The growing dependency of our society on increasingly complex software systems, combining mobile and cloud-based applications and services, makes the test activities even more important and challenging. However, sometimes software tests are not properly performed due to tight deadlines, due to the time and skills required to develop and execute the tests or because the developers are too optimistic about possible faults in their own code. Although there are several frameworks for mobile test automation, they usually require programming skills or complex configuration steps. Hence, in this paper, we propose a framework that allows creating and executing tests for Android applications without requiring programming skills. It is possible to create automated tests based on a set of pre-defined actions and it is also possible to inject data into device sensors. An experiment with programmers and non-programmers showed that both can develop and execute tests with a similar time. A real world example using a fall detection application is presented to illustrate the approach.
{"title":"MT4A: a no-programming test automation framework for Android applications","authors":"Tiago Coelho, B. Lima, J. Faria","doi":"10.1145/2994291.2994300","DOIUrl":"https://doi.org/10.1145/2994291.2994300","url":null,"abstract":"The growing dependency of our society on increasingly complex software systems, combining mobile and cloud-based applications and services, makes the test activities even more important and challenging. However, sometimes software tests are not properly performed due to tight deadlines, due to the time and skills required to develop and execute the tests or because the developers are too optimistic about possible faults in their own code. Although there are several frameworks for mobile test automation, they usually require programming skills or complex configuration steps. Hence, in this paper, we propose a framework that allows creating and executing tests for Android applications without requiring programming skills. It is possible to create automated tests based on a set of pre-defined actions and it is also possible to inject data into device sensors. An experiment with programmers and non-programmers showed that both can develop and execute tests with a similar time. A real world example using a fall detection application is presented to illustrate the approach.","PeriodicalId":255079,"journal":{"name":"Proceedings of the 7th International Workshop on Automating Test Case Design, Selection, and Evaluation","volume":"23 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-11-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116709358","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
This work demonstrates that the use of one criterion for test suite prioritization may lead to high variability of fault detection rates due to random tie-breaking. The paper provides motivational examples of how a single fine-grained or coarse criterion may lead to poor code coverage or fault finding efficiency. We use a multilevel coarse-to-fine-grained two-way prioritization method to address the issues and evaluate the technique in an empirical study by comparing fault finding effectiveness and its variability to single-criterion methods. The results indicate that the proposed method decreases tie-breaking instability of the fault detection rate and often increases the overall performance of test suite prioritization methods.
{"title":"Multilevel coarse-to-fine-grained prioritization for GUI and web applications","authors":"Dmitry Nurmuradov, Renée C. Bryce, Hyunsook Do","doi":"10.1145/2994291.2994292","DOIUrl":"https://doi.org/10.1145/2994291.2994292","url":null,"abstract":"This work demonstrates that the use of one criterion for test suite prioritization may lead to high variability of fault detection rates due to random tie-breaking. The paper provides motivational examples of how a single fine-grained or coarse criterion may lead to poor code coverage or fault finding efficiency. We use a multilevel coarse-to-fine-grained two-way prioritization method to address the issues and evaluate the technique in an empirical study by comparing fault finding effectiveness and its variability to single-criterion methods. The results indicate that the proposed method decreases tie-breaking instability of the fault detection rate and often increases the overall performance of test suite prioritization methods.","PeriodicalId":255079,"journal":{"name":"Proceedings of the 7th International Workshop on Automating Test Case Design, Selection, and Evaluation","volume":"17 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-11-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130017692","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Proceedings of the 7th International Workshop on Automating Test Case Design, Selection, and Evaluation","authors":"","doi":"10.1145/2994291","DOIUrl":"https://doi.org/10.1145/2994291","url":null,"abstract":"","PeriodicalId":255079,"journal":{"name":"Proceedings of the 7th International Workshop on Automating Test Case Design, Selection, and Evaluation","volume":"2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131060744","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
京公网安备 11010802042870号
京ICP备2023020795号-1
扫码关注我们
求助内容：
应助结果提醒方式：