Pub Date : 2009-07-06DOI: 10.1109/AMUEM.2009.5207609
J. Iannacci, A. Repchankova, D. Macii, M. Niessner
The accurate design of Micro-Electro-Mechanical-Systems (MEMS) for Radio Frequency (RF) architectures (e.g., reconfigurable transceivers) relies on suitable models describing the static and, above all, the dynamic electromechanical and electromagnetic behaviour of moveable structures. Such models usually include multiple parameters, whose values depend on the adopted manufacturing technology, as well as the uncertainty sources affecting the process itself. As a consequence, measuring the technology-related model parameters of a given class of MEMS structures is essential to estimate and to reduce, at an early design stage, possible mismatches between simulation results and device performances. In order to address this issue, in this paper we describe a procedure to measure the parameters describing the behaviour of RF-MEMS switches that are most severely affected by residual mechanical stress and surface roughness. The validity of the proposed methodology is confirmed by the good accordance between simulation and experimental results.
{"title":"A measurement procedure of technology-related model parameters for enhanced RF-MEMS design","authors":"J. Iannacci, A. Repchankova, D. Macii, M. Niessner","doi":"10.1109/AMUEM.2009.5207609","DOIUrl":"https://doi.org/10.1109/AMUEM.2009.5207609","url":null,"abstract":"The accurate design of Micro-Electro-Mechanical-Systems (MEMS) for Radio Frequency (RF) architectures (e.g., reconfigurable transceivers) relies on suitable models describing the static and, above all, the dynamic electromechanical and electromagnetic behaviour of moveable structures. Such models usually include multiple parameters, whose values depend on the adopted manufacturing technology, as well as the uncertainty sources affecting the process itself. As a consequence, measuring the technology-related model parameters of a given class of MEMS structures is essential to estimate and to reduce, at an early design stage, possible mismatches between simulation results and device performances. In order to address this issue, in this paper we describe a procedure to measure the parameters describing the behaviour of RF-MEMS switches that are most severely affected by residual mechanical stress and surface roughness. The validity of the proposed methodology is confirmed by the good accordance between simulation and experimental results.","PeriodicalId":180838,"journal":{"name":"2009 IEEE International Workshop on Advanced Methods for Uncertainty Estimation in Measurement","volume":"52 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-07-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117341317","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2009-07-06DOI: 10.1109/AMUEM.2009.5207584
M. Naumof, A. Dumitrescu, M. Albu, R. Magureanu, D. Flamanzeanu, I. Odor
Active filters represent one of the most performant solutions for improving power quality in distribution networks. The development of active distribution grids imposed new requirements for active filters, as they are installed in points of common coupling (PCC) and considering that the grid parameters can change in time. In the paper a thoroughly approach of the measurement chain and associated uncertainties is going to be presented, together with a set of recommendations for a more robust design.
{"title":"A study of the measurement chain in the power active filters. Uncertainty and control performances","authors":"M. Naumof, A. Dumitrescu, M. Albu, R. Magureanu, D. Flamanzeanu, I. Odor","doi":"10.1109/AMUEM.2009.5207584","DOIUrl":"https://doi.org/10.1109/AMUEM.2009.5207584","url":null,"abstract":"Active filters represent one of the most performant solutions for improving power quality in distribution networks. The development of active distribution grids imposed new requirements for active filters, as they are installed in points of common coupling (PCC) and considering that the grid parameters can change in time. In the paper a thoroughly approach of the measurement chain and associated uncertainties is going to be presented, together with a set of recommendations for a more robust design.","PeriodicalId":180838,"journal":{"name":"2009 IEEE International Workshop on Advanced Methods for Uncertainty Estimation in Measurement","volume":"228 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-07-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121070942","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2009-07-06DOI: 10.1109/AMUEM.2009.5207601
I. Odor, Dorin Flǎmǐnzeanu, C. Golovanov
The traceability routes to SI for the standards and electricity meters are presented. The uncertainty of the measurements along the unbroken chain of comparisons made to obtain reliable measurements of electrical power in Low Voltage distribution networks are also discussed.
