Pub Date : 1990-05-23DOI: 10.1109/FREQ.1990.177503
L. Spassov, E. Yossifov, D. Yankov, H. Poll, S. Schreiter
The influence of different plasma parameters on the etching rate and the surface profile of monocrystal quartz was studied. Quartz wafers were etched with a high rate (over 0.65 mu m/min) as a result of which thin quartz membranes were formed. On such membranes aluminum electrodes were deposited and resonance systems at 42.950 MHz were obtained. Among other results it is found that the parameters of the plasma process and the construction of the masks ought to be optimized in view of manufacturing membranes whose surface characteristics and plane-parallelism are similar to those of the initial wafers.<>
{"title":"Plasma etching of monocrystal quartz","authors":"L. Spassov, E. Yossifov, D. Yankov, H. Poll, S. Schreiter","doi":"10.1109/FREQ.1990.177503","DOIUrl":"https://doi.org/10.1109/FREQ.1990.177503","url":null,"abstract":"The influence of different plasma parameters on the etching rate and the surface profile of monocrystal quartz was studied. Quartz wafers were etched with a high rate (over 0.65 mu m/min) as a result of which thin quartz membranes were formed. On such membranes aluminum electrodes were deposited and resonance systems at 42.950 MHz were obtained. Among other results it is found that the parameters of the plasma process and the construction of the masks ought to be optimized in view of manufacturing membranes whose surface characteristics and plane-parallelism are similar to those of the initial wafers.<<ETX>>","PeriodicalId":234894,"journal":{"name":"44th Annual Symposium on Frequency Control","volume":"140 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-05-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114658259","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1990-05-23DOI: 10.1109/FREQ.1990.177531
Y.S. Zhou, H. Tiersten
It is shown that the normal acceleration sensitivity of contoured quartz resonators with rectangular supports vanishes when the centers of the mode shape and support rectangle coincide. This result is essentially a consequence of symmetry and applies to many other shapes. Since it is extremely difficult to realize this situation in practice, an analysis of the influence of an offset of the centers on the normal acceleration sensitivity is performed. The biasing deformation is determined by means of a variational approximation procedure using the variational principle with all natural conditions for anisotropic static flexure. The very important accompanying strains which vary quadratically across the thickness are determined recursively. The resulting flexural biasing states are used in the existing perturbation equation along with the equivalent trapped energy mode shapes of the contoured resonators to calculate the normal acceleration sensitivities. It is shown that for small offsets the acceleration sensitivity increases linearly with offsets and orientations for which this effect is minimized.<>
{"title":"On the influence of a fabrication imperfection on the normal acceleration sensitivity of contoured quartz resonators with rectangular supports","authors":"Y.S. Zhou, H. Tiersten","doi":"10.1109/FREQ.1990.177531","DOIUrl":"https://doi.org/10.1109/FREQ.1990.177531","url":null,"abstract":"It is shown that the normal acceleration sensitivity of contoured quartz resonators with rectangular supports vanishes when the centers of the mode shape and support rectangle coincide. This result is essentially a consequence of symmetry and applies to many other shapes. Since it is extremely difficult to realize this situation in practice, an analysis of the influence of an offset of the centers on the normal acceleration sensitivity is performed. The biasing deformation is determined by means of a variational approximation procedure using the variational principle with all natural conditions for anisotropic static flexure. The very important accompanying strains which vary quadratically across the thickness are determined recursively. The resulting flexural biasing states are used in the existing perturbation equation along with the equivalent trapped energy mode shapes of the contoured resonators to calculate the normal acceleration sensitivities. It is shown that for small offsets the acceleration sensitivity increases linearly with offsets and orientations for which this effect is minimized.<<ETX>>","PeriodicalId":234894,"journal":{"name":"44th Annual Symposium on Frequency Control","volume":"86 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-05-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125938043","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1990-05-23DOI: 10.1109/FREQ.1990.177497
P. Morley, R. Williamson
A method which has been developed to measure the force-frequency effect in stress compensated (SC)-cut resonators by the use of a pulsed light beam from an excimer laser which is directed onto the vibrating surface of the device is described. The crystal resonance is maintained by a phase-locked loop with a long time constant, and the phase across the crystal is monitored. The small phase change is measured by the use of a lock-in amplifier which is locked to the repetition rate of the laser. The resulting measurement gives a determination of both the phase and the amplitude of the force-frequency effect. Several devices which have been produced with crystallographic orientations spanning the theoretical value are discussed. These were measured using the laser pulsing method. The frequency modulation is plotted against angle.<>
