Pub Date : 2019-12-01DOI: 10.1109/icitaet47105.2019.9170142
{"title":"ICITAET 2019 Cover Page","authors":"","doi":"10.1109/icitaet47105.2019.9170142","DOIUrl":"https://doi.org/10.1109/icitaet47105.2019.9170142","url":null,"abstract":"","PeriodicalId":348468,"journal":{"name":"2019 International Conference on Innovative Trends and Advances in Engineering and Technology (ICITAET)","volume":"10 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124821010","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2019-12-01DOI: 10.1109/ICITAET47105.2019.9170146
J. Kumar, P. Arvind, Prashant Singh, Yamini Sarada, Neeraj Kumar, Shivain Bhardwaj
Welding defects arises in welding. The welding material needs appropriate examination for its smooth operation and design. Non – Destructive Inspection is one of the significant methodology for proper recognition of the flaw defect. In the present work, an effort has been made to correctly identify and classify the weld defects. A dataset of 79 images with 08 defects is collected from Mechanical and Industrial Engineering Department of Indian Institute of Technology Roorkee. The image dataset has been pre-processed and the features have been extracted by LBPriu2 and processed by artificial neural network for further classification. The 10 level features have been extracted by LBPriu2 and fed to neural network after Image Segmentation. The features have been analyzed by Feed Forward neural network for classification. A detailed analysis of the different image segmentation methods with LBPriu2 features is analyzed. Irrespective of the poor quality of image dataset, classification accuracy of 89.9% is obtained.
{"title":"LBPriu2 Features for Classification of Radiographic Weld Images","authors":"J. Kumar, P. Arvind, Prashant Singh, Yamini Sarada, Neeraj Kumar, Shivain Bhardwaj","doi":"10.1109/ICITAET47105.2019.9170146","DOIUrl":"https://doi.org/10.1109/ICITAET47105.2019.9170146","url":null,"abstract":"Welding defects arises in welding. The welding material needs appropriate examination for its smooth operation and design. Non – Destructive Inspection is one of the significant methodology for proper recognition of the flaw defect. In the present work, an effort has been made to correctly identify and classify the weld defects. A dataset of 79 images with 08 defects is collected from Mechanical and Industrial Engineering Department of Indian Institute of Technology Roorkee. The image dataset has been pre-processed and the features have been extracted by LBPriu2 and processed by artificial neural network for further classification. The 10 level features have been extracted by LBPriu2 and fed to neural network after Image Segmentation. The features have been analyzed by Feed Forward neural network for classification. A detailed analysis of the different image segmentation methods with LBPriu2 features is analyzed. Irrespective of the poor quality of image dataset, classification accuracy of 89.9% is obtained.","PeriodicalId":348468,"journal":{"name":"2019 International Conference on Innovative Trends and Advances in Engineering and Technology (ICITAET)","volume":"34 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124912871","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2019-12-01DOI: 10.1109/ICITAET47105.2019.9170236
A. Heddallikar, Vinay D. Ghanvat, Kaustubh Sakpal, R. Pinto
Antenna has become the most important component of radars employed for level measurement application. Many industrial applications require the measurement of liquid level inside large tanks or vessels. In a radar-based level sensor, the antenna transmits electromagnetic waves to measure the level inside a tank and is exposed to harsh environment inside the tank. For accurate measurement of level inside a closed environment such as a tank, multipath reflections must be avoided. The transmitted electromagnetic waves may get reflected from the walls of the tank or from any equipment inside the tank leading to the generation of false echoes. Therefore, the antenna parameters have to be optimized to avoid multipath reflections and the risk of false echoes.A prototype X band antenna was designed and tested inside a water tank at SAMEER, IIT Powai campus. In this paper the optimization of this antenna for level sensing application is shown. It was carried out by varying the dimensions of the conical horn. The measurement of return loss and radiation pattern of prototype antenna was done using Vector Network Analyzer (VNA) (Rhode & Schwarz model ZVB14). CST Microwave Studio software was used to perform simulation for the optimization of antenna parameters.