{"title":"Aspects regarding the uncertainty of energy measurement in the Low Voltage distribution network","authors":"I. Odor, Dorin Flǎmǐnzeanu, C. Golovanov","doi":"10.1109/AMUEM.2009.5207601","DOIUrl":"https://doi.org/10.1109/AMUEM.2009.5207601","url":null,"abstract":"The traceability routes to SI for the standards and electricity meters are presented. The uncertainty of the measurements along the unbroken chain of comparisons made to obtain reliable measurements of electrical power in Low Voltage distribution networks are also discussed.","PeriodicalId":180838,"journal":{"name":"2009 IEEE International Workshop on Advanced Methods for Uncertainty Estimation in Measurement","volume":"59 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-07-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114479250","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2009-07-06DOI: 10.1109/AMUEM.2009.5207608
M. Cecco, L. Baglivo, G. Parzianello, M. Lunardelli, F. Setti, M. Pertile
It is described the uncertainty analysis performed for the reconstruction of a 3D shape. Multiple stereo systems are employed to measure a 3D surface with superimposed colored markers. The described procedure comprises a detailed uncertainty analysis of all the measurement phases, and the evaluated uncertainties are employed to perform a compatibility analysis of points acquired by different stereo pairs. The compatible acquired markers are statistically merged in order to obtain a measurement of a 3D shape and an evaluation of the associated uncertainty. Both the compatibility analysis and the measurement merging is based on the evaluated uncertainty.
{"title":"Uncertainty analysis for multi-stereo 3d shape estimation","authors":"M. Cecco, L. Baglivo, G. Parzianello, M. Lunardelli, F. Setti, M. Pertile","doi":"10.1109/AMUEM.2009.5207608","DOIUrl":"https://doi.org/10.1109/AMUEM.2009.5207608","url":null,"abstract":"It is described the uncertainty analysis performed for the reconstruction of a 3D shape. Multiple stereo systems are employed to measure a 3D surface with superimposed colored markers. The described procedure comprises a detailed uncertainty analysis of all the measurement phases, and the evaluated uncertainties are employed to perform a compatibility analysis of points acquired by different stereo pairs. The compatible acquired markers are statistically merged in order to obtain a measurement of a 3D shape and an evaluation of the associated uncertainty. Both the compatibility analysis and the measurement merging is based on the evaluated uncertainty.","PeriodicalId":180838,"journal":{"name":"2009 IEEE International Workshop on Advanced Methods for Uncertainty Estimation in Measurement","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-07-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129809583","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2009-07-06DOI: 10.1109/AMUEM.2009.5207599
G. Mauris
This paper deals with the foundations of a possibility/fuzzy expression of measurement uncertainty. Indeed the notion of possibility distribution is clearly identified to a family of probability distributions whose coverage intervals are included in the level cuts of the possibility distribution Thus the fuzzy inclusion ordering, dubbed specificity ordering, constitutes the basis of a maximal specificity principle. The latter is sounder than the maximal entropy principle to deal with cases of partial or incomplete information in a measurement context. The two approaches can be compared on some common practical measurement cases thanks to the respective coverage intervals they provide.
{"title":"The principle of possibility maximum specificity as a basis for measurement uncertainty expression","authors":"G. Mauris","doi":"10.1109/AMUEM.2009.5207599","DOIUrl":"https://doi.org/10.1109/AMUEM.2009.5207599","url":null,"abstract":"This paper deals with the foundations of a possibility/fuzzy expression of measurement uncertainty. Indeed the notion of possibility distribution is clearly identified to a family of probability distributions whose coverage intervals are included in the level cuts of the possibility distribution Thus the fuzzy inclusion ordering, dubbed specificity ordering, constitutes the basis of a maximal specificity principle. The latter is sounder than the maximal entropy principle to deal with cases of partial or incomplete information in a measurement context. The two approaches can be compared on some common practical measurement cases thanks to the respective coverage intervals they provide.","PeriodicalId":180838,"journal":{"name":"2009 IEEE International Workshop on Advanced Methods for Uncertainty Estimation in Measurement","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-07-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134484356","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2009-07-06DOI: 10.1109/AMUEM.2009.5207604
R. Leca, V. Groza
The notion of measurement uncertainty was coined to characterize physical phenomena and engineering constructions. The related standards that were subsequently conceived are not fully applicable to biomedical applications, where the measurand can change during measurement and the possibility to repeat measurement is an exception. Authors introduce some provisions to extend uncertainty application to blood pressure monitoring.
