Pub Date : 1982-11-01DOI: 10.1109/ARFTG.1982.323533
K. Ishikawa, J. Nichols
{"title":"Vendor Presentation Millimeter Wave Network Analyzer/Down Converter for Use with HP 8410","authors":"K. Ishikawa, J. Nichols","doi":"10.1109/ARFTG.1982.323533","DOIUrl":"https://doi.org/10.1109/ARFTG.1982.323533","url":null,"abstract":"","PeriodicalId":101950,"journal":{"name":"20th ARFTG Conference Digest","volume":"108 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1982-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117260616","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1982-11-01DOI: 10.1109/ARFTG.1982.323520
R. Moyer, E. Franzak
These results demonstrate the efficacy of the TRT technique for calibrating a D6PNA at frequencies too low to use an air line standard as required by the TRL technique.
这些结果证明了TRT技术在频率过低而无法使用TRL技术要求的空气线路标准时校准D6PNA的有效性。
{"title":"Calibration of Six-Port Network Analyzers at Low Frequencies by TRT - A Variation of TRL Technique","authors":"R. Moyer, E. Franzak","doi":"10.1109/ARFTG.1982.323520","DOIUrl":"https://doi.org/10.1109/ARFTG.1982.323520","url":null,"abstract":"These results demonstrate the efficacy of the TRT technique for calibrating a D6PNA at frequencies too low to use an air line standard as required by the TRL technique.","PeriodicalId":101950,"journal":{"name":"20th ARFTG Conference Digest","volume":"10 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1982-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125720027","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1982-11-01DOI: 10.1109/ARFTG.1982.323519
C. Hoer
{"title":"Calibrating a Single 4-Port or 6-Port Reflectometer","authors":"C. Hoer","doi":"10.1109/ARFTG.1982.323519","DOIUrl":"https://doi.org/10.1109/ARFTG.1982.323519","url":null,"abstract":"","PeriodicalId":101950,"journal":{"name":"20th ARFTG Conference Digest","volume":"64 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1982-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125108691","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1982-11-01DOI: 10.1109/ARFTG.1982.323527
P. Goodman
This paper describes a method of using a six-port network for rapid testing of low reflection components in a production environment. The six-port network used is the conventional correlator circuit with two directional couplers and with back diode detectors as power sensors. The detector outputs are measured, corrected, and displayed by a waveform processing oscilloscope. The technique is extremely fast, accurate, and easy to use for low VSWR measurements.
{"title":"High Speed VSWR Testing with a Novel Six-Port Technique","authors":"P. Goodman","doi":"10.1109/ARFTG.1982.323527","DOIUrl":"https://doi.org/10.1109/ARFTG.1982.323527","url":null,"abstract":"This paper describes a method of using a six-port network for rapid testing of low reflection components in a production environment. The six-port network used is the conventional correlator circuit with two directional couplers and with back diode detectors as power sensors. The detector outputs are measured, corrected, and displayed by a waveform processing oscilloscope. The technique is extremely fast, accurate, and easy to use for low VSWR measurements.","PeriodicalId":101950,"journal":{"name":"20th ARFTG Conference Digest","volume":"7 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1982-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124410023","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1982-11-01DOI: 10.1109/ARFTG.1982.323529
Herbert Tardule
{"title":"Vendor Presentation Update Kits for HP 8542's and HP 8580's","authors":"Herbert Tardule","doi":"10.1109/ARFTG.1982.323529","DOIUrl":"https://doi.org/10.1109/ARFTG.1982.323529","url":null,"abstract":"","PeriodicalId":101950,"journal":{"name":"20th ARFTG Conference Digest","volume":"17 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1982-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132614176","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
京公网安备 11010802042870号
京ICP备2023020795号-1
扫码关注我们
求助内容：
应助结果提醒方式：