These proceedings are a cross-platform medium that allows Windows and Mac users to share the same directory structure and access a common set of files. To navigate these proceedings, a graphical web browser is required. The full-text content on this disk is in Adobe PDF format. A version of Adobe Acrobat Reader is required to view the content. Please be sure you have the latest version and updates of Adobe Acrobat Reader installed.
这些论文集是一种跨平台媒介,允许 Windows 和 Mac 用户共享相同的目录结构并访问一组共同的文件。要浏览这些论文集,需要使用图形网络浏览器。本磁盘上的全文内容为 Adobe PDF 格式。浏览这些内容需要安装 Adobe Acrobat Reader。请确保您已安装最新版本和更新的 Adobe Acrobat Reader。
{"title":"Copyright page","authors":"","doi":"10.1109/DISCS.2014.2","DOIUrl":"https://doi.org/10.1109/DISCS.2014.2","url":null,"abstract":"These proceedings are a cross-platform medium that allows Windows and Mac users to share the same directory structure and access a common set of files. To navigate these proceedings, a graphical web browser is required. The full-text content on this disk is in Adobe PDF format. A version of Adobe Acrobat Reader is required to view the content. Please be sure you have the latest version and updates of Adobe Acrobat Reader installed.","PeriodicalId":363131,"journal":{"name":"2010 ACM/IEEE International Symposium on Low-Power Electronics and Design (ISLPED)","volume":"11 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-09-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127257644","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Power dissipation has become a critical issue in modern chip multiprocessors (CMPs). Managing the leakage power of their L2 caches is particularly important in realizing low-power CMPs because most CMPs employ large L2 caches to hide the performance gap between processors and an off-chip memory while leakage power becomes a major portion in the total power dissipation of CMPs as process technology advances below 90 nm. We propose a replication-aware leakage management technique that selectively turns off a replicated block in a private L2 cache for leakage power reduction. Once a cache line is turned off, the data is lost, but its tag maintains the coherence state. The cost of an extra cache miss due to the turned-off replication is limited since the data of the cache line exists in another on-chip cache. Furthermore, the replicated block incurs no overhead if it is invalidated by other processors in order to maintain cache coherence. Our proposed technique can be implemented by slightly modifying the MESI protocol with a new turned-off shared coherence state. This state indicates that the corresponding block is shared by other caches but turned off. Experiments on a 4 processor CMP with private L2 caches show that the proposed technique reduces the energy consumption of the L2 caches and main memory by 20.0% on average without introducing significant performance loss over the existing cache leakage management technique.
{"title":"Replication-aware leakage management in chip multiprocessors with private L2 caches","authors":"Hyunhee Kim, Jung Ho Ahn, Jihong Kim","doi":"10.1145/1840845.1840874","DOIUrl":"https://doi.org/10.1145/1840845.1840874","url":null,"abstract":"Power dissipation has become a critical issue in modern chip multiprocessors (CMPs). Managing the leakage power of their L2 caches is particularly important in realizing low-power CMPs because most CMPs employ large L2 caches to hide the performance gap between processors and an off-chip memory while leakage power becomes a major portion in the total power dissipation of CMPs as process technology advances below 90 nm. We propose a replication-aware leakage management technique that selectively turns off a replicated block in a private L2 cache for leakage power reduction. Once a cache line is turned off, the data is lost, but its tag maintains the coherence state. The cost of an extra cache miss due to the turned-off replication is limited since the data of the cache line exists in another on-chip cache. Furthermore, the replicated block incurs no overhead if it is invalidated by other processors in order to maintain cache coherence. Our proposed technique can be implemented by slightly modifying the MESI protocol with a new turned-off shared coherence state. This state indicates that the corresponding block is shared by other caches but turned off. Experiments on a 4 processor CMP with private L2 caches show that the proposed technique reduces the energy consumption of the L2 caches and main memory by 20.0% on average without introducing significant performance loss over the existing cache leakage management technique.","PeriodicalId":363131,"journal":{"name":"2010 ACM/IEEE International Symposium on Low-Power Electronics and Design (ISLPED)","volume":"82 15","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-08-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"120807664","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
We have developed a system architecture, measuring and modeling techniques, and algorithms for on-line power and energy optimization and thermal management. The starting point for our approach is a simple and small gate-level network that can be used for real-time and low overhead measurement of temperature on chip positions where our network gates are placed. We use linear programming and interpolation to calculate the temperature at any arbitrary point of the integrated circuit. The periodic calculations of the temperature are used to estimate locally dissipated energies, which are consequently used to derive the most efficient use of operational times to minimize the overall leakage energy. All concepts and algorithms are experimentally validated using a simulation platform that consists of the Alpha 21364 processor and the SPEC benchmarks.
{"title":"Leakage minimization using self sensing and thermal management","authors":"A. Vahdatpour, M. Potkonjak","doi":"10.1145/1840845.1840900","DOIUrl":"https://doi.org/10.1145/1840845.1840900","url":null,"abstract":"We have developed a system architecture, measuring and modeling techniques, and algorithms for on-line power and energy optimization and thermal management. The starting point for our approach is a simple and small gate-level network that can be used for real-time and low overhead measurement of temperature on chip positions where our network gates are placed. We use linear programming and interpolation to calculate the temperature at any arbitrary point of the integrated circuit. The periodic calculations of the temperature are used to estimate locally dissipated energies, which are consequently used to derive the most efficient use of operational times to minimize the overall leakage energy. All concepts and algorithms are experimentally validated using a simulation platform that consists of the Alpha 21364 processor and the SPEC benchmarks.","PeriodicalId":363131,"journal":{"name":"2010 ACM/IEEE International Symposium on Low-Power Electronics and Design (ISLPED)","volume":"31 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-08-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127465358","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
S. K. Kumar, S. Kaundinya, Subhadip Kundu, S. Chattopadhyay
In this paper we present a method to identify don't care locations in a fully specified set of vectors, considering both fault propagation path and fault activation path. We exploit the identified X bits to convert the original vector to low power vector by dictionary based approach to minimize both dynamic and runtime leakage power. The dynamic power as well as the runtime leakage power depends on the activity in the circuit and hence depends on the sequence in which the test vectors are fed to it. We present an approach based on Particle Swarm Optimization (PSO) for vector reordering. Experiments on ISCAS89 benchmark circuits validate the effectiveness of our work. We achieve a maximum of 86.63% at an average of 60.89% reduction in dynamic power, a maximum of 6.87% at an average of 5.28% savings in terms of leakage power and a maximum of 66.55% at an average of 50.11% savings in terms of total power with respect to the original compacted test set generated by Tetramax ATPG tool.
