Chao Xu, Zhenxing Dong, Shuyi Chen, Yan Li, Yuye Ling, Yikai Su
To generate high quality images with faster calculation speed for holographic displays, we propose a modified unsupervised Vision Transformer model, which has the capability of capturing global features of an image. The proposed method can infer a hologram significantly faster than the stochastic gradient descent method, while producing images with similar quality.
{"title":"76‐3: A Modified Unsupervised Vision Transformer Network for High‐fidelity Computer‐generated Holography","authors":"Chao Xu, Zhenxing Dong, Shuyi Chen, Yan Li, Yuye Ling, Yikai Su","doi":"10.1002/sdtp.16758","DOIUrl":"https://doi.org/10.1002/sdtp.16758","url":null,"abstract":"To generate high quality images with faster calculation speed for holographic displays, we propose a modified unsupervised Vision Transformer model, which has the capability of capturing global features of an image. The proposed method can infer a hologram significantly faster than the stochastic gradient descent method, while producing images with similar quality.","PeriodicalId":21706,"journal":{"name":"SID Symposium Digest of Technical Papers","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2023-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"135096196","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
SID Symposium Digest of Technical PapersVolume 54, Issue 1 p. I-XII Book 2: SID 2023 Author Contact Information SID 2023 Author Contact Information First published: 30 August 2023 https://doi.org/10.1002/sdtp.16975AboutPDF ToolsRequest permissionExport citationAdd to favoritesTrack citation ShareShare Give accessShare full text accessShare full-text accessPlease review our Terms and Conditions of Use and check box below to share full-text version of article.I have read and accept the Wiley Online Library Terms and Conditions of UseShareable LinkUse the link below to share a full-text version of this article with your friends and colleagues. Learn more.Copy URL Share a linkShare onEmailFacebookTwitterLinkedInRedditWechat Volume54, Issue1June 2023Pages I-XII RelatedInformation
{"title":"SID 2023 Author Contact Information","authors":"","doi":"10.1002/sdtp.16975","DOIUrl":"https://doi.org/10.1002/sdtp.16975","url":null,"abstract":"SID Symposium Digest of Technical PapersVolume 54, Issue 1 p. I-XII Book 2: SID 2023 Author Contact Information SID 2023 Author Contact Information First published: 30 August 2023 https://doi.org/10.1002/sdtp.16975AboutPDF ToolsRequest permissionExport citationAdd to favoritesTrack citation ShareShare Give accessShare full text accessShare full-text accessPlease review our Terms and Conditions of Use and check box below to share full-text version of article.I have read and accept the Wiley Online Library Terms and Conditions of UseShareable LinkUse the link below to share a full-text version of this article with your friends and colleagues. Learn more.Copy URL Share a linkShare onEmailFacebookTwitterLinkedInRedditWechat Volume54, Issue1June 2023Pages I-XII RelatedInformation","PeriodicalId":21706,"journal":{"name":"SID Symposium Digest of Technical Papers","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2023-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"135096198","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
The emerging Color Filter on Touch (CFOT) technology significantly reduces OLED module transmittance and hence obstructs the use of traditional optical fingerprint on display (FOD). In this work, we demonstrate the integration of pinhole‐based FOD with CFOT OLED, achieving high performance FOD and display simultaneously.
