Pub Date : 2023-07-06DOI: 10.22443/rms.mmc2023.334
{"title":"Multi-modal and multi-length scale chemical tomography","authors":"","doi":"10.22443/rms.mmc2023.334","DOIUrl":"https://doi.org/10.22443/rms.mmc2023.334","url":null,"abstract":"","PeriodicalId":194882,"journal":{"name":"Proceedings of the Microscience Microscopy Congress 2023 incorporating EMAG 2023","volume":"80 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-07-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133857550","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
. In situ scanning electron microscope micro-and nanomechanical testing has become an indispensable technique for bottom-up materials design as well as for fundamental mechanics research. Many new protocols and testing geometries beyond traditional nanoindentation now enable the study of microstructure–property relationships, material intrinsic behaviour including orientation-dependence and plasticity, fracture dynamics, or the performance of novel micro-3D-printed metamaterials, to name but a few. Here, we present the latest innovation in hardware and testing procedures for micromechanical testing at extreme temperatures and strain-rates. Thanks to its versatility, in situ SEM-based micromechanics is contributing to numerous scientific domains, including thin films and coatings, metallurgy, glasses and ceramics, semiconductors, biomechanics, or architectured materials. Performing micromechanical tests in situ in a SEM offers two important advantages: (1) unmatched control, stability, and positioning accuracy, and (2) the possibility to perform unique correlative experiments based on, for example, the combination of mechanical data with direct imaging or EBSD measurements. An increasingly important branch of micromechanical testing can be found in the simulation of real-world, extreme operation conditions, such as high temperatures in engines, cryogenic temperatures in hydrogen storage, dynamic loading under shock or impact, high frequency cyclic fatigue, or a combination thereof. Progress in the understanding of material behaviour at such conditions is clearly linked to the availability of laboratory equipment that can perform reliable tests under such conditions. We present the most recent developments in instrumentation for in situ extreme mechanics testing at the micro and nanoscales. In the focus is a testing platform capable of strain rate dependent testing over the range from 0.0001 s-1 up to 10’000 s-1 (8 orders of magnitude) with simultaneous high-speed actuation and sensing capabilities with nanometre and micronewton resolution, respectively. Furthermore, the challenges and solutions to performing extreme micromechanics
{"title":"In situExtreme Micromechanics – Recent Innovations and Prospects","authors":"N. Randall, R. Pero, R. Widmer, J. Breguet","doi":"10.22443/rms.mmc2023.65","DOIUrl":"https://doi.org/10.22443/rms.mmc2023.65","url":null,"abstract":". In situ scanning electron microscope micro-and nanomechanical testing has become an indispensable technique for bottom-up materials design as well as for fundamental mechanics research. Many new protocols and testing geometries beyond traditional nanoindentation now enable the study of microstructure–property relationships, material intrinsic behaviour including orientation-dependence and plasticity, fracture dynamics, or the performance of novel micro-3D-printed metamaterials, to name but a few. Here, we present the latest innovation in hardware and testing procedures for micromechanical testing at extreme temperatures and strain-rates. Thanks to its versatility, in situ SEM-based micromechanics is contributing to numerous scientific domains, including thin films and coatings, metallurgy, glasses and ceramics, semiconductors, biomechanics, or architectured materials. Performing micromechanical tests in situ in a SEM offers two important advantages: (1) unmatched control, stability, and positioning accuracy, and (2) the possibility to perform unique correlative experiments based on, for example, the combination of mechanical data with direct imaging or EBSD measurements. An increasingly important branch of micromechanical testing can be found in the simulation of real-world, extreme operation conditions, such as high temperatures in engines, cryogenic temperatures in hydrogen storage, dynamic loading under shock or impact, high frequency cyclic fatigue, or a combination thereof. Progress in the understanding of material behaviour at such conditions is clearly linked to the availability of laboratory equipment that can perform reliable tests under such conditions. We present the most recent developments in instrumentation for in situ extreme mechanics testing at the micro and nanoscales. In the focus is a testing platform capable of strain rate dependent testing over the range from 0.0001 s-1 up to 10’000 s-1 (8 orders of magnitude) with simultaneous high-speed actuation and sensing capabilities with nanometre and micronewton resolution, respectively. Furthermore, the challenges and solutions to performing extreme micromechanics","PeriodicalId":194882,"journal":{"name":"Proceedings of the Microscience Microscopy Congress 2023 incorporating EMAG 2023","volume":"32 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-07-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115924904","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2023-07-06DOI: 10.22443/rms.mmc2023.340
