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Ieej Transactions on Fundamentals and Materials最新文献

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研究グループ 紹介:九州大学 大学院システム情報科学研究院 電気システム工学部門 吉田研究室 研究小组:九州大学系统信息研究生院电气系统工学系吉田研究室
Q4 Engineering Pub Date : 2024-02-01 DOI: 10.1541/ieejfms.144.nl2_4
敬介 吉田
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引用次数: 0
ベッド内要介護者・患者の行動推定のためのマイク対配列による音源像生成 通过麦克风对阵列生成声源图像,用于床上护理人员/病人行为估算。
Q4 Engineering Pub Date : 2024-02-01 DOI: 10.1541/ieejfms.144.38
Hajime Nakajima
{"title":"ベッド内要介護者・患者の行動推定のためのマイク対配列による音源像生成","authors":"Hajime Nakajima","doi":"10.1541/ieejfms.144.38","DOIUrl":"https://doi.org/10.1541/ieejfms.144.38","url":null,"abstract":"","PeriodicalId":13347,"journal":{"name":"Ieej Transactions on Fundamentals and Materials","volume":"3 10","pages":""},"PeriodicalIF":0.0,"publicationDate":"2024-02-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"139818484","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
QAM Signal Measurement Method based on Under-sampling 基于欠采样的 QAM 信号测量方法
Q4 Engineering Pub Date : 2024-01-01 DOI: 10.1541/ieejfms.144.23
Masatsugu Shimoda, Akihito Otani
{"title":"QAM Signal Measurement Method based on Under-sampling","authors":"Masatsugu Shimoda, Akihito Otani","doi":"10.1541/ieejfms.144.23","DOIUrl":"https://doi.org/10.1541/ieejfms.144.23","url":null,"abstract":"","PeriodicalId":13347,"journal":{"name":"Ieej Transactions on Fundamentals and Materials","volume":"51 18","pages":""},"PeriodicalIF":0.0,"publicationDate":"2024-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"139128025","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
基礎・材料・共通部門役員会・委員会名簿 基础部、材料部和普通部董事会和委员会名单。
Q4 Engineering Pub Date : 2024-01-01 DOI: 10.1541/ieejfms.144.l1_1
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引用次数: 0
研究グループ 紹介:東京理科大学 創域理工学部 電気電子情報工学科 永田研究室 研究小组介绍:东京理科大学电气、电子和信息工程系永田实验室
Q4 Engineering Pub Date : 2024-01-01 DOI: 10.1541/ieejfms.144.nl1_4
肇 永田
{"title":"研究グループ 紹介:東京理科大学 創域理工学部 電気電子情報工学科 永田研究室","authors":"肇 永田","doi":"10.1541/ieejfms.144.nl1_4","DOIUrl":"https://doi.org/10.1541/ieejfms.144.nl1_4","url":null,"abstract":"","PeriodicalId":13347,"journal":{"name":"Ieej Transactions on Fundamentals and Materials","volume":"30 23","pages":""},"PeriodicalIF":0.0,"publicationDate":"2024-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"139130008","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
The Forefront of Informatics Applications in Metallic and Ceramics Materials Technologies 金属和陶瓷材料技术中的信息学应用前沿
Q4 Engineering Pub Date : 2024-01-01 DOI: 10.1541/ieejfms.144.19
Akiyasu Yamamoto
{"title":"The Forefront of Informatics Applications in Metallic and Ceramics Materials Technologies","authors":"Akiyasu Yamamoto","doi":"10.1541/ieejfms.144.19","DOIUrl":"https://doi.org/10.1541/ieejfms.144.19","url":null,"abstract":"","PeriodicalId":13347,"journal":{"name":"Ieej Transactions on Fundamentals and Materials","volume":"58 33","pages":""},"PeriodicalIF":0.0,"publicationDate":"2024-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"139125437","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
誘電体レンズを用いるミリ波帯透過係数測定装置 使用介质透镜的毫米波波段传输系数测量系统。
Q4 Engineering Pub Date : 2024-01-01 DOI: 10.1541/ieejfms.144.35
Shin-ichiro Yamamoto, Satoru Aikawa
{"title":"誘電体レンズを用いるミリ波帯透過係数測定装置","authors":"Shin-ichiro Yamamoto, Satoru Aikawa","doi":"10.1541/ieejfms.144.35","DOIUrl":"https://doi.org/10.1541/ieejfms.144.35","url":null,"abstract":"","PeriodicalId":13347,"journal":{"name":"Ieej Transactions on Fundamentals and Materials","volume":"124 35","pages":""},"PeriodicalIF":0.0,"publicationDate":"2024-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"139128453","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Recent Activities of Frontiers in Education Committee of IEE Japan, from 2022 to 2023 国际电气工程师学会日本分会教育前沿委员会近期活动(2022-2023 年
Q4 Engineering Pub Date : 2024-01-01 DOI: 10.1541/ieejfms.144.1
Itaru Nakamura
{"title":"Recent Activities of Frontiers in Education Committee of IEE Japan, from 2022 to 2023","authors":"Itaru Nakamura","doi":"10.1541/ieejfms.144.1","DOIUrl":"https://doi.org/10.1541/ieejfms.144.1","url":null,"abstract":"","PeriodicalId":13347,"journal":{"name":"Ieej Transactions on Fundamentals and Materials","volume":"48 6","pages":""},"PeriodicalIF":0.0,"publicationDate":"2024-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"139127614","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Recent Topics on Electrical Discharges, Plasma, and Pulsed Power Technologies 有关放电、等离子体和脉冲功率技术的最新主题
Q4 Engineering Pub Date : 2024-01-01 DOI: 10.1541/ieejfms.144.10
Hiroki Kojima
{"title":"Recent Topics on Electrical Discharges, Plasma, and Pulsed Power Technologies","authors":"Hiroki Kojima","doi":"10.1541/ieejfms.144.10","DOIUrl":"https://doi.org/10.1541/ieejfms.144.10","url":null,"abstract":"","PeriodicalId":13347,"journal":{"name":"Ieej Transactions on Fundamentals and Materials","volume":"82 10","pages":""},"PeriodicalIF":0.0,"publicationDate":"2024-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"139125043","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
電気技術史技術委員会の最近の活動状況 电气技术史技术委员会近期的活动
Q4 Engineering Pub Date : 2024-01-01 DOI: 10.1541/ieejfms.144.3
Toshiko Nakagawa, Toshiyuki Sawa, Satoshi Marushima
{"title":"電気技術史技術委員会の最近の活動状況","authors":"Toshiko Nakagawa, Toshiyuki Sawa, Satoshi Marushima","doi":"10.1541/ieejfms.144.3","DOIUrl":"https://doi.org/10.1541/ieejfms.144.3","url":null,"abstract":"","PeriodicalId":13347,"journal":{"name":"Ieej Transactions on Fundamentals and Materials","volume":"19 22","pages":""},"PeriodicalIF":0.0,"publicationDate":"2024-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"139129190","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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Ieej Transactions on Fundamentals and Materials
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