The problem of stochastic sequential machines (SSM) synthesis is addressed and its relationship with the constrained sequence generation problem which arises during power estimation is discussed. In power estimation, one has to generate input vector sequences that satisfy a given statistical behavior (in terms of transition probabilities and correlations among bits) and/or to make these sequences as short as possible so as to improve the efficiency of power simulators, SSMs can be used to solve both problems. Based on Moore-type machines, a general procedure for SSM synthesis is revealed and a new framework for sequence characterization is built to match designer's needs for sequence generation or compaction. As results demonstrate, compaction ratios of 1-2 orders of magnitude can be obtained without much loss in accuracy of total power estimates.
{"title":"Stochastic sequential machine synthesis targeting constrained sequence generation","authors":"Diana Marculescu, R. Marculescu, Massoud Pedram","doi":"10.1145/240518.240650","DOIUrl":"https://doi.org/10.1145/240518.240650","url":null,"abstract":"The problem of stochastic sequential machines (SSM) synthesis is addressed and its relationship with the constrained sequence generation problem which arises during power estimation is discussed. In power estimation, one has to generate input vector sequences that satisfy a given statistical behavior (in terms of transition probabilities and correlations among bits) and/or to make these sequences as short as possible so as to improve the efficiency of power simulators, SSMs can be used to solve both problems. Based on Moore-type machines, a general procedure for SSM synthesis is revealed and a new framework for sequence characterization is built to match designer's needs for sequence generation or compaction. As results demonstrate, compaction ratios of 1-2 orders of magnitude can be obtained without much loss in accuracy of total power estimates.","PeriodicalId":152966,"journal":{"name":"33rd Design Automation Conference Proceedings, 1996","volume":"23 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1996-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132086819","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Hot-carrier effects and electromigration are the two important failure mechanisms that significantly impact the long-term reliability of high-density VLSI ICs. In this paper, we present a probabilistic switch-level method for identifying the most susceptible hot-carrier MOSFETs and improving their hot-carrier reliability using two techniques: (i) reordering of inputs to logic gates, and (ii) selective MOSFET sizing. We also show that for a given circuit, the best design in terms of hot-carrier reliability does not necessarily coincide with the best design in terms of power consumption.
{"title":"Hot-carrier reliability enhancement via input reordering and transistor sizing","authors":"A. Dasgupta, R. Karri","doi":"10.1145/240518.240672","DOIUrl":"https://doi.org/10.1145/240518.240672","url":null,"abstract":"Hot-carrier effects and electromigration are the two important failure mechanisms that significantly impact the long-term reliability of high-density VLSI ICs. In this paper, we present a probabilistic switch-level method for identifying the most susceptible hot-carrier MOSFETs and improving their hot-carrier reliability using two techniques: (i) reordering of inputs to logic gates, and (ii) selective MOSFET sizing. We also show that for a given circuit, the best design in terms of hot-carrier reliability does not necessarily coincide with the best design in terms of power consumption.","PeriodicalId":152966,"journal":{"name":"33rd Design Automation Conference Proceedings, 1996","volume":"101 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1996-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133572710","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Task management involves task creation and execution. These are facilitated using a task schema as exemplified in the Hercules Task Manager. Experience with Hercules has shown the task schema to be very useful for task creation, but less than ideal for task resolution, i.e., the selection of tool and data resources to be used in execution. Tool/data interactions often lead to resource selection constraints that cannot be captured using dependency relationships in the schema. We have addressed this by adding conditions to the task schema which use task-level meta-data to constrain resource selection. With examples we show that conditions are useful for handling a wide variety of real constraints.
{"title":"Improved tool and data selection in task management","authors":"J. W. Hagerman, S. W. Director","doi":"10.1145/240518.240552","DOIUrl":"https://doi.org/10.1145/240518.240552","url":null,"abstract":"Task management involves task creation and execution. These are facilitated using a task schema as exemplified in the Hercules Task Manager. Experience with Hercules has shown the task schema to be very useful for task creation, but less than ideal for task resolution, i.e., the selection of tool and data resources to be used in execution. Tool/data interactions often lead to resource selection constraints that cannot be captured using dependency relationships in the schema. We have addressed this by adding conditions to the task schema which use task-level meta-data to constrain resource selection. With examples we show that conditions are useful for handling a wide variety of real constraints.","PeriodicalId":152966,"journal":{"name":"33rd Design Automation Conference Proceedings, 1996","volume":"53 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1996-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131431413","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
The paper presents a methodology for concurrently optimizing an IC fabrication process and a standard cell library in order to maximize overall yield. The approach uses the Concurrent Subspace Optimization (CSSO) algorithm, which has been developed for general coupled, multidisciplinary optimization problems. An example is provided showing the application of the algorithm to optimizing a mixed analog/digital library on a CMOS process.
