Pub Date : 2019-02-15DOI: 10.1002/9781118663233.CH25
D. Drobne, Sara Novak, A. Erman, G. Dražič
{"title":"New Opportunities for FIB/SEM EDX in Nanomedicine: Cancerogenesis Research","authors":"D. Drobne, Sara Novak, A. Erman, G. Dražič","doi":"10.1002/9781118663233.CH25","DOIUrl":"https://doi.org/10.1002/9781118663233.CH25","url":null,"abstract":"","PeriodicalId":220453,"journal":{"name":"Biological Field Emission Scanning Electron Microscopy","volume":"4 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-02-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121081912","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2019-02-15DOI: 10.1002/9781118663233.CH28
A. Warley, J. Skepper
{"title":"Element Analysis in the FEGSEM: Application and Limitations for Biological Systems","authors":"A. Warley, J. Skepper","doi":"10.1002/9781118663233.CH28","DOIUrl":"https://doi.org/10.1002/9781118663233.CH28","url":null,"abstract":"","PeriodicalId":220453,"journal":{"name":"Biological Field Emission Scanning Electron Microscopy","volume":"23 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-02-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125136591","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2019-02-15DOI: 10.1002/9781118663233.CH16
M. Osumi
{"title":"Low-Voltage Scanning Electron Microscopy in Yeast Cells","authors":"M. Osumi","doi":"10.1002/9781118663233.CH16","DOIUrl":"https://doi.org/10.1002/9781118663233.CH16","url":null,"abstract":"","PeriodicalId":220453,"journal":{"name":"Biological Field Emission Scanning Electron Microscopy","volume":"98 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-02-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121474871","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2019-02-15DOI: 10.1002/9781118663233.CH1
D. Joy
Since its initial development (Everhart and Thornley, 1958) the scanning electron microscope (SEM) has earned a reputation for being the most widely used, high performance, imaging technology that is available for applications ranging from imaging, fabrication, patterning, and chemical analysis, and for materials of all types and applications. It is estimated that 150 000 or so such instruments are now currently in use worldwide, varying in performance and complexity from simple desk-top systems to state-of-the-art field emission gun systems that can now cost in excess of $5 million. The basic principle of the scanning electron microscope is simple. An incident electron beam is brought to a focus that typically varies in size from a fraction of a centimeter in diameter down to a spot that can be smaller by a factor of many thousands of times, and with an energy varying from 100 eV or less to a maximum of 30 keV or more. This beam spot is typically then scanned (Figure 1.1) in a linear “raster” pattern across the region of interest, although other patterns – such as a radial beam – are sometimes employed for special purposes. Typically the final deposited pattern will contain of the order of 1000 × 1000 or more individual imaging points. The incident beam electrons can interact with the sample atoms through either elastic or inelastic scattering. Elastic scattering is where the incident electrons are deflected with no loss of energy. Inelastic scattering involves a loss of energy, often by ionizing the sample atoms. The incident electrons will scatter (both elastically and inelastically) many times in
{"title":"Scanning Electron Microscopy: Theory, History and Development of the Field Emission Scanning Electron Microscope","authors":"D. Joy","doi":"10.1002/9781118663233.CH1","DOIUrl":"https://doi.org/10.1002/9781118663233.CH1","url":null,"abstract":"Since its initial development (Everhart and Thornley, 1958) the scanning electron microscope (SEM) has earned a reputation for being the most widely used, high performance, imaging technology that is available for applications ranging from imaging, fabrication, patterning, and chemical analysis, and for materials of all types and applications. It is estimated that 150 000 or so such instruments are now currently in use worldwide, varying in performance and complexity from simple desk-top systems to state-of-the-art field emission gun systems that can now cost in excess of $5 million. The basic principle of the scanning electron microscope is simple. An incident electron beam is brought to a focus that typically varies in size from a fraction of a centimeter in diameter down to a spot that can be smaller by a factor of many thousands of times, and with an energy varying from 100 eV or less to a maximum of 30 keV or more. This beam spot is typically then scanned (Figure 1.1) in a linear “raster” pattern across the region of interest, although other patterns – such as a radial beam – are sometimes employed for special purposes. Typically the final deposited pattern will contain of the order of 1000 × 1000 or more individual imaging points. The incident beam electrons can interact with the sample atoms through either elastic or inelastic scattering. Elastic scattering is where the incident electrons are deflected with no loss of energy. Inelastic scattering involves a loss of energy, often by ionizing the sample atoms. The incident electrons will scatter (both elastically and inelastically) many times in","PeriodicalId":220453,"journal":{"name":"Biological Field Emission Scanning Electron Microscopy","volume":"54 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-02-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125725751","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2019-02-15DOI: 10.1002/9781118663233.CH19
Y. Fukuda, A. Leis, A. Rigort
{"title":"Preparation of Vitrified Cells for TEM by Cryo-FIB Microscopy","authors":"Y. Fukuda, A. Leis, A. Rigort","doi":"10.1002/9781118663233.CH19","DOIUrl":"https://doi.org/10.1002/9781118663233.CH19","url":null,"abstract":"","PeriodicalId":220453,"journal":{"name":"Biological Field Emission Scanning Electron Microscopy","volume":"6 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-02-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115457381","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2019-02-15DOI: 10.1002/9781118663233.CH4
K. Ogura, A. Yarwood
{"title":"A History of JEOL Field Emission Scanning Electron Microscopes with Reference to Biological Applications","authors":"K. Ogura, A. Yarwood","doi":"10.1002/9781118663233.CH4","DOIUrl":"https://doi.org/10.1002/9781118663233.CH4","url":null,"abstract":"","PeriodicalId":220453,"journal":{"name":"Biological Field Emission Scanning Electron Microscopy","volume":"24 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-02-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130637344","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2019-02-15DOI: 10.1002/9781118663233.CH12
Sebastian Tacke, F. Lucas, J. Woodward, H. Gross, R. Wepf
The beauty of Scanning Electron Microscopy (SEM) is its power to describe and integrate structural details, mainly surface related details, within the context of a complex system. Its unique ability compared to other Electron Microscopy techniques (STEM & TEM) is that handling and imaging of bulk samples is in principal possible and hence sectioning, thinning or replicating of the specimen is not essential when surfaces structures are to be investigated. With the introduction of Field Emission SEM (FESEM), especially in combination with improvements to the signal detection efficiency ("in-lens" detection and new type of detectors), high resolution SEM (HRSEM) has become a powerful approach to describe structural details even down to macromolecular dimensions (1-2nm) for structural studies in Biology and soft-material science.
