首页 > 最新文献

ATZelectronics worldwide最新文献

英文 中文
Mixed-reality Driving Simulator for Evaluating Vehicle Functions 评估车辆功能的混合现实驾驶模拟器
ATZelectronics worldwide
Pub Date : 2025-12-05 DOI: 10.1007/s38314-025-2092-0
Alexander Kroys, Cagdas Tekcan, Rainer Stark
{"title":"Mixed-reality Driving Simulator for Evaluating Vehicle Functions","authors":"Alexander Kroys, Cagdas Tekcan, Rainer Stark","doi":"10.1007/s38314-025-2092-0","DOIUrl":"10.1007/s38314-025-2092-0","url":null,"abstract":"","PeriodicalId":100143,"journal":{"name":"ATZelectronics worldwide","volume":"20 12","pages":"72 - 77"},"PeriodicalIF":0.0,"publicationDate":"2025-12-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145665992","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Companies + Products 公司+产品
ATZelectronics worldwide
Pub Date : 2025-12-05 DOI: 10.1007/s38314-025-2085-z
{"title":"Companies + Products","authors":"","doi":"10.1007/s38314-025-2085-z","DOIUrl":"10.1007/s38314-025-2085-z","url":null,"abstract":"","PeriodicalId":100143,"journal":{"name":"ATZelectronics worldwide","volume":"20 12","pages":"26 - 29"},"PeriodicalIF":0.0,"publicationDate":"2025-12-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145666002","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
AI-Assisted Anonymization for Secure Cooperative Connected Automated Mobility 安全协作连接自动移动的人工智能辅助匿名化
ATZelectronics worldwide
Pub Date : 2025-12-05 DOI: 10.1007/s38314-025-2076-0
Christoph Pilz
{"title":"AI-Assisted Anonymization for Secure Cooperative Connected Automated Mobility","authors":"Christoph Pilz","doi":"10.1007/s38314-025-2076-0","DOIUrl":"10.1007/s38314-025-2076-0","url":null,"abstract":"","PeriodicalId":100143,"journal":{"name":"ATZelectronics worldwide","volume":"20 12","pages":"16 - 20"},"PeriodicalIF":0.0,"publicationDate":"2025-12-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://link.springer.com/content/pdf/10.1007/s38314-025-2076-0.pdf","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145666006","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
AI-supported Analysis of Durability Tests for Detecting Anomalies with Explainability 人工智能支持的耐久性测试分析，用于检测具有可解释性的异常
ATZelectronics worldwide
Pub Date : 2025-12-05 DOI: 10.1007/s38314-025-2091-1
Tharun Ganesh Jakkampudi, Thomas Flecke, Lukas Schäfers, Jan Nowack
{"title":"AI-supported Analysis of Durability Tests for Detecting Anomalies with Explainability","authors":"Tharun Ganesh Jakkampudi, Thomas Flecke, Lukas Schäfers, Jan Nowack","doi":"10.1007/s38314-025-2091-1","DOIUrl":"10.1007/s38314-025-2091-1","url":null,"abstract":"","PeriodicalId":100143,"journal":{"name":"ATZelectronics worldwide","volume":"20 12","pages":"64 - 71"},"PeriodicalIF":0.0,"publicationDate":"2025-12-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145666004","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
On Automotive Electronics 汽车电子
ATZelectronics worldwide
Pub Date : 2025-12-05 DOI: 10.1007/s38314-025-2088-9
Paul Hansen
{"title":"On Automotive Electronics","authors":"Paul Hansen","doi":"10.1007/s38314-025-2088-9","DOIUrl":"10.1007/s38314-025-2088-9","url":null,"abstract":"","PeriodicalId":100143,"journal":{"name":"ATZelectronics worldwide","volume":"20 12","pages":"22 - 23"},"PeriodicalIF":0.0,"publicationDate":"2025-12-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145666007","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Communication of Test Automation and Test System with STEP Middleware 测试自动化与测试系统与STEP中间件的通信
ATZelectronics worldwide
Pub Date : 2025-12-05 DOI: 10.1007/s38314-025-2090-2
Hussam Hamzat, Rudolf Mittermeier
{"title":"Communication of Test Automation and Test System with STEP Middleware","authors":"Hussam Hamzat, Rudolf Mittermeier","doi":"10.1007/s38314-025-2090-2","DOIUrl":"10.1007/s38314-025-2090-2","url":null,"abstract":"","PeriodicalId":100143,"journal":{"name":"ATZelectronics worldwide","volume":"20 12","pages":"50 - 55"},"PeriodicalIF":0.0,"publicationDate":"2025-12-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145665996","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Security in Next-gen Centralized E/E Architectures 新一代集中式E/E架构中的安全性
ATZelectronics worldwide
Pub Date : 2025-12-05 DOI: 10.1007/s38314-025-2068-0
Thomas Ginsberg, Claudio Balestrino, Stefan Marksteiner