{"title":"Determination of the optimum orientation of an SC-cut resonator using a pulsed laser","authors":"P. Morley, R. Williamson","doi":"10.1109/FREQ.1990.177497","DOIUrl":"https://doi.org/10.1109/FREQ.1990.177497","url":null,"abstract":"A method which has been developed to measure the force-frequency effect in stress compensated (SC)-cut resonators by the use of a pulsed light beam from an excimer laser which is directed onto the vibrating surface of the device is described. The crystal resonance is maintained by a phase-locked loop with a long time constant, and the phase across the crystal is monitored. The small phase change is measured by the use of a lock-in amplifier which is locked to the repetition rate of the laser. The resulting measurement gives a determination of both the phase and the amplitude of the force-frequency effect. Several devices which have been produced with crystallographic orientations spanning the theoretical value are discussed. These were measured using the laser pulsing method. The frequency modulation is plotted against angle.<<ETX>>","PeriodicalId":234894,"journal":{"name":"44th Annual Symposium on Frequency Control","volume":"60 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-05-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128562757","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1990-05-23DOI: 10.1109/FREQ.1990.177488
D. Allan, D. Davis, J. Levine, M. Weiss, N. Hironaka, D. Okayama
An extremely cost-effective, modest-accuracy method of remotely obtaining time and frequency via a telephone model is demonstrated. This method uses the operation of the National Institute of Standards and Technology's (NIST) Automated Computer Time System (ACTS), which was begun in 1988. Time and frequency dissemination by this service depends on the reciprocity of the telephone system. The round-trip delay is measured by the NIST equipment. The advance of an on-time marker is adjusted so as to arrive at the user's site on time. A frequency calibration method taking advantage of this service, and preliminary tests are discussed. A computer is not required to access this service. All that is required is a telephone modem, a simple peripheral circuit to generator an on time marker and standard time and frequency measurement and data processing equipment.<>
{"title":"New inexpensive frequency calibration service from NIST","authors":"D. Allan, D. Davis, J. Levine, M. Weiss, N. Hironaka, D. Okayama","doi":"10.1109/FREQ.1990.177488","DOIUrl":"https://doi.org/10.1109/FREQ.1990.177488","url":null,"abstract":"An extremely cost-effective, modest-accuracy method of remotely obtaining time and frequency via a telephone model is demonstrated. This method uses the operation of the National Institute of Standards and Technology's (NIST) Automated Computer Time System (ACTS), which was begun in 1988. Time and frequency dissemination by this service depends on the reciprocity of the telephone system. The round-trip delay is measured by the NIST equipment. The advance of an on-time marker is adjusted so as to arrive at the user's site on time. A frequency calibration method taking advantage of this service, and preliminary tests are discussed. A computer is not required to access this service. All that is required is a telephone modem, a simple peripheral circuit to generator an on time marker and standard time and frequency measurement and data processing equipment.<<ETX>>","PeriodicalId":234894,"journal":{"name":"44th Annual Symposium on Frequency Control","volume":"80 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-05-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116282769","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1990-05-23DOI: 10.1109/FREQ.1990.177548
H. Kawashima
Oscillation frequency characteristics in a CMOS oscillating circuit using a coupling quartz crystal resonator are described. A miniaturized GT cut quartz crystal resonator consisting of the vibrational portion and the supporting portions which is formed by an etching method is used. The relationship of the resonator's frequency temperature behavior versus load capacitance (CL) is clarified. The oscillating circuit is shown as an electric equivalent circuit. An amplitude continuation condition and an oscillation condition are theoretically derived. The coupling between both vibrations of a coupling quartz crystal resonator is regarded as a capacitive coupling. From the equivalent circuit of the coupling quartz crystal resonator, an imaginary part is easily calculated. As a result, a frequency equation which is given as a function of CL is readily derived from the oscillation condition and the imaginary part of the coupling resonator. It is shown that by suitably choosing CL, the frequency deviation in this CMOS oscillating circuit is less than 1 p.p.m. over a wide temperature range of -30 degrees C to +70 degrees C without any temperature compensation.<>
