In type-II superconducting films, the metastable state can be disrupted by flux avalanches, leading to severe degradation of the electromagnetic properties and irreversible damage to the material in even relatively lower fields. In this study, an electrical-magnetic-thermal-mechanical coupling model is developed to investigate the electromagnetic and mechanical responses of YBa2Cu3O (YBCO) superconducting films with an edge slit during the flux avalanche, taking into account the effects of the edge slit on the triggering of the first flux avalanche. The distribution of magnetic field, temperature, and stress within the superconducting film, as well as the initiation and propagation of crack is numerically simulated by combining the Fast Fourier Transform (FFT) method and the Extended Finite Element Method (XFEM), allowing for an in-depth analysis of the fracture mechanism. The results indicate that thermal stress induced by magnetic flux avalanches is the dominant driving force behind the initiation and propagation of cracks, which has also previously been observed at the trunk of the dendritic flux avalanche in the YBCO superconducting film. Detailed analyzes are performed to discuss the influence of the working temperature, magnetic field ramp rate, and edge slit geometry on crack behavior. It is found that higher working temperatures lead to larger-scale avalanches and more pronounced non-uniform temperature rises, thereby significantly increasing fracture risk. Moreover, the applied magnetic field with lower ramp rates is more likely to induce fracture during the first flux avalanche. As for edge slit geometry, smaller edge slit widths or lengths intensify local heating and thermal stress concentration, further promoting crack propagation.
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