{"title":"39‐3: Pinhole Matrix Fingerprint on Display Technology for CFOT OLED Display","authors":"Yang Zeng, Shengtao Zhu, Yaodong Wu, Qijun Yao","doi":"10.1002/sdtp.16619","DOIUrl":"https://doi.org/10.1002/sdtp.16619","url":null,"abstract":"The emerging Color Filter on Touch (CFOT) technology significantly reduces OLED module transmittance and hence obstructs the use of traditional optical fingerprint on display (FOD). In this work, we demonstrate the integration of pinhole‐based FOD with CFOT OLED, achieving high performance FOD and display simultaneously.","PeriodicalId":21706,"journal":{"name":"SID Symposium Digest of Technical Papers","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2023-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"135219985","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
SID Symposium Digest of Technical PapersVolume 54, Issue 1 p. XIII-XVIII Book 2: SID 2023 Executive and Program Committee SID 2023 Executive and Program Committee First published: 30 August 2023 https://doi.org/10.1002/sdtp.16976AboutPDF ToolsRequest permissionExport citationAdd to favoritesTrack citation ShareShare Give accessShare full text accessShare full-text accessPlease review our Terms and Conditions of Use and check box below to share full-text version of article.I have read and accept the Wiley Online Library Terms and Conditions of UseShareable LinkUse the link below to share a full-text version of this article with your friends and colleagues. Learn more.Copy URL Share a linkShare onEmailFacebookTwitterLinkedInRedditWechat Volume54, Issue1June 2023Pages XIII-XVIII RelatedInformation
{"title":"SID 2023 Executive and Program Committee","authors":"","doi":"10.1002/sdtp.16976","DOIUrl":"https://doi.org/10.1002/sdtp.16976","url":null,"abstract":"SID Symposium Digest of Technical PapersVolume 54, Issue 1 p. XIII-XVIII Book 2: SID 2023 Executive and Program Committee SID 2023 Executive and Program Committee First published: 30 August 2023 https://doi.org/10.1002/sdtp.16976AboutPDF ToolsRequest permissionExport citationAdd to favoritesTrack citation ShareShare Give accessShare full text accessShare full-text accessPlease review our Terms and Conditions of Use and check box below to share full-text version of article.I have read and accept the Wiley Online Library Terms and Conditions of UseShareable LinkUse the link below to share a full-text version of this article with your friends and colleagues. Learn more.Copy URL Share a linkShare onEmailFacebookTwitterLinkedInRedditWechat Volume54, Issue1June 2023Pages XIII-XVIII RelatedInformation","PeriodicalId":21706,"journal":{"name":"SID Symposium Digest of Technical Papers","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2023-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"135096200","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
This study proposes a novel design for achieving color conversion in micro light‐emitting diodes (Micro‐LEDs) using a hollow cylindrical structure. Instead of printing quantum dots (QDs) on the upper surface of the Micro‐LEDs, QDs are printed in a hollow place created by designing hollows of varying sizes and applying a layer of highly reflective metal to the top and outer walls. The design of this structure confines the emission light to the hollows, reduces photon leakage, and increases the path length of the excitation light in the quantum dot area. The color conversion capabilities of 60, 70, 80, and 90 μm hollows were investigated, and a 3×3 array was demonstrated. Using this approach, the thickness of the quantum dots on the upper surface of the LED can be reduced, without the need for a thick black matrix for reducing the problem of light crosstalk. This hollow cylindrical design presents a promising new approach for achieving color conversion in Micro‐LEDs, with potential applications in displays and lighting technologies.
{"title":"77‐2: Quantum‐Dot Color Conversion Achieved by A Novel Structure of Hollow Cylindrical Blue MicroLED","authors":"Wenjun Huang, Yonghong Lin, Zhaojun Liu","doi":"10.1002/sdtp.16761","DOIUrl":"https://doi.org/10.1002/sdtp.16761","url":null,"abstract":"This study proposes a novel design for achieving color conversion in micro light‐emitting diodes (Micro‐LEDs) using a hollow cylindrical structure. Instead of printing quantum dots (QDs) on the upper surface of the Micro‐LEDs, QDs are printed in a hollow place created by designing hollows of varying sizes and applying a layer of highly reflective metal to the top and outer walls. The design of this structure confines the emission light to the hollows, reduces photon leakage, and increases the path length of the excitation light in the quantum dot area. The color conversion capabilities of 60, 70, 80, and 90 μm hollows were investigated, and a 3×3 array was demonstrated. Using this approach, the thickness of the quantum dots on the upper surface of the LED can be reduced, without the need for a thick black matrix for reducing the problem of light crosstalk. This hollow cylindrical design presents a promising new approach for achieving color conversion in Micro‐LEDs, with potential applications in displays and lighting technologies.","PeriodicalId":21706,"journal":{"name":"SID Symposium Digest of Technical Papers","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2023-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"135096194","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Xiaoying Guo, Jinfeng Liu, Junyao Fan, Sili Liu, Nate Kim
The display product using Mini/MicroLED backlight, in the case of using the PWM dimming method, with the OC (open cell, OC) of the 4‐mask process, there will be a significant change in the horizontal light and dark band under the low gray level, which is called the waterfall phenomenon in the industry. In this paper, the causes of the waterfall phenomenon are analyzed and studied, and three methods of improving the waterfall are proposed. Experimental tests were carried out on the module of 34‐inch 1152 partition, and the display effect before and after the improvement was compared, and the effectiveness of the proposed method was verified.