{"title":"An analysis of oscillation frequency characteristics in a CMOS oscillating circuit using a coupling quartz crystal resonator","authors":"H. Kawashima","doi":"10.1109/FREQ.1990.177548","DOIUrl":"https://doi.org/10.1109/FREQ.1990.177548","url":null,"abstract":"Oscillation frequency characteristics in a CMOS oscillating circuit using a coupling quartz crystal resonator are described. A miniaturized GT cut quartz crystal resonator consisting of the vibrational portion and the supporting portions which is formed by an etching method is used. The relationship of the resonator's frequency temperature behavior versus load capacitance (CL) is clarified. The oscillating circuit is shown as an electric equivalent circuit. An amplitude continuation condition and an oscillation condition are theoretically derived. The coupling between both vibrations of a coupling quartz crystal resonator is regarded as a capacitive coupling. From the equivalent circuit of the coupling quartz crystal resonator, an imaginary part is easily calculated. As a result, a frequency equation which is given as a function of CL is readily derived from the oscillation condition and the imaginary part of the coupling resonator. It is shown that by suitably choosing CL, the frequency deviation in this CMOS oscillating circuit is less than 1 p.p.m. over a wide temperature range of -30 degrees C to +70 degrees C without any temperature compensation.<<ETX>>","PeriodicalId":234894,"journal":{"name":"44th Annual Symposium on Frequency Control","volume":"78 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-05-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126321239","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1990-05-23DOI: 10.1109/FREQ.1990.177540
G. K. Montress, T. Parker
The design, fabrication, component selection, and performance of extremely low noise surface acoustic wave (SAW) resonator and delay line oscillators, as well as an extremely low noise L-band dielectric resonator (DR) oscillator are described. To illustrate the design procedure, several specific examples are presented. It is shown that the basic feedback-loop oscillator configuration is well suited to high performance oscillator design in the VHF, U HF and microwave frequency ranges, based upon the incorporation of a two-port frequency stabilizing element. State-of-the-art performance is realized for SAW resonator and delay line based oscillators, as well as for a very simple L-band dielectric resonator oscillator design.<>
{"title":"Design techniques for achieving state-of-the-art oscillator performance","authors":"G. K. Montress, T. Parker","doi":"10.1109/FREQ.1990.177540","DOIUrl":"https://doi.org/10.1109/FREQ.1990.177540","url":null,"abstract":"The design, fabrication, component selection, and performance of extremely low noise surface acoustic wave (SAW) resonator and delay line oscillators, as well as an extremely low noise L-band dielectric resonator (DR) oscillator are described. To illustrate the design procedure, several specific examples are presented. It is shown that the basic feedback-loop oscillator configuration is well suited to high performance oscillator design in the VHF, U HF and microwave frequency ranges, based upon the incorporation of a two-port frequency stabilizing element. State-of-the-art performance is realized for SAW resonator and delay line based oscillators, as well as for a very simple L-band dielectric resonator oscillator design.<<ETX>>","PeriodicalId":234894,"journal":{"name":"44th Annual Symposium on Frequency Control","volume":"83 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-05-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126406554","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1990-05-23DOI: 10.1109/FREQ.1990.177487
E.R. Straka, R.W. Sarrica, L. Hansen
The specific application of several analytical total quality control tools is discussed. One example deals with the restructuring of the method of handling cesium beam tube (CBT) work orders. The result is a reduction of manufacturing cycle time as well as a reduction of the total word-in-progress inventory. A corresponding improvement of the CBT performance is observed. The influence of total process control on existing and potential suppliers of CBT parts is discussed.<>
{"title":"Total process control and its implementation in the manufacturing of cesium beam tubes (atomic frequency standard)","authors":"E.R. Straka, R.W. Sarrica, L. Hansen","doi":"10.1109/FREQ.1990.177487","DOIUrl":"https://doi.org/10.1109/FREQ.1990.177487","url":null,"abstract":"The specific application of several analytical total quality control tools is discussed. One example deals with the restructuring of the method of handling cesium beam tube (CBT) work orders. The result is a reduction of manufacturing cycle time as well as a reduction of the total word-in-progress inventory. A corresponding improvement of the CBT performance is observed. The influence of total process control on existing and potential suppliers of CBT parts is discussed.<<ETX>>","PeriodicalId":234894,"journal":{"name":"44th Annual Symposium on Frequency Control","volume":"182 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-05-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122005692","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1990-05-23DOI: 10.1109/FREQ.1990.177551