{"title":"On the need to estimate the adequacy of measurement results","authors":"R. Leca, V. Groza","doi":"10.1109/AMUEM.2009.5207604","DOIUrl":"https://doi.org/10.1109/AMUEM.2009.5207604","url":null,"abstract":"The notion of measurement uncertainty was coined to characterize physical phenomena and engineering constructions. The related standards that were subsequently conceived are not fully applicable to biomedical applications, where the measurand can change during measurement and the possibility to repeat measurement is an exception. Authors introduce some provisions to extend uncertainty application to blood pressure monitoring.","PeriodicalId":180838,"journal":{"name":"2009 IEEE International Workshop on Advanced Methods for Uncertainty Estimation in Measurement","volume":"215 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-07-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124225122","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2009-07-06DOI: 10.1109/AMUEM.2009.5207593
U. Bartoccini, G. Barchi, E. Nunzi
The prompt detection of jumps in frequency data is a topic currently receiving large attention from both the scientific and industrial communities. In fact, the frequency stability of the clock inserted in advanced telecommunication systems for synchronization purposes, has to be continuously monitored in order guarantee the target accuracy of the whole system. Many research and industrial laboratories analyze anomalies in frequency data by using algorithms mainly based on the Allan variance estimate of available data. Recently, a fault detection technique based on statistical tools, the Generalized Likelihood Ratio Test (GLRT), has been proposed effectively for revealing anomalies by means of the real-time processing of acquired data. This technique can be employed for emitting an alarm signal while the data acquisition process is going on and for having a good estimate of the jump location. In this paper, a performance comparison between the GLRT and other two algorithms (called BLKAVG and SEQAVG) usually employed in scientific labs for analyzing frequency jumps, is presented. The goal of the comparison process is the validation of the GLRT as a novel technique for revealing effectively anomalies occurrences in frequency data. In particular, it is shown that information given by GLRT on data parameters are complementary to those given by BLKAVG and SEQAVG.
{"title":"Methods and tools for frequency jump detection","authors":"U. Bartoccini, G. Barchi, E. Nunzi","doi":"10.1109/AMUEM.2009.5207593","DOIUrl":"https://doi.org/10.1109/AMUEM.2009.5207593","url":null,"abstract":"The prompt detection of jumps in frequency data is a topic currently receiving large attention from both the scientific and industrial communities. In fact, the frequency stability of the clock inserted in advanced telecommunication systems for synchronization purposes, has to be continuously monitored in order guarantee the target accuracy of the whole system. Many research and industrial laboratories analyze anomalies in frequency data by using algorithms mainly based on the Allan variance estimate of available data. Recently, a fault detection technique based on statistical tools, the Generalized Likelihood Ratio Test (GLRT), has been proposed effectively for revealing anomalies by means of the real-time processing of acquired data. This technique can be employed for emitting an alarm signal while the data acquisition process is going on and for having a good estimate of the jump location. In this paper, a performance comparison between the GLRT and other two algorithms (called BLKAVG and SEQAVG) usually employed in scientific labs for analyzing frequency jumps, is presented. The goal of the comparison process is the validation of the GLRT as a novel technique for revealing effectively anomalies occurrences in frequency data. In particular, it is shown that information given by GLRT on data parameters are complementary to those given by BLKAVG and SEQAVG.","PeriodicalId":180838,"journal":{"name":"2009 IEEE International Workshop on Advanced Methods for Uncertainty Estimation in Measurement","volume":"36 6","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-07-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134092860","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2009-07-06DOI: 10.1109/AMUEM.2009.5207592
E. Nunzi, D. D'Ippolito
The Generalized Likelihood Ratio Test (GLRT) is a fault detection technique usually employed for revealing faulting behavior by analyzing a finite length sequence of data. This technique is largely employed in many engineering applications and recently its effectiveness has been proved for detecting anomalies also in on-board atomic clocks [1]–[3]. Although the large number of scientific publications allows a simple interpretation of the GLRT outcome, the application of the GLRT to frequency data acquired from atomic clocks still need to be properly customized and metrologically characterized. In particular, by considering Global Navigation Satellite Systems (GNSS), the most effective application where atomic clocks are used, a faulting clock behavior should be recognized fast and efficiently in order to guarantee the system target accuracy. In this paper, a novel theoretical analysis of the GLRT is performed for revealing frequency jumps and variance changes. An application example shows how the presented analysis can be used for deriving practical criteria that simplify the application of the fault detection procedure based on the GLRT to atomic clock frequency data.