{"title":"P‐174: The causes and improvement of the waterfall in Mini/MicroLED Displays","authors":"Xiaoying Guo, Jinfeng Liu, Junyao Fan, Sili Liu, Nate Kim","doi":"10.1002/sdtp.16912","DOIUrl":"https://doi.org/10.1002/sdtp.16912","url":null,"abstract":"The display product using Mini/MicroLED backlight, in the case of using the PWM dimming method, with the OC (open cell, OC) of the 4‐mask process, there will be a significant change in the horizontal light and dark band under the low gray level, which is called the waterfall phenomenon in the industry. In this paper, the causes of the waterfall phenomenon are analyzed and studied, and three methods of improving the waterfall are proposed. Experimental tests were carried out on the module of 34‐inch 1152 partition, and the display effect before and after the improvement was compared, and the effectiveness of the proposed method was verified.","PeriodicalId":21706,"journal":{"name":"SID Symposium Digest of Technical Papers","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2023-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"135096204","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Micro‐light‐emitting diode (Micro‐LED) is a new type of display device based on the third‐generation semiconductor gallium nitride (GaN) material. Micro‐LED has been applied to micro‐display technology due to its huge development potential. However, the EQE of Micro‐LEDs decreases with the decrease of the sidewall defects, and the passivation process can reduce the sidewall damage and improve the EQE. In this study, the fabrication technology of Micro‐LEDs was summarized and InGaN/GaN multi‐quantum wells (MQWs) Micro‐LEDs from 10 × 10 μm to 200 × 200 μm were fabricated. The improvement effect of different passivation materials on the electrical characteristics of Micro‐LEDs was explored. The results showed that passivation materials could effectively reduce the leakage of the device, reduce the sidewall damage and reduce the ideal factor, among which Si 3 N 4 had the most obvious effect.
{"title":"P‐64: Investigation of Fabrication Technologies of GaN‐based Micro‐LED Devices","authors":"Xiangyu Miao, Wenjun Huang, Zhaojun Liu","doi":"10.1002/sdtp.16933","DOIUrl":"https://doi.org/10.1002/sdtp.16933","url":null,"abstract":"Micro‐light‐emitting diode (Micro‐LED) is a new type of display device based on the third‐generation semiconductor gallium nitride (GaN) material. Micro‐LED has been applied to micro‐display technology due to its huge development potential. However, the EQE of Micro‐LEDs decreases with the decrease of the sidewall defects, and the passivation process can reduce the sidewall damage and improve the EQE. In this study, the fabrication technology of Micro‐LEDs was summarized and InGaN/GaN multi‐quantum wells (MQWs) Micro‐LEDs from 10 × 10 μm to 200 × 200 μm were fabricated. The improvement effect of different passivation materials on the electrical characteristics of Micro‐LEDs was explored. The results showed that passivation materials could effectively reduce the leakage of the device, reduce the sidewall damage and reduce the ideal factor, among which Si 3 N 4 had the most obvious effect.","PeriodicalId":21706,"journal":{"name":"SID Symposium Digest of Technical Papers","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2023-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"135096192","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
GaN‐based light‐emitting diode (LED) arrays are a promising technology in a wide range of applications. Research on temperature dependence performance is important in GaN‐ based LED. Display applications are still the focus of GaN‐ based LEDs, especially high‐definition (HD) displays. It is of great importance for HD display to researching green Micro‐LED device. we study the performance issues of 80μm green Micro‐LED devices include ideality factor at different temperatures, carrier concentration distribution, and optical properties. This research can help understand and fabrication high‐performance green Micro‐LED devices.
