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1982 Symposium on VLSI Technology. Digest of Technical Papers最新文献

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Multilevel Ge-Se Film Based Resist Systems 多层Ge-Se薄膜基抗蚀剂系统
Pub Date : 1982-06-30 DOI: 10.1117/12.933409
K. Tai, R. G. Vadimsky, E. Ong
Multilevel resist systems based on Ge-Se films make possible the use of optical projection printers for printing 0.5-1.0μm features. The four multilevel resist systems considered employ either a photosensitive or a photopassive polymer layer for planarization. In bilevel schemes the surface of the Ge-Se film is reacted in a Ag(CN)i- containing solution to form a Ag2Se imaging layer. No reacted Ge-Se is used as a sacrificial layer in trilevel schemes. Ge-Se films are resistant to attack by oxygen plasma and therefore make good masks for pattern transfer by dry (reactive ion) etching, to a thick underlying photopassive polymer layer. Because of their high absorbance (a 105cm-1) in the ultraviolet and violet, Ge-Se patterns can also be used as exposure masks for transferring images to a thick underlying photosensitive polymer layer. The latter is "flood" exposed through the Ge-Se mask and wet developed. Both dry and wet processes provide steep wall-profile patterns in the polymer layer. The dry process provides superior feature size control while the wet process offers reduced processing cost. The exceptional lithographic performance exhibited by Ge-Se resist systems is attributed to a unique edge-sharpening effect; diffraction is compensated for by lateral silver diffusion in the Ag2Se layer. Patterns having 0.6μm lines and spaces are obtained over lcmXlcm fields with a defocus tolerance of 2.5μm using a standard Zeiss 10:1 reduction lens (N.A.=0.28, λ=436nm). Results indicate that optical lithography can practically print features in the size regime previously reserved for a-beam or x-ray based lithographic technologies.
基于Ge-Se薄膜的多层抗蚀剂系统使得使用光学投影打印机打印0.5-1.0μm的特征成为可能。考虑的四种多层抗蚀剂系统采用光敏或光钝化聚合物层进行平面化。在双能级方案中,Ge-Se薄膜表面在含Ag(CN)i的溶液中反应形成Ag2Se成像层。三能级方案采用未反应锗硒作为牺牲层。Ge-Se薄膜可以抵抗氧等离子体的侵蚀,因此可以通过干燥(反应离子)蚀刻将图案转移到厚的光钝化聚合物层上。由于其在紫外线和紫外光中的高吸光度(105cm-1), Ge-Se图案也可以用作曝光掩模,用于将图像传输到厚的底层光敏聚合物层。后者是通过Ge-Se掩膜“洪水”暴露和湿发育的。干法和湿法工艺均可在聚合物层中提供陡峭的壁廓图案。干法工艺提供优越的特征尺寸控制,而湿法工艺可降低加工成本。Ge-Se抗蚀剂系统所表现出的卓越光刻性能归功于其独特的锐边效应;银在Ag2Se层中的横向扩散补偿了衍射。采用标准蔡司10:1缩焦透镜(n.a =0.28, λ=436nm),在lcmXlcm的视场范围内获得了具有0.6μm线和空间的图案,离焦公差为2.5μm。结果表明,光学光刻实际上可以在以前为a束或x射线光刻技术保留的尺寸范围内打印特征。
{"title":"Multilevel Ge-Se Film Based Resist Systems","authors":"K. Tai, R. G. Vadimsky, E. Ong","doi":"10.1117/12.933409","DOIUrl":"https://doi.org/10.1117/12.933409","url":null,"abstract":"Multilevel resist systems based on Ge-Se films make possible the use of optical projection printers for printing 0.5-1.0μm features. The four multilevel resist systems considered employ either a photosensitive or a photopassive polymer layer for planarization. In bilevel schemes the surface of the Ge-Se film is reacted in a Ag(CN)i- containing solution to form a Ag2Se imaging layer. No reacted Ge-Se is used as a sacrificial layer in trilevel schemes. Ge-Se films are resistant to attack by oxygen plasma and therefore make good masks for pattern transfer by dry (reactive ion) etching, to a thick underlying photopassive polymer layer. Because of their high absorbance (a 105cm-1) in the ultraviolet and violet, Ge-Se patterns can also be used as exposure masks for transferring images to a thick underlying photosensitive polymer layer. The latter is \"flood\" exposed through the Ge-Se mask and wet developed. Both dry and wet processes provide steep wall-profile patterns in the polymer layer. The dry process provides superior feature size control while the wet process offers reduced processing cost. The exceptional lithographic performance exhibited by Ge-Se resist systems is attributed to a unique edge-sharpening effect; diffraction is compensated for by lateral silver diffusion in the Ag2Se layer. Patterns having 0.6μm lines and spaces are obtained over lcmXlcm fields with a defocus tolerance of 2.5μm using a standard Zeiss 10:1 reduction lens (N.A.=0.28, λ=436nm). Results indicate that optical lithography can practically print features in the size regime previously reserved for a-beam or x-ray based lithographic technologies.","PeriodicalId":120981,"journal":{"name":"1982 Symposium on VLSI Technology. Digest of Technical Papers","volume":"59 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1982-06-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127733106","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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1982 Symposium on VLSI Technology. Digest of Technical Papers
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