B. Kalas, B. Pollakowski, A. Nutsch, C. Streeck, J. Nádor, M. Fried, B. Beckhoff, P. Petrik
{"title":"Ellipsometric and X‐Ray Spectrometric Investigation of Fibrinogen Protein Layers","authors":"B. Kalas, B. Pollakowski, A. Nutsch, C. Streeck, J. Nádor, M. Fried, B. Beckhoff, P. Petrik","doi":"10.1002/PSSC.201700210","DOIUrl":"https://doi.org/10.1002/PSSC.201700210","url":null,"abstract":"","PeriodicalId":20065,"journal":{"name":"Physica Status Solidi (c)","volume":"185 1","pages":"1700210"},"PeriodicalIF":0.0,"publicationDate":"2017-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"74928175","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
A. Schulze, R. Loo, L. Witters, H. Mertens, A. Gawlik, N. Horiguchi, N. Collaert, M. Wormington, P. Ryan, W. Vandervorst, M. Caymax
{"title":"Strain and Compositional Analysis of (Si)Ge Fin Structures Using High Resolution X‐Ray Diffraction","authors":"A. Schulze, R. Loo, L. Witters, H. Mertens, A. Gawlik, N. Horiguchi, N. Collaert, M. Wormington, P. Ryan, W. Vandervorst, M. Caymax","doi":"10.1002/PSSC.201700156","DOIUrl":"https://doi.org/10.1002/PSSC.201700156","url":null,"abstract":"","PeriodicalId":20065,"journal":{"name":"Physica Status Solidi (c)","volume":"83 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2017-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"72932342","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
S. Challinger, I. Baikie, A. G. Birdwell, S. Strehle
{"title":"Construction of the Energy Band Diagram of Hydrogen Terminated Diamond and Silicon Nanowires","authors":"S. Challinger, I. Baikie, A. G. Birdwell, S. Strehle","doi":"10.1002/PSSC.201700152","DOIUrl":"https://doi.org/10.1002/PSSC.201700152","url":null,"abstract":"","PeriodicalId":20065,"journal":{"name":"Physica Status Solidi (c)","volume":"38 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2017-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"85557138","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Ellipsometry is a useful tool for studying the optical properties of thin films such as photovoltaic devices. We employ Muller matrix ellipsometry to study the thin film photovoltaic material copper indium gallium selenide Cu(In,Ga) Se2 (CIGS), a commercially relevant material with high energy conversion efficiency. Confocal microscopy reveals an rms roughness of 68 nm, which greatly affects the ellipsometry data. Rayleigh-Rice theory is employed to account for the optical properties of the surface roughness in the ellipsometry experiment, and a library search method is used to compare Muller parameters calculated for various CIGS compositions, to the measured data. The Muller parameters calculated with the Rayleigh-Rice model are found to correspond well with the measured data, and a surface roughness of 37nm and a correlation length of 125nm are extracted.
{"title":"Use of Rayleigh-Rice Theory for Analysis of Ellipsometry Data on Rough CIGS Films","authors":"S. Jensen, D. Rosu, A. Hertwig, P. Hansen","doi":"10.1002/PSSC.201700217","DOIUrl":"https://doi.org/10.1002/PSSC.201700217","url":null,"abstract":"Ellipsometry is a useful tool for studying the optical properties of thin films such as photovoltaic devices. We employ Muller matrix ellipsometry to study the thin film photovoltaic material copper indium gallium selenide Cu(In,Ga) Se2 (CIGS), a commercially relevant material with high energy conversion efficiency. Confocal microscopy reveals an rms roughness of 68 nm, which greatly affects the ellipsometry data. Rayleigh-Rice theory is employed to account for the optical properties of the surface roughness in the ellipsometry experiment, and a library search method is used to compare Muller parameters calculated for various CIGS compositions, to the measured data. The Muller parameters calculated with the Rayleigh-Rice model are found to correspond well with the measured data, and a surface roughness of 37nm and a correlation length of 125nm are extracted.","PeriodicalId":20065,"journal":{"name":"Physica Status Solidi (c)","volume":"4 1","pages":"201700217"},"PeriodicalIF":0.0,"publicationDate":"2017-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"74217615","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Proceedings of the 2017 E‐MRS Spring Meeting Symposium P Silicon & Silicon Nanostructures: From Recent Fundamental Research to Novel Applications","authors":"","doi":"10.1002/pssc.201720016","DOIUrl":"https://doi.org/10.1002/pssc.201720016","url":null,"abstract":"","PeriodicalId":20065,"journal":{"name":"Physica Status Solidi (c)","volume":"1 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2017-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"79847325","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
K. Abrams, Q. Wan, Nicola Stehling, C. Jiao, A. Talari, I. Rehman, C. Rodenburg
We reveal nanoscale information of semi-crystalline polypropylene with the use of a new secondary electron hyperspectral imaging technique. The innovative combination of cryo-SEM and low voltage allows for the optimized imaging of these beam-sensitive materials. Through the collection of secondary electron hyperspectral imaging data, mapping of molecular order on the nano-scale in the scanning electron microscope (SEM) can be achieved.