{"title":"P‐67: Research of photoelectric performance GaN based green Micro‐LED <sup>†</sup>","authors":"Mengyuan Zhanghu, Zhaojun Liu","doi":"10.1002/sdtp.16936","DOIUrl":"https://doi.org/10.1002/sdtp.16936","url":null,"abstract":"GaN‐based light‐emitting diode (LED) arrays are a promising technology in a wide range of applications. Research on temperature dependence performance is important in GaN‐ based LED. Display applications are still the focus of GaN‐ based LEDs, especially high‐definition (HD) displays. It is of great importance for HD display to researching green Micro‐LED device. we study the performance issues of 80μm green Micro‐LED devices include ideality factor at different temperatures, carrier concentration distribution, and optical properties. This research can help understand and fabrication high‐performance green Micro‐LED devices.","PeriodicalId":21706,"journal":{"name":"SID Symposium Digest of Technical Papers","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2023-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"135096193","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
In this paper, a novel objective evaluation method is proposed to quantify the picture quality. In particular, the effect of “halo” and “backlight delay” is taken into consideration in the design of the evaluation pipeline. The objective evaluation method is used to test the picture quality, and the results are compared with the subjective ones, demonstrating the effectiveness of our proposed evaluation method.
{"title":"P‐49: Picture Quality Evaluation Method on LCD with Local Dimming Technology <sup>†</sup>","authors":"Chaoping Li, Jhenwei He, Junli Xie, Xiaoying Guo","doi":"10.1002/sdtp.16926","DOIUrl":"https://doi.org/10.1002/sdtp.16926","url":null,"abstract":"In this paper, a novel objective evaluation method is proposed to quantify the picture quality. In particular, the effect of “halo” and “backlight delay” is taken into consideration in the design of the evaluation pipeline. The objective evaluation method is used to test the picture quality, and the results are compared with the subjective ones, demonstrating the effectiveness of our proposed evaluation method.","PeriodicalId":21706,"journal":{"name":"SID Symposium Digest of Technical Papers","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2023-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"135096202","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
SID Symposium Digest of Technical PapersVolume 54, Issue 1 p. XIII-XVIII Book 1: SID 2023 Executive and Program Committee SID 2023 Executive and Program Committee First published: 30 August 2023 https://doi.org/10.1002/sdtp.16974AboutPDF ToolsRequest permissionExport citationAdd to favoritesTrack citation ShareShare Give accessShare full text accessShare full-text accessPlease review our Terms and Conditions of Use and check box below to share full-text version of article.I have read and accept the Wiley Online Library Terms and Conditions of UseShareable LinkUse the link below to share a full-text version of this article with your friends and colleagues. Learn more.Copy URL Share a linkShare onEmailFacebookTwitterLinkedInRedditWechat Volume54, Issue1June 2023Pages XIII-XVIII RelatedInformation
{"title":"SID 2023 Executive and Program Committee","authors":"","doi":"10.1002/sdtp.16974","DOIUrl":"https://doi.org/10.1002/sdtp.16974","url":null,"abstract":"SID Symposium Digest of Technical PapersVolume 54, Issue 1 p. XIII-XVIII Book 1: SID 2023 Executive and Program Committee SID 2023 Executive and Program Committee First published: 30 August 2023 https://doi.org/10.1002/sdtp.16974AboutPDF ToolsRequest permissionExport citationAdd to favoritesTrack citation ShareShare Give accessShare full text accessShare full-text accessPlease review our Terms and Conditions of Use and check box below to share full-text version of article.I have read and accept the Wiley Online Library Terms and Conditions of UseShareable LinkUse the link below to share a full-text version of this article with your friends and colleagues. Learn more.Copy URL Share a linkShare onEmailFacebookTwitterLinkedInRedditWechat Volume54, Issue1June 2023Pages XIII-XVIII RelatedInformation","PeriodicalId":21706,"journal":{"name":"SID Symposium Digest of Technical Papers","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2023-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"135096199","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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