{"title":"High-Resolution Cryo-Scanning Electron Microscopy of Macromolecular Complexes","authors":"Sebastian Tacke, F. Lucas, J. Woodward, H. Gross, R. Wepf","doi":"10.1002/9781118663233.CH12","DOIUrl":"https://doi.org/10.1002/9781118663233.CH12","url":null,"abstract":"The beauty of Scanning Electron Microscopy (SEM) is its power to describe and integrate structural details, mainly surface related details, within the context of a complex system. Its unique ability compared to other Electron Microscopy techniques (STEM & TEM) is that handling and imaging of bulk samples is in principal possible and hence sectioning, thinning or replicating of the specimen is not essential when surfaces structures are to be investigated. With the introduction of Field Emission SEM (FESEM), especially in combination with improvements to the signal detection efficiency (\"in-lens\" detection and new type of detectors), high resolution SEM (HRSEM) has become a powerful approach to describe structural details even down to macromolecular dimensions (1-2nm) for structural studies in Biology and soft-material science.","PeriodicalId":220453,"journal":{"name":"Biological Field Emission Scanning Electron Microscopy","volume":"197 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-02-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114263389","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2019-02-15DOI: 10.1002/9781118663233.ch10
B. Humbel, H. Schwarz, E. Tranfield, R. Fleck
{"title":"Chemical Fixation","authors":"B. Humbel, H. Schwarz, E. Tranfield, R. Fleck","doi":"10.1002/9781118663233.ch10","DOIUrl":"https://doi.org/10.1002/9781118663233.ch10","url":null,"abstract":"","PeriodicalId":220453,"journal":{"name":"Biological Field Emission Scanning Electron Microscopy","volume":"65 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-02-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128903636","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2019-02-15DOI: 10.1002/9781118663233.CH21
Thomas Templier, Richard Hans Robert Hahnloser
Correlative array tomography (CAT) makes use of the fixative agent glutaraldehyde and requires heavy metal staining for ultrastructural contrast. A key component of array tomography (AT) relies on the production of arrays of ultrathin sections from resin‐embedded biological samples. The need for correlative light and electron microscopy lies in the intrinsic properties of biological tissues, namely the intricate relationship between the molecular and physical architectures. Fixation, dehydration, and resin embedding are necessary steps in order to visualize biological tissue in electron microscopes. This chapter summarizes the key differences between CAT protocols for circuit tracing and for proteometric analysis. It briefly reviews several AT‐compatible techniques for the collection of ultrathin sections of resin‐embedded tissue. The chapter details imaging procedures for the two modalities: light microscopy and electron microscopy. Finally, it presents an application that demonstrates the power of CAT applied to the analysis of brain circuits.
{"title":"Correlative Array Tomography","authors":"Thomas Templier, Richard Hans Robert Hahnloser","doi":"10.1002/9781118663233.CH21","DOIUrl":"https://doi.org/10.1002/9781118663233.CH21","url":null,"abstract":"Correlative array tomography (CAT) makes use of the fixative agent glutaraldehyde and requires heavy metal staining for ultrastructural contrast. A key component of array tomography (AT) relies on the production of arrays of ultrathin sections from resin‐embedded biological samples. The need for correlative light and electron microscopy lies in the intrinsic properties of biological tissues, namely the intricate relationship between the molecular and physical architectures. Fixation, dehydration, and resin embedding are necessary steps in order to visualize biological tissue in electron microscopes. This chapter summarizes the key differences between CAT protocols for circuit tracing and for proteometric analysis. It briefly reviews several AT‐compatible techniques for the collection of ultrathin sections of resin‐embedded tissue. The chapter details imaging procedures for the two modalities: light microscopy and electron microscopy. Finally, it presents an application that demonstrates the power of CAT applied to the analysis of brain circuits.","PeriodicalId":220453,"journal":{"name":"Biological Field Emission Scanning Electron Microscopy","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-02-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128517479","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2019-02-15DOI: 10.1002/9781118663233.CH17
J. Hazekamp, Marjolein van Ruijven
{"title":"Field Emission Scanning Electron Microscopy in Food Research","authors":"J. Hazekamp, Marjolein van Ruijven","doi":"10.1002/9781118663233.CH17","DOIUrl":"https://doi.org/10.1002/9781118663233.CH17","url":null,"abstract":"","PeriodicalId":220453,"journal":{"name":"Biological Field Emission Scanning Electron Microscopy","volume":"50 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-02-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125178813","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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