{"title":"A methodology for concurrent fabrication process/cell library optimization","authors":"A. Lokanathan, J. Brockman, J. Renaud","doi":"10.1109/DAC.1996.545685","DOIUrl":"https://doi.org/10.1109/DAC.1996.545685","url":null,"abstract":"The paper presents a methodology for concurrently optimizing an IC fabrication process and a standard cell library in order to maximize overall yield. The approach uses the Concurrent Subspace Optimization (CSSO) algorithm, which has been developed for general coupled, multidisciplinary optimization problems. An example is provided showing the application of the algorithm to optimizing a mixed analog/digital library on a CMOS process.","PeriodicalId":152966,"journal":{"name":"33rd Design Automation Conference Proceedings, 1996","volume":"70 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1996-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116278624","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
A fully automatic method for generating behavioral models for nonlinear analog circuits is presented. This method is based on simplifications of the system of nonlinear differential equations which is derived from a transistor level netlist. Generated models include nonlinear dynamic behavior. They are composed of symbolic equations comprising circuit parameters. Accuracy and simulation speed-up are shown by several examples.
{"title":"Equation-based behavioral model generation for nonlinear analog circuits","authors":"C. Borchers, L. Hedrich, E. Barke","doi":"10.1145/240518.240562","DOIUrl":"https://doi.org/10.1145/240518.240562","url":null,"abstract":"A fully automatic method for generating behavioral models for nonlinear analog circuits is presented. This method is based on simplifications of the system of nonlinear differential equations which is derived from a transistor level netlist. Generated models include nonlinear dynamic behavior. They are composed of symbolic equations comprising circuit parameters. Accuracy and simulation speed-up are shown by several examples.","PeriodicalId":152966,"journal":{"name":"33rd Design Automation Conference Proceedings, 1996","volume":"8 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1996-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117140947","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Aggressive voltage scaling to 1 V and below through technology, circuit, and architecture optimization has been proven to be the key to ultra low-power design. The key technology trends for low-voltage operation are presented including low-threshold devices, multiple-threshold devices, and SOI and bulk-CMOS based variable threshold devices. The requirements on CAD tools that allow designers to choose and optimize various technology, circuit, and system parameters are also discussed.
{"title":"Design considerations and tools for low-voltage digital system design","authors":"A. Chandrakasan, I. Yang, C. Vieri, D. Antoniadis","doi":"10.1145/240518.240540","DOIUrl":"https://doi.org/10.1145/240518.240540","url":null,"abstract":"Aggressive voltage scaling to 1 V and below through technology, circuit, and architecture optimization has been proven to be the key to ultra low-power design. The key technology trends for low-voltage operation are presented including low-threshold devices, multiple-threshold devices, and SOI and bulk-CMOS based variable threshold devices. The requirements on CAD tools that allow designers to choose and optimize various technology, circuit, and system parameters are also discussed.","PeriodicalId":152966,"journal":{"name":"33rd Design Automation Conference Proceedings, 1996","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1996-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121037866","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Measured Equation of Invariance (MEI) is a new concept in computational electromagnetics. It has been demonstrated that the MEI technique can be used to terminate the meshes very close to the object boundary and still strictly preserves the sparsity of the FD equations. Therefore, the final system matrix encountered by MEI is a sparse matrix with size similar to that of integral equation methods. However, complicated Green's function and disagreeable Sommerfeld integrals make the traditional MEI very difficult, if not impossible, to be applied to analyze multilayer and multiconductor interconnects. In this paper, we propose the Geometry Independent MEI (GIMEI) which substantially improved the original MEI method. We use GIMEI for capacitance extraction of general three-dimension VLSI interconnect. Numerical results are in good agreement with published data and those obtained by using FASTCAP, while GIMEI is generally an order of magnitude faster than FASTCAP and uses significant less memory than FASTCAP.
