Pub Date : 1900-01-01DOI: 10.1007/978-3-030-81576-9_4
P. Roy, D. Behera, E. Madenci, S. Oterkus
{"title":"Peridynamic Modeling of Thermo-oxidative Degradation in Polymers","authors":"P. Roy, D. Behera, E. Madenci, S. Oterkus","doi":"10.1007/978-3-030-81576-9_4","DOIUrl":"https://doi.org/10.1007/978-3-030-81576-9_4","url":null,"abstract":"","PeriodicalId":269519,"journal":{"name":"Reliability of Organic Compounds in Microelectronics and Optoelectronics","volume":"205 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121235163","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1900-01-01DOI: 10.1007/978-3-030-81576-9_1
F. de Buyl, Shingekatsu Yoshida
{"title":"Degradation Mechanisms of Silicones","authors":"F. de Buyl, Shingekatsu Yoshida","doi":"10.1007/978-3-030-81576-9_1","DOIUrl":"https://doi.org/10.1007/978-3-030-81576-9_1","url":null,"abstract":"","PeriodicalId":269519,"journal":{"name":"Reliability of Organic Compounds in Microelectronics and Optoelectronics","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121674480","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1900-01-01DOI: 10.1007/978-3-030-81576-9_5
N. Iwamoto
{"title":"Molecular Modeling for Reliability Issues","authors":"N. Iwamoto","doi":"10.1007/978-3-030-81576-9_5","DOIUrl":"https://doi.org/10.1007/978-3-030-81576-9_5","url":null,"abstract":"","PeriodicalId":269519,"journal":{"name":"Reliability of Organic Compounds in Microelectronics and Optoelectronics","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128489144","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1900-01-01DOI: 10.1007/978-3-030-81576-9_13
P. Gromala, A. Inamdar, A. Prisacaru, M. Dressler, A. Kabakchiev
{"title":"Degradation and Remaining Useful Life Prediction of Automotive Electronics","authors":"P. Gromala, A. Inamdar, A. Prisacaru, M. Dressler, A. Kabakchiev","doi":"10.1007/978-3-030-81576-9_13","DOIUrl":"https://doi.org/10.1007/978-3-030-81576-9_13","url":null,"abstract":"","PeriodicalId":269519,"journal":{"name":"Reliability of Organic Compounds in Microelectronics and Optoelectronics","volume":"24 5","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"120873999","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1900-01-01DOI: 10.1007/978-3-030-81576-9_7
W. V. van Driel, B. Jacobs, G. Onushkin, P. Watté, X. Zhao, J. Davis
{"title":"Reliability and Failures in Solid State Lighting Systems","authors":"W. V. van Driel, B. Jacobs, G. Onushkin, P. Watté, X. Zhao, J. Davis","doi":"10.1007/978-3-030-81576-9_7","DOIUrl":"https://doi.org/10.1007/978-3-030-81576-9_7","url":null,"abstract":"","PeriodicalId":269519,"journal":{"name":"Reliability of Organic Compounds in Microelectronics and Optoelectronics","volume":"30 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114950431","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1900-01-01DOI: 10.1007/978-3-030-81576-9_14
R. Ross, G. Koopmans
{"title":"Reliability and Degradation of Power Electronic Materials","authors":"R. Ross, G. Koopmans","doi":"10.1007/978-3-030-81576-9_14","DOIUrl":"https://doi.org/10.1007/978-3-030-81576-9_14","url":null,"abstract":"","PeriodicalId":269519,"journal":{"name":"Reliability of Organic Compounds in Microelectronics and Optoelectronics","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124214312","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1900-01-01DOI: 10.1007/978-3-030-81576-9_15
Dao-mao Yang, L. Ernst
{"title":"Degradation of Cure-Induced Stress Levels in Micro-electronics","authors":"Dao-mao Yang, L. Ernst","doi":"10.1007/978-3-030-81576-9_15","DOIUrl":"https://doi.org/10.1007/978-3-030-81576-9_15","url":null,"abstract":"","PeriodicalId":269519,"journal":{"name":"Reliability of Organic Compounds in Microelectronics and Optoelectronics","volume":"112 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130096557","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1900-01-01DOI: 10.1007/978-3-030-81576-9_16
T. Braun, O. Hölck
{"title":"Manufacturing for Reliability of Panel-Level Fan-out Packages","authors":"T. Braun, O. Hölck","doi":"10.1007/978-3-030-81576-9_16","DOIUrl":"https://doi.org/10.1007/978-3-030-81576-9_16","url":null,"abstract":"","PeriodicalId":269519,"journal":{"name":"Reliability of Organic Compounds in Microelectronics and Optoelectronics","volume":"56 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124307573","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1900-01-01DOI: 10.1007/978-3-030-81576-9_2
T. Eggenhuisen, T. Hoeks
{"title":"Degradation Mechanisms of Aromatic Polycarbonate","authors":"T. Eggenhuisen, T. Hoeks","doi":"10.1007/978-3-030-81576-9_2","DOIUrl":"https://doi.org/10.1007/978-3-030-81576-9_2","url":null,"abstract":"","PeriodicalId":269519,"journal":{"name":"Reliability of Organic Compounds in Microelectronics and Optoelectronics","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115664020","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1900-01-01DOI: 10.1007/978-3-030-81576-9_6
M. Ibrahim, Zhou Jing, Jiajie Fan
{"title":"Health Monitoring, Machine Learning, and Digital Twin for LED Degradation Analysis","authors":"M. Ibrahim, Zhou Jing, Jiajie Fan","doi":"10.1007/978-3-030-81576-9_6","DOIUrl":"https://doi.org/10.1007/978-3-030-81576-9_6","url":null,"abstract":"","PeriodicalId":269519,"journal":{"name":"Reliability of Organic Compounds in Microelectronics and Optoelectronics","volume":"28 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117088404","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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