Pub Date : 2021-02-26DOI: 10.1002/9781119664031.indauth
{"title":"Index","authors":"","doi":"10.1002/9781119664031.indauth","DOIUrl":"https://doi.org/10.1002/9781119664031.indauth","url":null,"abstract":"","PeriodicalId":196639,"journal":{"name":"Accelerated Life Testing of One‐shot Devices","volume":"22 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-02-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126464978","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2021-02-26DOI: 10.1002/9781119664031.ch7
{"title":"Optimal Design of Tests","authors":"","doi":"10.1002/9781119664031.ch7","DOIUrl":"https://doi.org/10.1002/9781119664031.ch7","url":null,"abstract":"","PeriodicalId":196639,"journal":{"name":"Accelerated Life Testing of One‐shot Devices","volume":"153 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-02-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122180590","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2021-02-26DOI: 10.1002/9781119664031.app3
{"title":"Non‐Identifiable Parameters for SSALTs Under Weibull Distribution","authors":"","doi":"10.1002/9781119664031.app3","DOIUrl":"https://doi.org/10.1002/9781119664031.app3","url":null,"abstract":"","PeriodicalId":196639,"journal":{"name":"Accelerated Life Testing of One‐shot Devices","volume":"58 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-02-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127931816","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2021-02-26DOI: 10.1002/9781119664031.ch3
Giselle Montamat
{"title":"Bayesian Inference","authors":"Giselle Montamat","doi":"10.1002/9781119664031.ch3","DOIUrl":"https://doi.org/10.1002/9781119664031.ch3","url":null,"abstract":"","PeriodicalId":196639,"journal":{"name":"Accelerated Life Testing of One‐shot Devices","volume":"39 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-02-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128201959","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2021-02-26DOI: 10.1002/9781119664031.ch8
{"title":"Design of Simple Step‐Stress Accelerated Life‐Tests","authors":"","doi":"10.1002/9781119664031.ch8","DOIUrl":"https://doi.org/10.1002/9781119664031.ch8","url":null,"abstract":"","PeriodicalId":196639,"journal":{"name":"Accelerated Life Testing of One‐shot Devices","volume":"28 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-02-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123491003","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2021-02-26DOI: 10.1002/9781119664031.app5
{"title":"Conditional Expectations for Competing Risks Model Under Exponential Distribution","authors":"","doi":"10.1002/9781119664031.app5","DOIUrl":"https://doi.org/10.1002/9781119664031.app5","url":null,"abstract":"","PeriodicalId":196639,"journal":{"name":"Accelerated Life Testing of One‐shot Devices","volume":"44 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-02-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121364547","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2021-02-26DOI: 10.1002/9781119664031.app6
{"title":"Kendall's Tau for Frank Copula","authors":"","doi":"10.1002/9781119664031.app6","DOIUrl":"https://doi.org/10.1002/9781119664031.app6","url":null,"abstract":"","PeriodicalId":196639,"journal":{"name":"Accelerated Life Testing of One‐shot Devices","volume":"24 2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-02-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116633092","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2021-02-26DOI: 10.1007/978-3-7643-8905-5_2
K. Imai
{"title":"Likelihood Inference","authors":"K. Imai","doi":"10.1007/978-3-7643-8905-5_2","DOIUrl":"https://doi.org/10.1007/978-3-7643-8905-5_2","url":null,"abstract":"","PeriodicalId":196639,"journal":{"name":"Accelerated Life Testing of One‐shot Devices","volume":"48 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-02-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126665258","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2021-02-26DOI: 10.1002/9781119664031.ch4
{"title":"Model Mis‐Specification Analysis and Model Selection","authors":"","doi":"10.1002/9781119664031.ch4","DOIUrl":"https://doi.org/10.1002/9781119664031.ch4","url":null,"abstract":"","PeriodicalId":196639,"journal":{"name":"Accelerated Life Testing of One‐shot Devices","volume":"13 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-02-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126094332","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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