{"title":"A novel theoretical analysis of fault detection for atomic clock","authors":"E. Nunzi, D. D'Ippolito","doi":"10.1109/AMUEM.2009.5207592","DOIUrl":"https://doi.org/10.1109/AMUEM.2009.5207592","url":null,"abstract":"The Generalized Likelihood Ratio Test (GLRT) is a fault detection technique usually employed for revealing faulting behavior by analyzing a finite length sequence of data. This technique is largely employed in many engineering applications and recently its effectiveness has been proved for detecting anomalies also in on-board atomic clocks [1]–[3]. Although the large number of scientific publications allows a simple interpretation of the GLRT outcome, the application of the GLRT to frequency data acquired from atomic clocks still need to be properly customized and metrologically characterized. In particular, by considering Global Navigation Satellite Systems (GNSS), the most effective application where atomic clocks are used, a faulting clock behavior should be recognized fast and efficiently in order to guarantee the system target accuracy. In this paper, a novel theoretical analysis of the GLRT is performed for revealing frequency jumps and variance changes. An application example shows how the presented analysis can be used for deriving practical criteria that simplify the application of the fault detection procedure based on the GLRT to atomic clock frequency data.","PeriodicalId":180838,"journal":{"name":"2009 IEEE International Workshop on Advanced Methods for Uncertainty Estimation in Measurement","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-07-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130318936","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2009-07-06DOI: 10.1109/AMUEM.2009.5207596
M. Brandner
Measurement systems perform a quantitative comparison of an unknown physical quantity with a known reference. Vision sensors used in metrological applications provide a non-intrusive and non-invasive way to estimate geometric measurands and are, therefore, well suited for many industrial applications. In recent years the availability of high-resolution sensors and adequate processing power has led to an increased importance of vision-based measurement applications. This paper is concerned with the evaluation of measurement uncertainties in vision-based applications. In particular, we discuss the applicability of Gaussian uncertainties in vision-based metrological applications and present a frame-work for the uncertainty propagation of Gaussian quantities. The frame-work includes a guideline to model the measurement process based on the cause-effect diagram using simple graphical building blocks.
{"title":"Graphical modelling of measurement uncertainties in vision-based metrology","authors":"M. Brandner","doi":"10.1109/AMUEM.2009.5207596","DOIUrl":"https://doi.org/10.1109/AMUEM.2009.5207596","url":null,"abstract":"Measurement systems perform a quantitative comparison of an unknown physical quantity with a known reference. Vision sensors used in metrological applications provide a non-intrusive and non-invasive way to estimate geometric measurands and are, therefore, well suited for many industrial applications. In recent years the availability of high-resolution sensors and adequate processing power has led to an increased importance of vision-based measurement applications. This paper is concerned with the evaluation of measurement uncertainties in vision-based applications. In particular, we discuss the applicability of Gaussian uncertainties in vision-based metrological applications and present a frame-work for the uncertainty propagation of Gaussian quantities. The frame-work includes a guideline to model the measurement process based on the cause-effect diagram using simple graphical building blocks.","PeriodicalId":180838,"journal":{"name":"2009 IEEE International Workshop on Advanced Methods for Uncertainty Estimation in Measurement","volume":"17 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-07-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134069541","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2009-07-06DOI: 10.1109/AMUEM.2009.5207597
C. Spataro
In the last years, many Authors have dealt with the uncertainty evaluation of the measurement performed by using an analog-to-digital converter, proposing different approach to analyze the uncertainty propagation. In all these studies, it is clearly pointed out that starting from the manufacturer specifications is the least expensive, the least time consuming and, often, the most accurate way to assess the uncertainties. However, the Authors, which have proposed methodologies for the uncertainty assessment, use different parameters as starting point. One of the main reasons which has caused this situation is the coexistent of various Standards concerning the characterization of the analog-to-digital converters. Target of the paper is the choice, among the large number of parameters proposed by the various Standards, of a minimum set of figures of merit which allows a correct uncertainty evaluation of a generic measurement performed by using an analog-to-digital converter.
{"title":"ADC based measurements: Identification of the parameters for the uncertainty evaluation","authors":"C. Spataro","doi":"10.1109/AMUEM.2009.5207597","DOIUrl":"https://doi.org/10.1109/AMUEM.2009.5207597","url":null,"abstract":"In the last years, many Authors have dealt with the uncertainty evaluation of the measurement performed by using an analog-to-digital converter, proposing different approach to analyze the uncertainty propagation. In all these studies, it is clearly pointed out that starting from the manufacturer specifications is the least expensive, the least time consuming and, often, the most accurate way to assess the uncertainties. However, the Authors, which have proposed methodologies for the uncertainty assessment, use different parameters as starting point. One of the main reasons which has caused this situation is the coexistent of various Standards concerning the characterization of the analog-to-digital converters. Target of the paper is the choice, among the large number of parameters proposed by the various Standards, of a minimum set of figures of merit which allows a correct uncertainty evaluation of a generic measurement performed by using an analog-to-digital converter.","PeriodicalId":180838,"journal":{"name":"2009 IEEE International Workshop on Advanced Methods for Uncertainty Estimation in Measurement","volume":"51 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-07-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114710403","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
京公网安备 11010802042870号
京ICP备2023020795号-1
扫码关注我们
求助内容：
应助结果提醒方式：