilled operators using an automated test bench.","PeriodicalId":347704,"journal":{"name":"22nd ARFTG Conference Digest","volume":"22 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1983-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127738468","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1983-11-01DOI: 10.1109/ARFTG.1983.323560
P. Simpson
The National Bureau of Standards a t Boulder Colorado has developed a system for calibrating detectors used to measure TEA laser pulses El]. This system operates under the control of a desktop computer, which permits the rapid precise acquisition of data from several measuring devices during a testir:g period lasting approximately 5 minutes. Without the computer-controlled feature, the measurements would be quite laborious and time consuming and subject to the possible errors associated with transcribing and processing of data by hand. With the corputer the results are precisely calculated to 14 significant digits and are availablewithin 60 seconds after the veasuring process i s completed. This paper will deal ;nainly with the computer-controlled aspects of the system, although the optical setup and certain physical characteristics of the detectors will be described to promote a more complete understandicg of the system.
{"title":"A Computer-Controlled System for Calibrating Detectors of Tea Laser Pulses","authors":"P. Simpson","doi":"10.1109/ARFTG.1983.323560","DOIUrl":"https://doi.org/10.1109/ARFTG.1983.323560","url":null,"abstract":"The National Bureau of Standards a t Boulder Colorado has developed a system for calibrating detectors used to measure TEA laser pulses El]. This system operates under the control of a desktop computer, which permits the rapid precise acquisition of data from several measuring devices during a testir:g period lasting approximately 5 minutes. Without the computer-controlled feature, the measurements would be quite laborious and time consuming and subject to the possible errors associated with transcribing and processing of data by hand. With the corputer the results are precisely calculated to 14 significant digits and are availablewithin 60 seconds after the veasuring process i s completed. This paper will deal ;nainly with the computer-controlled aspects of the system, although the optical setup and certain physical characteristics of the detectors will be described to promote a more complete understandicg of the system.","PeriodicalId":347704,"journal":{"name":"22nd ARFTG Conference Digest","volume":"27 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1983-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133234296","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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