{"title":"Optimization of X-band Conical Horn Antenna for Level Sensing Application","authors":"A. Heddallikar, Vinay D. Ghanvat, Kaustubh Sakpal, R. Pinto","doi":"10.1109/ICITAET47105.2019.9170236","DOIUrl":"https://doi.org/10.1109/ICITAET47105.2019.9170236","url":null,"abstract":"Antenna has become the most important component of radars employed for level measurement application. Many industrial applications require the measurement of liquid level inside large tanks or vessels. In a radar-based level sensor, the antenna transmits electromagnetic waves to measure the level inside a tank and is exposed to harsh environment inside the tank. For accurate measurement of level inside a closed environment such as a tank, multipath reflections must be avoided. The transmitted electromagnetic waves may get reflected from the walls of the tank or from any equipment inside the tank leading to the generation of false echoes. Therefore, the antenna parameters have to be optimized to avoid multipath reflections and the risk of false echoes.A prototype X band antenna was designed and tested inside a water tank at SAMEER, IIT Powai campus. In this paper the optimization of this antenna for level sensing application is shown. It was carried out by varying the dimensions of the conical horn. The measurement of return loss and radiation pattern of prototype antenna was done using Vector Network Analyzer (VNA) (Rhode & Schwarz model ZVB14). CST Microwave Studio software was used to perform simulation for the optimization of antenna parameters.","PeriodicalId":348468,"journal":{"name":"2019 International Conference on Innovative Trends and Advances in Engineering and Technology (ICITAET)","volume":"162 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126073685","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2019-12-01DOI: 10.1109/icitaet47105.2019.9170230
{"title":"ICITAET 2019 Acknowledgement","authors":"","doi":"10.1109/icitaet47105.2019.9170230","DOIUrl":"https://doi.org/10.1109/icitaet47105.2019.9170230","url":null,"abstract":"","PeriodicalId":348468,"journal":{"name":"2019 International Conference on Innovative Trends and Advances in Engineering and Technology (ICITAET)","volume":"6 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115329643","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2019-12-01DOI: 10.1109/ICITAET47105.2019.9170233
S. T. Warpe, R. S. Pippal
Agricultural sector is most important in India because it is still largest contributor sector in Indian GDP. With increasing population, demand of food is also inflated. To make this possible, farmers are using fertilizers to improve their yield. Nitrogen (N), Phosphorous (P) and Potassium (K) are the most restraining factors in crop production whereas too much use of fertilizers has depleted the quality of the soil as well as present nutrients in it. So there is a requirement of the system which could balance fertilizer amount as per type of crop. In this paper, the implemented system provides a mechanism for distribution of required fertilizer for crop cultivation in the field. For optimization, Wireless Sensor Network provides a very efficient solution for fertilizer distribution using Newton Forward Difference (NFD) method.
{"title":"Automated Intensification of Fertilizer Distribution in Agriculture Using Wireless Sensor Network","authors":"S. T. Warpe, R. S. Pippal","doi":"10.1109/ICITAET47105.2019.9170233","DOIUrl":"https://doi.org/10.1109/ICITAET47105.2019.9170233","url":null,"abstract":"Agricultural sector is most important in India because it is still largest contributor sector in Indian GDP. With increasing population, demand of food is also inflated. To make this possible, farmers are using fertilizers to improve their yield. Nitrogen (N), Phosphorous (P) and Potassium (K) are the most restraining factors in crop production whereas too much use of fertilizers has depleted the quality of the soil as well as present nutrients in it. So there is a requirement of the system which could balance fertilizer amount as per type of crop. In this paper, the implemented system provides a mechanism for distribution of required fertilizer for crop cultivation in the field. For optimization, Wireless Sensor Network provides a very efficient solution for fertilizer distribution using Newton Forward Difference (NFD) method.","PeriodicalId":348468,"journal":{"name":"2019 International Conference on Innovative Trends and Advances in Engineering and Technology (ICITAET)","volume":"6 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123800028","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2019-12-01DOI: 10.1109/ICITAET47105.2019.9170224
J. Khan, R. Dalu
Lean manufacturing is a people’s driven activity hence people’s factors play an important role in success of lean implementation. Most of the organizations are facing the challenges in the implementation of lean manufacturing. Majority of these challenges are organizational culture, commitment of the management, employees training and some technical issues. These challenges are main obstacle in the path of the lean implementation. To overcome such challenges, some important factors those play important role in the lean manufacturing process must be considered and their correlations must be examine critically. The main objective of this research paper is to critically examine the important factors affecting the success of lean Implementation in plastic pipe manufacturing industries.
