Pub Date : 1900-01-01DOI: 10.1007/978-3-319-11265-7_7
Naoki Kawashima, O. Mizuno
{"title":"Predicting Fault-Prone Modules by Word Occurrence in Identifiers","authors":"Naoki Kawashima, O. Mizuno","doi":"10.1007/978-3-319-11265-7_7","DOIUrl":"https://doi.org/10.1007/978-3-319-11265-7_7","url":null,"abstract":"","PeriodicalId":347448,"journal":{"name":"Software Engineering Research, Management and Applications","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130130934","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1900-01-01DOI: 10.1007/978-3-319-11265-7_16
S. Hayakawa, S. Fukui, Y. Iwahori, M. Bhuyan, R. Woodham
{"title":"Object Tracking Method Using PTAMM and Estimated Foreground Regions","authors":"S. Hayakawa, S. Fukui, Y. Iwahori, M. Bhuyan, R. Woodham","doi":"10.1007/978-3-319-11265-7_16","DOIUrl":"https://doi.org/10.1007/978-3-319-11265-7_16","url":null,"abstract":"","PeriodicalId":347448,"journal":{"name":"Software Engineering Research, Management and Applications","volume":"29 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133626503","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1900-01-01DOI: 10.1007/978-3-319-11265-7_1
S. Oikawa
{"title":"Performance Impact of New Interface for Non-volatile Memory Storage","authors":"S. Oikawa","doi":"10.1007/978-3-319-11265-7_1","DOIUrl":"https://doi.org/10.1007/978-3-319-11265-7_1","url":null,"abstract":"","PeriodicalId":347448,"journal":{"name":"Software Engineering Research, Management and Applications","volume":"43 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133590075","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1900-01-01DOI: 10.1007/978-3-319-11265-7_2
Tomohiko Takagi, Mutlu Beyazit
{"title":"Optimized Test Case Generation Based on Operational Profiles with Fault-Proneness Information","authors":"Tomohiko Takagi, Mutlu Beyazit","doi":"10.1007/978-3-319-11265-7_2","DOIUrl":"https://doi.org/10.1007/978-3-319-11265-7_2","url":null,"abstract":"","PeriodicalId":347448,"journal":{"name":"Software Engineering Research, Management and Applications","volume":"47 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134108762","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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