{"title":"Fast parameters extraction of general three-dimension interconnects using geometry independent measured equation of invariance","authors":"W. Sun, W. Dai, W. Hong","doi":"10.1145/240518.240589","DOIUrl":"https://doi.org/10.1145/240518.240589","url":null,"abstract":"Measured Equation of Invariance (MEI) is a new concept in computational electromagnetics. It has been demonstrated that the MEI technique can be used to terminate the meshes very close to the object boundary and still strictly preserves the sparsity of the FD equations. Therefore, the final system matrix encountered by MEI is a sparse matrix with size similar to that of integral equation methods. However, complicated Green's function and disagreeable Sommerfeld integrals make the traditional MEI very difficult, if not impossible, to be applied to analyze multilayer and multiconductor interconnects. In this paper, we propose the Geometry Independent MEI (GIMEI) which substantially improved the original MEI method. We use GIMEI for capacitance extraction of general three-dimension VLSI interconnect. Numerical results are in good agreement with published data and those obtained by using FASTCAP, while GIMEI is generally an order of magnitude faster than FASTCAP and uses significant less memory than FASTCAP.","PeriodicalId":152966,"journal":{"name":"33rd Design Automation Conference Proceedings, 1996","volume":"17 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1996-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123139560","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
This paper presents the use of a Markov-based model for analyzing iterative design processes. Techniques are developed for collecting process metadata and calibrating the model. An experiment is described that demonstrates the utility and accuracy of the model for simulating design processes and identifying design process bottlenecks.
{"title":"Application of a Markov model to the measurement, simulation, and diagnosis of an iterative design process","authors":"Eric W. Johnson, L. A. Castillo, J. Brockman","doi":"10.1145/240518.240553","DOIUrl":"https://doi.org/10.1145/240518.240553","url":null,"abstract":"This paper presents the use of a Markov-based model for analyzing iterative design processes. Techniques are developed for collecting process metadata and calibrating the model. An experiment is described that demonstrates the utility and accuracy of the model for simulating design processes and identifying design process bottlenecks.","PeriodicalId":152966,"journal":{"name":"33rd Design Automation Conference Proceedings, 1996","volume":"26 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1996-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122133853","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
This paper presents a new concept for accurate modeling and timing simulation of electronic systems integrated in a typical VHDL design environment, taking into account the requirements of deep submicron technology. Contrary to conventional concepts, autonomous models for gates and interconnections are used. A piece-wise-linear signal representation allows to model waveform dependent effects. Furthermore, the gate models catch pattern dependencies, the models of interconnections take into account post layout information with ramified structure, different layers and even contact holes.
{"title":"VAMP: a VHDL based concept for accurate modeling and post layout timing simulation of electronic systems","authors":"Bernhard Wunder, G. Lehmann, K. Müller-Glaser","doi":"10.1109/DAC.1996.545557","DOIUrl":"https://doi.org/10.1109/DAC.1996.545557","url":null,"abstract":"This paper presents a new concept for accurate modeling and timing simulation of electronic systems integrated in a typical VHDL design environment, taking into account the requirements of deep submicron technology. Contrary to conventional concepts, autonomous models for gates and interconnections are used. A piece-wise-linear signal representation allows to model waveform dependent effects. Furthermore, the gate models catch pattern dependencies, the models of interconnections take into account post layout information with ramified structure, different layers and even contact holes.","PeriodicalId":152966,"journal":{"name":"33rd Design Automation Conference Proceedings, 1996","volume":"7 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1996-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125318754","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
J.R. Burch and D.L. Dill (1994) described an automatic method for verifying a pipelined processor against its instruction set architecture (ISA). We describe three techniques for improving this method. We show how the combination of these techniques allows for the automatic verification of the control logic of a pipelined, superscalar implementation of a subset of the DLX architecture.
{"title":"Techniques for verifying superscalar microprocessors","authors":"J. Burch","doi":"10.1109/DAC.1996.545637","DOIUrl":"https://doi.org/10.1109/DAC.1996.545637","url":null,"abstract":"J.R. Burch and D.L. Dill (1994) described an automatic method for verifying a pipelined processor against its instruction set architecture (ISA). We describe three techniques for improving this method. We show how the combination of these techniques allows for the automatic verification of the control logic of a pipelined, superscalar implementation of a subset of the DLX architecture.","PeriodicalId":152966,"journal":{"name":"33rd Design Automation Conference Proceedings, 1996","volume":"84 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1996-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124606311","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
京公网安备 11010802042870号
京ICP备2023020795号-1
扫码关注我们
求助内容：
应助结果提醒方式：