{"title":"Determination of important parameters in lean Implementation in plastic pipe industries by Factor analysis","authors":"J. Khan, R. Dalu","doi":"10.1109/ICITAET47105.2019.9170224","DOIUrl":"https://doi.org/10.1109/ICITAET47105.2019.9170224","url":null,"abstract":"Lean manufacturing is a people’s driven activity hence people’s factors play an important role in success of lean implementation. Most of the organizations are facing the challenges in the implementation of lean manufacturing. Majority of these challenges are organizational culture, commitment of the management, employees training and some technical issues. These challenges are main obstacle in the path of the lean implementation. To overcome such challenges, some important factors those play important role in the lean manufacturing process must be considered and their correlations must be examine critically. The main objective of this research paper is to critically examine the important factors affecting the success of lean Implementation in plastic pipe manufacturing industries.","PeriodicalId":348468,"journal":{"name":"2019 International Conference on Innovative Trends and Advances in Engineering and Technology (ICITAET)","volume":"21 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124224063","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2019-12-01DOI: 10.1109/ICITAET47105.2019.9170231
Deepika Bairagi
In proximal support vector machine (PSVM), datapoints are assigned to classes by measuring the proximity of it from the two parallel hyperplanes. The hyperplanes are formed such that each of the two parallel hyperplanes is closest to only one of the datasets out of two datasets and the two parallel hyperplanes should be as far as possible from each other. The benefit of PSVM is that it demands less training time as the size of the training patterns increases and less computational complexity as compared to standard SVM. In this paper, an improved version of proximal support vector machine (PSVM) is proposed for pattern classification of binary datasets. In the proposed PSVM technique, the weight vector is modified based on least mean square (LMS) algorithm, which reduces the training classification error. The idea behind the proposed technique is to enlarge the separating boundary, such that the data points of each class lie on the correct side of the hyperplane and the separability between the datasets is increased. The performance of the proposed method is evaluated on several benchmark datasets for both linear and nonlinear classifiers. Experimental results show that the proposed LMS based proximal support vector machine (LMS-PSVM) classifier performs better compared to standard SVM and PSVM.
{"title":"Proximal Support Vector Machine Classifier based on LMS Algorithm","authors":"Deepika Bairagi","doi":"10.1109/ICITAET47105.2019.9170231","DOIUrl":"https://doi.org/10.1109/ICITAET47105.2019.9170231","url":null,"abstract":"In proximal support vector machine (PSVM), datapoints are assigned to classes by measuring the proximity of it from the two parallel hyperplanes. The hyperplanes are formed such that each of the two parallel hyperplanes is closest to only one of the datasets out of two datasets and the two parallel hyperplanes should be as far as possible from each other. The benefit of PSVM is that it demands less training time as the size of the training patterns increases and less computational complexity as compared to standard SVM. In this paper, an improved version of proximal support vector machine (PSVM) is proposed for pattern classification of binary datasets. In the proposed PSVM technique, the weight vector is modified based on least mean square (LMS) algorithm, which reduces the training classification error. The idea behind the proposed technique is to enlarge the separating boundary, such that the data points of each class lie on the correct side of the hyperplane and the separability between the datasets is increased. The performance of the proposed method is evaluated on several benchmark datasets for both linear and nonlinear classifiers. Experimental results show that the proposed LMS based proximal support vector machine (LMS-PSVM) classifier performs better compared to standard SVM and PSVM.","PeriodicalId":348468,"journal":{"name":"2019 International Conference on Innovative Trends and Advances in Engineering and Technology (ICITAET)","volume":"16 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128156838","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2019-12-01DOI: 10.1109/icitaet47105.2019.9170137
About Ssgmce, Shri Sant Gajanan Maharaj