{"title":"Development of a compressed sensing platform for High-speed Hyperspectral FLIM","authors":"","doi":"10.22443/rms.mmc2023.340","DOIUrl":"https://doi.org/10.22443/rms.mmc2023.340","url":null,"abstract":"","PeriodicalId":194882,"journal":{"name":"Proceedings of the Microscience Microscopy Congress 2023 incorporating EMAG 2023","volume":"12 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-07-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117265130","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Anti Curtaining Table for generating smooth cross sections in inhomogeneous materials","authors":"","doi":"10.22443/rms.mmc2023.8","DOIUrl":"https://doi.org/10.22443/rms.mmc2023.8","url":null,"abstract":"","PeriodicalId":194882,"journal":{"name":"Proceedings of the Microscience Microscopy Congress 2023 incorporating EMAG 2023","volume":"29 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-07-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122070315","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2023-07-06DOI: 10.22443/rms.mmc2023.160
{"title":"Cryo-SEM to characterize the Microstructure of Starch during in vitro digestion","authors":"","doi":"10.22443/rms.mmc2023.160","DOIUrl":"https://doi.org/10.22443/rms.mmc2023.160","url":null,"abstract":"","PeriodicalId":194882,"journal":{"name":"Proceedings of the Microscience Microscopy Congress 2023 incorporating EMAG 2023","volume":"65 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-07-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125871423","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2023-07-06DOI: 10.22443/rms.mmc2023.226
{"title":"Quality-driven single particle averaging of super-resolved sarcomeres","authors":"","doi":"10.22443/rms.mmc2023.226","DOIUrl":"https://doi.org/10.22443/rms.mmc2023.226","url":null,"abstract":"","PeriodicalId":194882,"journal":{"name":"Proceedings of the Microscience Microscopy Congress 2023 incorporating EMAG 2023","volume":"13 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-07-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129395282","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2023-07-06DOI: 10.22443/rms.mmc2023.316
{"title":"Phase contrast from 4D-STEM data at finite electron dose","authors":"","doi":"10.22443/rms.mmc2023.316","DOIUrl":"https://doi.org/10.22443/rms.mmc2023.316","url":null,"abstract":"","PeriodicalId":194882,"journal":{"name":"Proceedings of the Microscience Microscopy Congress 2023 incorporating EMAG 2023","volume":"35 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-07-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129793838","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Applications of the new fs-laser capability in tri-beam for large volume microscopy","authors":"","doi":"10.22443/rms.mmc2023.77","DOIUrl":"https://doi.org/10.22443/rms.mmc2023.77","url":null,"abstract":"","PeriodicalId":194882,"journal":{"name":"Proceedings of the Microscience Microscopy Congress 2023 incorporating EMAG 2023","volume":"20 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-07-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127411347","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2023-07-06DOI: 10.22443/rms.mmc2023.387
{"title":"Scanning precession electron diffraction for structural analysis of polycrystalline ferroelectrics","authors":"","doi":"10.22443/rms.mmc2023.387","DOIUrl":"https://doi.org/10.22443/rms.mmc2023.387","url":null,"abstract":"","PeriodicalId":194882,"journal":{"name":"Proceedings of the Microscience Microscopy Congress 2023 incorporating EMAG 2023","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-07-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127519707","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2023-07-06DOI: 10.22443/rms.mmc2023.156
{"title":"High Quality Quantitative Structural Analysis using Pair Distribution Function (PDF) derived from Precession Electron Diffraction (PED) Patterns","authors":"","doi":"10.22443/rms.mmc2023.156","DOIUrl":"https://doi.org/10.22443/rms.mmc2023.156","url":null,"abstract":"","PeriodicalId":194882,"journal":{"name":"Proceedings of the Microscience Microscopy Congress 2023 incorporating EMAG 2023","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-07-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128942058","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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