{"title":"Nanoscale Mapping of Semi‐Crystalline Polypropylene","authors":"K. Abrams, Q. Wan, Nicola Stehling, C. Jiao, A. Talari, I. Rehman, C. Rodenburg","doi":"10.1002/PSSC.201700153","DOIUrl":"https://doi.org/10.1002/PSSC.201700153","url":null,"abstract":"We reveal nanoscale information of semi-crystalline polypropylene with the use of a new secondary electron hyperspectral imaging technique. The innovative combination of cryo-SEM and low voltage allows for the optimized imaging of these beam-sensitive materials. Through the collection of secondary electron hyperspectral imaging data, mapping of molecular order on the nano-scale in the scanning electron microscope (SEM) can be achieved.","PeriodicalId":20065,"journal":{"name":"Physica Status Solidi (c)","volume":"1 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2017-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"76860580","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
N. Korsunska, M. Baran, I. Vorona, V. Nosenko, S. Lavoryk, Yu. O. Polishchuk, V. Kladko, X. Portier, L. Khomenkova
The effect of calcination temperature (TC = 500–1000 °C) and cooling rate on the dopant distribution in Cu‐doped Y‐stabilized ZrO2 nanopowders is studied. The powders are produced by co‐precipitation technique and investigated by attenuated total reflection, UV‐vis diffuse reflectance, electron paramagnetic resonance, and transmission electron microscopy methods. The cooling rate is found to affect the amount of Cu substances on grain surface, the powders subjected to fast cooling (quenching) showed higher amount of Cu‐related complexes on the grains’ surface than their counterparts cooled with furnace after calcination. It is observed that Cu impurities diffuse inside ZrO2 grains from Cu‐related surface substances when TC 800 °C, outward migration of Cu dopants takes place. Simultaneously, the intensity of 275‐nm absorption band decreases, the monoclinic ZrO2 phase forms and its contribution rises with TC. It is proposed that monoclinic phase formation is caused by the replacement of Cu atoms from lattice sites to interstitials leading to an appearance of the channels for Y out‐diffusion via cation vacancies and destabilization of ZrO2 tetragonal phase.
{"title":"Effect of Cooling Rate on Dopant Spatial Localization and Phase Transformation in Cu‐Doped Y‐Stabilized ZrO2 Nanopowders","authors":"N. Korsunska, M. Baran, I. Vorona, V. Nosenko, S. Lavoryk, Yu. O. Polishchuk, V. Kladko, X. Portier, L. Khomenkova","doi":"10.1002/PSSC.201700183","DOIUrl":"https://doi.org/10.1002/PSSC.201700183","url":null,"abstract":"The effect of calcination temperature (TC = 500–1000 °C) and cooling rate on the dopant distribution in Cu‐doped Y‐stabilized ZrO2 nanopowders is studied. The powders are produced by co‐precipitation technique and investigated by attenuated total reflection, UV‐vis diffuse reflectance, electron paramagnetic resonance, and transmission electron microscopy methods. The cooling rate is found to affect the amount of Cu substances on grain surface, the powders subjected to fast cooling (quenching) showed higher amount of Cu‐related complexes on the grains’ surface than their counterparts cooled with furnace after calcination. It is observed that Cu impurities diffuse inside ZrO2 grains from Cu‐related surface substances when TC 800 °C, outward migration of Cu dopants takes place. Simultaneously, the intensity of 275‐nm absorption band decreases, the monoclinic ZrO2 phase forms and its contribution rises with TC. It is proposed that monoclinic phase formation is caused by the replacement of Cu atoms from lattice sites to interstitials leading to an appearance of the channels for Y out‐diffusion via cation vacancies and destabilization of ZrO2 tetragonal phase.","PeriodicalId":20065,"journal":{"name":"Physica Status Solidi (c)","volume":"14 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2017-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"87089200","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Carrier multiplication is a non-radiative recombination mechanism that leads to the generation of two or more electron-hole pairs after absorption of a single photon. By reducing the occurrence of dissipative effects, this process can be exploited to increase solar cell performance. In this work we introduce two different theoretical fully ab-initio tools that can be adopted to study carrier multiplication in nanocrystals. The tools are described in detail and compared. Subsequently we calculate carrier multiplication lifetimes in H- and OH- terminated silicon nanocrystals, pointed out the role played by the passivation on the carrier multiplication processes.
{"title":"Carrier Multiplication in Silicon Nanocrystals:Theoretical Methodologies and Role of the Passivation","authors":"I. Marri, M. Govoni, S. Ossicini","doi":"10.1002/pssc.201700198","DOIUrl":"https://doi.org/10.1002/pssc.201700198","url":null,"abstract":"Carrier multiplication is a non-radiative recombination mechanism that leads to the generation of two or more electron-hole pairs after absorption of a single photon. By reducing the occurrence of dissipative effects, this process can be exploited to increase solar cell performance. In this work we introduce two different theoretical fully ab-initio tools that can be adopted to study carrier multiplication in nanocrystals. The tools are described in detail and compared. Subsequently we calculate carrier multiplication lifetimes in H- and OH- terminated silicon nanocrystals, pointed out the role played by the passivation on the carrier multiplication processes.","PeriodicalId":20065,"journal":{"name":"Physica Status Solidi (c)","volume":"16 1","pages":"1700198-1700198"},"PeriodicalIF":0.0,"publicationDate":"2017-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"75293945","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
F. Koehler, Bianca Antonioli, D. Triyoso, H. Tao, K. Hempel
{"title":"Low‐k Spacers for 22 nm FDSOI Technology","authors":"F. Koehler, Bianca Antonioli, D. Triyoso, H. Tao, K. Hempel","doi":"10.1002/PSSC.201700196","DOIUrl":"https://doi.org/10.1002/PSSC.201700196","url":null,"abstract":"","PeriodicalId":20065,"journal":{"name":"Physica Status Solidi (c)","volume":"1 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2017-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"88924183","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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