D. A. Symonds, D. Allen
Improvements made to enhance the performance and to improve the manufacturability of the tactical miniature crystal oscillator (TMXO) are presented. The results of these efforts are described in detail. The TMXO was radiation-hardened to tactical levels. Phase noise was reduced to -125 dBc/Hz at 10 Hz offset, with a floor of -160 dBx/Hz. The lowest structural resonance was increased to 1800 Hz. Numerous manufacturability improvements are described. In addition to a large number of process changes, the package has been improved, the number of thick-film screenings has been reduced from 13 to 2, and the circuit itself as well as circuit components have been changed extensively, both to enhance performance and to simplify assembly and alignment. Principal specifications of the improved TMXO are given.<>
{"title":"An update on the TMXO","authors":"D. A. Symonds, D. Allen","doi":"10.1109/FREQ.1990.177551","DOIUrl":"https://doi.org/10.1109/FREQ.1990.177551","url":null,"abstract":"Improvements made to enhance the performance and to improve the manufacturability of the tactical miniature crystal oscillator (TMXO) are presented. The results of these efforts are described in detail. The TMXO was radiation-hardened to tactical levels. Phase noise was reduced to -125 dBc/Hz at 10 Hz offset, with a floor of -160 dBx/Hz. The lowest structural resonance was increased to 1800 Hz. Numerous manufacturability improvements are described. In addition to a large number of process changes, the package has been improved, the number of thick-film screenings has been reduced from 13 to 2, and the circuit itself as well as circuit components have been changed extensively, both to enhance performance and to simplify assembly and alignment. Principal specifications of the improved TMXO are given.<<ETX>>","PeriodicalId":234894,"journal":{"name":"44th Annual Symposium on Frequency Control","volume":"11 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-05-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130833127","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1990-05-23DOI: 10.1109/FREQ.1990.177485
R.T. Wang, G. Dick
Measurements on a superconducting cavity maser oscillator are presented which show a frequency stability of parts in 10/sup 15/ for times from 1 second to 1000 seconds. A phase noise of approximately -80 dB/f/sup 3/, where f is frequency, is shown. The measured stability at a 1 second interval is 10 times better than that of a hydrogen maser, and phase noise at 8 GHz is more than 20 dB below that of a multiplied quartz crystal oscillator.<>
{"title":"Improved performance of the superconducting cavity maser at short measuring times (atomic frequency standards)","authors":"R.T. Wang, G. Dick","doi":"10.1109/FREQ.1990.177485","DOIUrl":"https://doi.org/10.1109/FREQ.1990.177485","url":null,"abstract":"Measurements on a superconducting cavity maser oscillator are presented which show a frequency stability of parts in 10/sup 15/ for times from 1 second to 1000 seconds. A phase noise of approximately -80 dB/f/sup 3/, where f is frequency, is shown. The measured stability at a 1 second interval is 10 times better than that of a hydrogen maser, and phase noise at 8 GHz is more than 20 dB below that of a multiplied quartz crystal oscillator.<<ETX>>","PeriodicalId":234894,"journal":{"name":"44th Annual Symposium on Frequency Control","volume":"16 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-05-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133793556","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1990-05-23DOI: 10.1109/FREQ.1990.177510
C. Jensik, R. Zellers, R. Lackey
The authors discuss the North American quartz crystal industry. A decline in US factory output of oscillator crystals is described. Two quality programs, the Malcolm Baldrige National Quality Award program and the Supplier Partnership program, are discussed. Key points of both programs are listed. The benefits of quality oriented manufacturing are described.<>
{"title":"A synopsis of quality involvement/improvement programs and the ramifications on our industry","authors":"C. Jensik, R. Zellers, R. Lackey","doi":"10.1109/FREQ.1990.177510","DOIUrl":"https://doi.org/10.1109/FREQ.1990.177510","url":null,"abstract":"The authors discuss the North American quartz crystal industry. A decline in US factory output of oscillator crystals is described. Two quality programs, the Malcolm Baldrige National Quality Award program and the Supplier Partnership program, are discussed. Key points of both programs are listed. The benefits of quality oriented manufacturing are described.<<ETX>>","PeriodicalId":234894,"journal":{"name":"44th Annual Symposium on Frequency Control","volume":"102 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-05-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115920804","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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