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DS 119: Proceedings of the 33rd Symposium Design for X (DFX2022)最新文献

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Quantification of the material-related environmental impact of topology-optimized multi-material components 拓扑优化的多材料组件的材料相关环境影响的量化
Pub Date : 1900-01-01 DOI: 10.35199/dfx2022.01
Kevin Herrmann, B. Bode, Johanna Wurst, P. Gembarski, I. Mozgova, R. Lachmayer
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引用次数: 0
Analyzing Dependencies between Product Architecture and Module Drivers 分析产品架构和模块驱动之间的依赖关系
Pub Date : 1900-01-01 DOI: 10.35199/dfx2022.22
M. Zuefle
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引用次数: 3
Digital Twins of existing long-living assets: reverse instantiation of the mid-life twin 现有长寿资产的数字双胞胎:中年双胞胎的反向实例化
Pub Date : 1900-01-01 DOI: 10.35199/dfx2022.20
Keno Moenck, F. Laukotka, D. Krause, Thorsten Schüppstuhl
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引用次数: 2
Approach for load path optimized design of sandwich structures using virtual tests and realistic test setups 基于虚拟试验和真实试验装置的夹层结构载荷路径优化设计方法
Pub Date : 1900-01-01 DOI: 10.35199/dfx2022.05
J. Schwenke, L. Schwan, M. Hanna, D. Krause
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引用次数: 0
A concept for a novel hybrid augmented reality computer workstation for virtual product development 一种用于虚拟产品开发的新型混合增强现实计算机工作站概念
Pub Date : 1900-01-01 DOI: 10.35199/dfx2022.06
Jakob Harlan, B. Schleich, S. Wartzack
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引用次数: 2
A model-based approach for early robustness evaluation – Combination of Contact and Channel Approach with tolerance graphs in SysML 一种基于模型的早期鲁棒性评估方法<e:1>——SysML中接触与通道方法与容差图的结合
Pub Date : 1900-01-01 DOI: 10.35199/dfx2022.18
D. Horber, Jiahang Li, P. Grauberger, B. Schleich, S. Matthiesen, S. Wartzack
{"title":"A model-based approach for early robustness evaluation – Combination of Contact and Channel Approach with tolerance graphs in SysML","authors":"D. Horber, Jiahang Li, P. Grauberger, B. Schleich, S. Matthiesen, S. Wartzack","doi":"10.35199/dfx2022.18","DOIUrl":"https://doi.org/10.35199/dfx2022.18","url":null,"abstract":"","PeriodicalId":206701,"journal":{"name":"DS 119: Proceedings of the 33rd Symposium Design for X (DFX2022)","volume":"298 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134326910","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Heterogeneous groups of students as a challenge in engineering design education 异质学生群体是工程设计教育面临的挑战
Pub Date : 1900-01-01 DOI: 10.35199/dfx2022.07
F. Kossack, B. Bender
{"title":"Heterogeneous groups of students as a challenge in engineering design education","authors":"F. Kossack, B. Bender","doi":"10.35199/dfx2022.07","DOIUrl":"https://doi.org/10.35199/dfx2022.07","url":null,"abstract":"","PeriodicalId":206701,"journal":{"name":"DS 119: Proceedings of the 33rd Symposium Design for X (DFX2022)","volume":"31 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132693815","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Modeling and analysis of functional variance of complex technical systems 复杂技术系统功能方差的建模与分析
Pub Date : 1900-01-01 DOI: 10.35199/dfx2022.15
Bastian Menninger, D. Wiechel, Sascha Rackow, G. Höpfner, C. Oleff, J. Berroth, I. Gräßler, G. Jacobs
{"title":"Modeling and analysis of functional variance of complex technical systems","authors":"Bastian Menninger, D. Wiechel, Sascha Rackow, G. Höpfner, C. Oleff, J. Berroth, I. Gräßler, G. Jacobs","doi":"10.35199/dfx2022.15","DOIUrl":"https://doi.org/10.35199/dfx2022.15","url":null,"abstract":"","PeriodicalId":206701,"journal":{"name":"DS 119: Proceedings of the 33rd Symposium Design for X (DFX2022)","volume":"387 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129146154","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Test-driven Development to Overcome Challenges in the Design of Sensor-integrating Machine Elements 测试驱动开发克服传感器集成机器元件设计中的挑战
Pub Date : 1900-01-01 DOI: 10.35199/dfx2022.12
J. Peters, Christoph Zimmerer, T. Gwosch, Felix Herbst, C. Hartmann, R. Chadda, David Riehl, F. Keil, M. Kupnik, K. Hofmann
{"title":"Test-driven Development to Overcome Challenges in the Design of Sensor-integrating Machine Elements","authors":"J. Peters, Christoph Zimmerer, T. Gwosch, Felix Herbst, C. Hartmann, R. Chadda, David Riehl, F. Keil, M. Kupnik, K. Hofmann","doi":"10.35199/dfx2022.12","DOIUrl":"https://doi.org/10.35199/dfx2022.12","url":null,"abstract":"","PeriodicalId":206701,"journal":{"name":"DS 119: Proceedings of the 33rd Symposium Design for X (DFX2022)","volume":"12 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124400654","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Combined environments - challenges and potentials in the realistic component testing 组合环境-现实组件测试中的挑战和潜力
Pub Date : 1900-01-01 DOI: 10.35199/dfx2022.02
Philipp Hüttich, Stefan Panek, D. Krause
{"title":"Combined environments - challenges and potentials in the realistic component testing","authors":"Philipp Hüttich, Stefan Panek, D. Krause","doi":"10.35199/dfx2022.02","DOIUrl":"https://doi.org/10.35199/dfx2022.02","url":null,"abstract":"","PeriodicalId":206701,"journal":{"name":"DS 119: Proceedings of the 33rd Symposium Design for X (DFX2022)","volume":"178 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134254552","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
期刊
DS 119: Proceedings of the 33rd Symposium Design for X (DFX2022)
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