Shri Sant Gajanan Maharaj College of Engineering, Shegaon (SSGMCE), one of the premier institutes in the field of engineering, was established in 1983 by Shri Gajanan Shikshan Sanstha, Shegaon. It is affiliated to Sant Gadge Baba Amravati University, Amravati, recognized by AICTE, New Delhi and approved by DTE, Maharashtra State, Mumbai. SSGMCE has the recognition of being the re-accredited institute by NAAC, Bangalore and the courses are also accredited by NBA (5 times), AICTE, New Delhi. The Institute was selected as the Network Institute under NPIU’s TEQIP, MHRD, Govt. of India under Phase-I. SSGMCE is honoured with Dewang Mehta National EDUCATION LEADERSHIP AWARD – 2015 & 2016, CII-GRATITUDE AWARD, Nov. 2016 and honoured as Management College of the Year 2016 by Higher Education Review Magazine, Nov. 2016. Career360 Magazine, April 2017 ranked the institute as “AAA”,
shi Sant Gajanan Maharaj工程学院，Shegaon (SSGMCE)是工程领域的主要机构之一，由shi Gajanan Shikshan Sanstha, Shegaon成立于1983年。它隶属于Amravati的Sant Gadge Baba Amravati大学，由新德里AICTE认可，并由孟买马哈拉施特拉邦DTE批准。SSGMCE已被NAAC，班加罗尔认可为再认证机构，课程也被NBA(5次)，AICTE，新德里认证。在第一阶段，该研究所被选为NPIU TEQIP，印度政府MHRD的网络研究所。学院荣获2015、2016年度德旺梅塔全国教育领袖奖、2016年11月cii -感恩奖，并于2016年11月被《高等教育评论》杂志评为2016年度管理学院。2017年4月，Career360杂志将该学院评为“AAA”级;
{"title":"About SSGMCE","authors":"About Ssgmce, Shri Sant Gajanan Maharaj","doi":"10.1109/icitaet47105.2019.9170137","DOIUrl":"https://doi.org/10.1109/icitaet47105.2019.9170137","url":null,"abstract":"Shri Sant Gajanan Maharaj College of Engineering, Shegaon (SSGMCE), one of the premier institutes in the field of engineering, was established in 1983 by Shri Gajanan Shikshan Sanstha, Shegaon. It is affiliated to Sant Gadge Baba Amravati University, Amravati, recognized by AICTE, New Delhi and approved by DTE, Maharashtra State, Mumbai. SSGMCE has the recognition of being the re-accredited institute by NAAC, Bangalore and the courses are also accredited by NBA (5 times), AICTE, New Delhi. The Institute was selected as the Network Institute under NPIU’s TEQIP, MHRD, Govt. of India under Phase-I. SSGMCE is honoured with Dewang Mehta National EDUCATION LEADERSHIP AWARD – 2015 & 2016, CII-GRATITUDE AWARD, Nov. 2016 and honoured as Management College of the Year 2016 by Higher Education Review Magazine, Nov. 2016. Career360 Magazine, April 2017 ranked the institute as “AAA”,","PeriodicalId":348468,"journal":{"name":"2019 International Conference on Innovative Trends and Advances in Engineering and Technology (ICITAET)","volume":"31 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130052854","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2019-12-01DOI: 10.1109/ICITAET47105.2019.9170237
Manoj Sonune, V. Pawar, Preetam Kolte, Neha Dumne, S. Sayyed
Analog included circuit layout has reached to a sophisticated level of circuit pattern by means of blending of analog and digital features on single chip. Merging both the capabilities on the identical chip has led to the better aspect densities in conjunction with the need of smaller tool geometries, which in turn require low voltage and low strength operation of the devices. Traditionally analog circuits dominated through the voltage-mode circuits get severely stricken by the discount in electricity supply voltages. In modern-day mode circuits, the signals are represented with the aid of owing of the currents in branches so the performance of the contemporary-mode circuits are less affected whilst power deliver is reduced in comparison to their counterparts. An important constructing block of cutting-edge-mode circuit is current remarks operational amplifier. The utilization of cutting-edge grievance operation amps (CFB operation amps) relies upon at the utilization of a semiconductor procedure with integral gadget structures for class AB activity of the info and yield ranges. Thus, CMOS innovation is an plain applicant. Nonetheless, enterprise CFB operation amps are altogether mentioned in bipolar forms. In this paper we recognize a part of the issues indented with using low electricity CMOS innovation to CFB operation amps. Issues introduced approximately via the low system trans-conductance and via the non-attendance of coordinating between P-channel and N-channel transistors are inspected, and circuit preparations giving advanced data attributes are introduced. Likewise, issues denoted with the possible yield low voltage swing are inspected and circuits which might be utilized to perform a near rail to rail yield swing are proposed. It is presumed that easy interpretations of bipolar circuit plans yield a fairly negative or low exhibition contrasted with the bipolar structures, however CMOS has a potential for CFB operation amp plan if an increasing number of astute circuit arrangements are carried out. the use of current criticism operation amps (CFB operation amps) depends on the usage of a semiconductor procedure with critical device structures for class AB interest of the information and yield stages.[1] CMOS innovation is an undeniable applicant. Nonetheless, commercial enterprise CFB operation amps are altogether mentioned in bipolar forms. In this paper we understand a portion of the issues denoted with the usage of low energy CMOS innovation to CFB operation amps. Issues added approximately through the low machine trans-conductance and by the non-attendance of coordinating among P-channel and N-channel transistors are inspected, and circuit preparations giving improved info attributes are introduced. Likewise, troubles identified with the possible yield low voltage swing are inspected and circuits which is probably applied to accomplish a close to rail to rail yield swing are proposed. It is presumed that easy interpretations of bip