{"title":"Security in Next-gen Centralized E/E Architectures","authors":"Thomas Ginsberg, Claudio Balestrino, Stefan Marksteiner","doi":"10.1007/s38314-025-2068-0","DOIUrl":"10.1007/s38314-025-2068-0","url":null,"abstract":"","PeriodicalId":100143,"journal":{"name":"ATZelectronics worldwide","volume":"20 12","pages":"42 - 46"},"PeriodicalIF":0.0,"publicationDate":"2025-12-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145666009","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Real-life Pilot of the Battery Product Passport for Electric Vehicle Batteries 电动车电池产品护照实训试点
ATZelectronics worldwide
Pub Date : 2025-12-05 DOI: 10.1007/s38314-025-2066-2
Stephan Revidat, Boriana Rukanova, Theodor Chirvisuta
{"title":"Real-life Pilot of the Battery Product Passport for Electric Vehicle Batteries","authors":"Stephan Revidat, Boriana Rukanova, Theodor Chirvisuta","doi":"10.1007/s38314-025-2066-2","DOIUrl":"10.1007/s38314-025-2066-2","url":null,"abstract":"","PeriodicalId":100143,"journal":{"name":"ATZelectronics worldwide","volume":"20 12","pages":"36 - 41"},"PeriodicalIF":0.0,"publicationDate":"2025-12-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145665998","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Artificial Intelligence for Data-driven Powertrain Modeling 数据驱动动力系统建模的人工智能
ATZelectronics worldwide
Pub Date : 2025-12-05 DOI: 10.1007/s38314-025-2093-z
Timo Hagenbucher, Michael Grill, André Casal Kulzer
{"title":"Artificial Intelligence for Data-driven Powertrain Modeling","authors":"Timo Hagenbucher, Michael Grill, André Casal Kulzer","doi":"10.1007/s38314-025-2093-z","DOIUrl":"10.1007/s38314-025-2093-z","url":null,"abstract":"","PeriodicalId":100143,"journal":{"name":"ATZelectronics worldwide","volume":"20 12","pages":"56 - 63"},"PeriodicalIF":0.0,"publicationDate":"2025-12-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145666000","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Secure Encryption 安全加密
ATZelectronics worldwide
Pub Date : 2025-12-05 DOI: 10.1007/s38314-025-2071-5
Robert Unseld
{"title":"Secure Encryption","authors":"Robert Unseld","doi":"10.1007/s38314-025-2071-5","DOIUrl":"10.1007/s38314-025-2071-5","url":null,"abstract":"","PeriodicalId":100143,"journal":{"name":"ATZelectronics worldwide","volume":"20 12","pages":"6 - 7"},"PeriodicalIF":0.0,"publicationDate":"2025-12-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145666001","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
下一页 尾页
类型
全部 化学•材料 生命科学 医学 物理 工程技术 环境•农林 材料科学 地球科学 法学 管理学 化学 环境科学与生态学 计算机科学 教育学 经济学 农林科学 人文科学 生物学 数学 物理与天体物理 心理学 综合性期刊 其他 工业工程 理学 历史学 农学 文学 信息工程
数据库
全部 ACS Publications Elsevier ieeexplore Springer The Royal Society of Chemistry Wiley
期刊
ATZelectronics worldwide
全部 Acc. Chem. Res. ACS Applied Bio Materials ACS Appl. Electron. Mater. ACS Appl. Energy Mater. ACS Appl. Mater. Interfaces ACS Appl. Nano Mater. ACS Appl. Polym. Mater. ACS BIOMATER-SCI ENG ACS Catal. ACS Cent. Sci. ACS Chem. Biol. ACS Chemical Health & Safety ACS Chem. Neurosci. ACS Comb. Sci. ACS Earth Space Chem. ACS Energy Lett. ACS Infect. Dis. ACS Macro Lett. ACS Mater. Lett. ACS Med. Chem. Lett. ACS Nano ACS Omega ACS Photonics ACS Sens. ACS Sustainable Chem. Eng. ACS Synth. Biol. Anal. Chem. BIOCHEMISTRY-US Bioconjugate Chem. BIOMACROMOLECULES Chem. Res. Toxicol. Chem. Rev. Chem. Mater. CRYST GROWTH DES ENERG FUEL Environ. Sci. Technol. Environ. Sci. Technol. Lett. Eur. J. Inorg. Chem. IND ENG CHEM RES Inorg. Chem. J. Agric. Food. Chem. J. Chem. Eng. Data J. Chem. Educ. J. Chem. Inf. Model. J. Chem. Theory Comput. J. Med. Chem. J. Nat. Prod. J PROTEOME RES J. Am. Chem. Soc. LANGMUIR MACROMOLECULES Mol. Pharmaceutics Nano Lett. Org. Lett. ORG PROCESS RES DEV ORGANOMETALLICS J. Org. Chem. J. Phys. Chem. J. Phys. Chem. A J. Phys. Chem. B J. Phys. Chem. C J. Phys. Chem. Lett. Analyst Anal. Methods Biomater. Sci. Catal. Sci. Technol. Chem. Commun. Chem. Soc. Rev. CHEM EDUC RES PRACT CRYSTENGCOMM Dalton Trans. Energy Environ. Sci. ENVIRON SCI-NANO ENVIRON SCI-PROC IMP ENVIRON SCI-WAT RES Faraday Discuss. Food Funct. Green Chem. Inorg. Chem. Front. Integr. Biol. J. Anal. At. Spectrom. J. Mater. Chem. A J. Mater. Chem. B J. Mater. Chem. C Lab Chip Mater. Chem. Front. Mater. Horiz. MEDCHEMCOMM Metallomics Mol. Biosyst. Mol. Syst. Des. Eng. Nanoscale Nanoscale Horiz. Nat. Prod. Rep. New J. Chem. Org. Biomol. Chem. Org. Chem. Front. PHOTOCH PHOTOBIO SCI PCCP Polym. Chem.
﹀
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
×
提示
您的信息不完整，为了账户安全，请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号：604180095
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们：info@booksci.cn
Book学术提供免费学术资源搜索服务，方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1