P. Montgomery, S. Marbach, R. Claveau, Florie Ogor, C. Cordier, J. Schiffler, M. Flury
{"title":"Multimodal local spectral/topographic characterization of laser-induced colored stainless steel with coherence scanning interferometry","authors":"P. Montgomery, S. Marbach, R. Claveau, Florie Ogor, C. Cordier, J. Schiffler, M. Flury","doi":"10.1117/12.2673958","DOIUrl":"https://doi.org/10.1117/12.2673958","url":null,"abstract":"","PeriodicalId":347203,"journal":{"name":"Optical Measurement Systems for Industrial Inspection XIII","volume":"55 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-08-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127586423","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Sebastian Haegele, G. Corrielli, M. Hejda, Luc Dümpelmann, Roland A. Terborg, R. Osellame, V. Pruneri
{"title":"Lens-free holographic imager with ultrahigh phase sensitivity and large field-of-view","authors":"Sebastian Haegele, G. Corrielli, M. Hejda, Luc Dümpelmann, Roland A. Terborg, R. Osellame, V. Pruneri","doi":"10.1117/12.2673873","DOIUrl":"https://doi.org/10.1117/12.2673873","url":null,"abstract":"","PeriodicalId":347203,"journal":{"name":"Optical Measurement Systems for Industrial Inspection XIII","volume":"40 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-08-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115473591","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Gas analyzer based on inelastic light scattering and acoustic resonance for fast and accurate Wobbe index measurement","authors":"K. Harr, C. Heffels","doi":"10.1117/12.2673227","DOIUrl":"https://doi.org/10.1117/12.2673227","url":null,"abstract":"","PeriodicalId":347203,"journal":{"name":"Optical Measurement Systems for Industrial Inspection XIII","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-08-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125681002","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Implementation of a new algorithm for resolution enhancement in wavefront sensing-based metrology","authors":"R. Porcar, X. Levecq, Pauline Treimany","doi":"10.1117/12.2673705","DOIUrl":"https://doi.org/10.1117/12.2673705","url":null,"abstract":"","PeriodicalId":347203,"journal":{"name":"Optical Measurement Systems for Industrial Inspection XIII","volume":"8 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-08-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115352674","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Julian Lich, T. Wollmann, R. Kuschmierz, M. Gude, Jürgen W. Czarske
{"title":"Optical sensor for localized damage detection and modal analysis on fast rotating fiber reinforced polymer structures","authors":"Julian Lich, T. Wollmann, R. Kuschmierz, M. Gude, Jürgen W. Czarske","doi":"10.1117/12.2673813","DOIUrl":"https://doi.org/10.1117/12.2673813","url":null,"abstract":"","PeriodicalId":347203,"journal":{"name":"Optical Measurement Systems for Industrial Inspection XIII","volume":"5 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-08-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124662539","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
G. Maconi, G. Zyla, A. Nolvi, D. Ladika, V. Melissinaki, G. Barmparis, M. Farsari, E. Hæggström, I. Kassamakov
{"title":"Super-resolution coherence scanning interferometry with 3D printed micro-optics","authors":"G. Maconi, G. Zyla, A. Nolvi, D. Ladika, V. Melissinaki, G. Barmparis, M. Farsari, E. Hæggström, I. Kassamakov","doi":"10.1117/12.2673418","DOIUrl":"https://doi.org/10.1117/12.2673418","url":null,"abstract":"","PeriodicalId":347203,"journal":{"name":"Optical Measurement Systems for Industrial Inspection XIII","volume":"24 5 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-08-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122823730","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Snapshot 3D profilometry using a RGB polarization camera","authors":"Y. Otani, Yuuki Maeda, N. Hagen","doi":"10.1117/12.2681681","DOIUrl":"https://doi.org/10.1117/12.2681681","url":null,"abstract":"","PeriodicalId":347203,"journal":{"name":"Optical Measurement Systems for Industrial Inspection XIII","volume":"18 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-08-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126875084","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Infrared thermography at low temperature","authors":"J. Vandenrijt, S. Roose, G. Casarosa","doi":"10.1117/12.2675598","DOIUrl":"https://doi.org/10.1117/12.2675598","url":null,"abstract":"","PeriodicalId":347203,"journal":{"name":"Optical Measurement Systems for Industrial Inspection XIII","volume":"685 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-08-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"120846936","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Scanning Phase-Calculation Formula for Surface Profiling of Optical Flat using Fizeau Interferometer","authors":"Hwan Kim, Ju-Seob Jeon, Juncheol Bae, Yangjin Kim","doi":"10.1117/12.2673356","DOIUrl":"https://doi.org/10.1117/12.2673356","url":null,"abstract":"","PeriodicalId":347203,"journal":{"name":"Optical Measurement Systems for Industrial Inspection XIII","volume":"35 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-08-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132354680","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
J. Bae, Minji Hyun, Jin-Who Hong, Youngeun Jeon, Sanghyun Son, Y. Seo, Sang-Sun Ha, Jungwon Kim
{"title":"Optical reflectometry-based high-speed temperature change measurement of silicon wafer surfaces","authors":"J. Bae, Minji Hyun, Jin-Who Hong, Youngeun Jeon, Sanghyun Son, Y. Seo, Sang-Sun Ha, Jungwon Kim","doi":"10.1117/12.2673346","DOIUrl":"https://doi.org/10.1117/12.2673346","url":null,"abstract":"","PeriodicalId":347203,"journal":{"name":"Optical Measurement Systems for Industrial Inspection XIII","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-08-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129309028","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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