{"title":"Current Feedback Low Voltage Operational Amplifiers","authors":"Manoj Sonune, V. Pawar, Preetam Kolte, Neha Dumne, S. Sayyed","doi":"10.1109/ICITAET47105.2019.9170237","DOIUrl":"https://doi.org/10.1109/ICITAET47105.2019.9170237","url":null,"abstract":"Analog included circuit layout has reached to a sophisticated level of circuit pattern by means of blending of analog and digital features on single chip. Merging both the capabilities on the identical chip has led to the better aspect densities in conjunction with the need of smaller tool geometries, which in turn require low voltage and low strength operation of the devices. Traditionally analog circuits dominated through the voltage-mode circuits get severely stricken by the discount in electricity supply voltages. In modern-day mode circuits, the signals are represented with the aid of owing of the currents in branches so the performance of the contemporary-mode circuits are less affected whilst power deliver is reduced in comparison to their counterparts. An important constructing block of cutting-edge-mode circuit is current remarks operational amplifier. The utilization of cutting-edge grievance operation amps (CFB operation amps) relies upon at the utilization of a semiconductor procedure with integral gadget structures for class AB activity of the info and yield ranges. Thus, CMOS innovation is an plain applicant. Nonetheless, enterprise CFB operation amps are altogether mentioned in bipolar forms. In this paper we recognize a part of the issues indented with using low electricity CMOS innovation to CFB operation amps. Issues introduced approximately via the low system trans-conductance and via the non-attendance of coordinating between P-channel and N-channel transistors are inspected, and circuit preparations giving advanced data attributes are introduced. Likewise, issues denoted with the possible yield low voltage swing are inspected and circuits which might be utilized to perform a near rail to rail yield swing are proposed. It is presumed that easy interpretations of bipolar circuit plans yield a fairly negative or low exhibition contrasted with the bipolar structures, however CMOS has a potential for CFB operation amp plan if an increasing number of astute circuit arrangements are carried out. the use of current criticism operation amps (CFB operation amps) depends on the usage of a semiconductor procedure with critical device structures for class AB interest of the information and yield stages.[1] CMOS innovation is an undeniable applicant. Nonetheless, commercial enterprise CFB operation amps are altogether mentioned in bipolar forms. In this paper we understand a portion of the issues denoted with the usage of low energy CMOS innovation to CFB operation amps. Issues added approximately through the low machine trans-conductance and by the non-attendance of coordinating among P-channel and N-channel transistors are inspected, and circuit preparations giving improved info attributes are introduced. Likewise, troubles identified with the possible yield low voltage swing are inspected and circuits which is probably applied to accomplish a close to rail to rail yield swing are proposed. It is presumed that easy interpretations of bip","PeriodicalId":348468,"journal":{"name":"2019 International Conference on Innovative Trends and Advances in Engineering and Technology (ICITAET)","volume":"30 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133699393","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2019-12-01DOI: 10.1109/icitaet47105.2019.9170248
{"title":"ICITAET 2019 Advisory, Technical and Organizing Program Committee","authors":"","doi":"10.1109/icitaet47105.2019.9170248","DOIUrl":"https://doi.org/10.1109/icitaet47105.2019.9170248","url":null,"abstract":"","PeriodicalId":348468,"journal":{"name":"2019 International Conference on Innovative Trends and Advances in Engineering and Technology (ICITAET)","volume":"2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128233468","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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