{"title":"Customizing pattern set for test power reduction via improved X-identification and reordering","authors":"S. K. Kumar, S. Kaundinya, Subhadip Kundu, S. Chattopadhyay","doi":"10.1145/1840845.1840881","DOIUrl":"https://doi.org/10.1145/1840845.1840881","url":null,"abstract":"In this paper we present a method to identify don't care locations in a fully specified set of vectors, considering both fault propagation path and fault activation path. We exploit the identified X bits to convert the original vector to low power vector by dictionary based approach to minimize both dynamic and runtime leakage power. The dynamic power as well as the runtime leakage power depends on the activity in the circuit and hence depends on the sequence in which the test vectors are fed to it. We present an approach based on Particle Swarm Optimization (PSO) for vector reordering. Experiments on ISCAS89 benchmark circuits validate the effectiveness of our work. We achieve a maximum of 86.63% at an average of 60.89% reduction in dynamic power, a maximum of 6.87% at an average of 5.28% savings in terms of leakage power and a maximum of 66.55% at an average of 50.11% savings in terms of total power with respect to the original compacted test set generated by Tetramax ATPG tool.","PeriodicalId":363131,"journal":{"name":"2010 ACM/IEEE International Symposium on Low-Power Electronics and Design (ISLPED)","volume":"82 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-08-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115028479","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Shrikanth Ganapathy, R. Canal, Antonio González, A. Rubio
Estimation of static and dynamic energy of caches is critical for high-performance low-power designs. Commercial CAD tools performing energy estimation statically are not aware of the changing operating and environmental conditions which makes the problem of energy estimation more dynamic in nature. It is worsened by process induced variations of low level parameters like threshold voltage and channel length. In this paper we present MODEST, a proposal for estimating the static and dynamic energy of caches taking into account spatial variations of physical parameters, temporal changes of supply voltage and environmental factors like temperature. It can be used to estimate the energy of different blocks of a cache based on a combination empirical data and analytical equations. The observed maximum and median error between MODEST and HSPICE energy-estimates for 22,500 samples is around 7.8% and 0.5% respectively. As a case study, using MODEST, we propose a two step iterative optimization procedure involving Dual-Vth assignment and standby supply voltage minimization for reclaiming energy-constrained caches. The observed energy reduction is around 50.8% for the most-leaky Cache. A speed-up of 750X over conventional hard-coded implementation for such optimizations is achieved.
{"title":"MODEST: A model for energy estimation under spatio-temporal variability","authors":"Shrikanth Ganapathy, R. Canal, Antonio González, A. Rubio","doi":"10.1145/1840845.1840873","DOIUrl":"https://doi.org/10.1145/1840845.1840873","url":null,"abstract":"Estimation of static and dynamic energy of caches is critical for high-performance low-power designs. Commercial CAD tools performing energy estimation statically are not aware of the changing operating and environmental conditions which makes the problem of energy estimation more dynamic in nature. It is worsened by process induced variations of low level parameters like threshold voltage and channel length. In this paper we present MODEST, a proposal for estimating the static and dynamic energy of caches taking into account spatial variations of physical parameters, temporal changes of supply voltage and environmental factors like temperature. It can be used to estimate the energy of different blocks of a cache based on a combination empirical data and analytical equations. The observed maximum and median error between MODEST and HSPICE energy-estimates for 22,500 samples is around 7.8% and 0.5% respectively. As a case study, using MODEST, we propose a two step iterative optimization procedure involving Dual-Vth assignment and standby supply voltage minimization for reclaiming energy-constrained caches. The observed energy reduction is around 50.8% for the most-leaky Cache. A speed-up of 750X over conventional hard-coded implementation for such optimizations is achieved.","PeriodicalId":363131,"journal":{"name":"2010 ACM/IEEE International Symposium on Low-Power Electronics and Design (ISLPED)","volume":"2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-08-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116871587","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Application-specific instruction set processor (ASIP) has become a promising platform for embedded system design in the past decade. Traditional custom instruction synthesis flows for ASIPs mainly target performance improvement. Other design metrics are not addressed appropriately. In this paper, we show that the existing custom instruction exploration algorithms and cost estimation methods for performance improvement only are not suitable for other important design objectives, such as increasing energy efficiency and reducing area overhead. We propose a holistic ASIP design flow that can be adapted to optimize performance, energy consumption, or area. We formulate the design space exploration problem into an operation scheduling process. Different algorithms are employed to find the corresponding best custom instruction set efficiently.
专用指令集处理器(Application-specific instruction set processor, ASIP)是近十年来嵌入式系统设计中一个很有前途的平台。传统的自定义指令合成流主要以性能改进为目标。其他设计指标没有得到适当的处理。在本文中,我们证明了现有的自定义指令探索算法和成本估计方法仅用于性能改进,不适合其他重要的设计目标,如提高能源效率和减少面积开销。我们提出了一个整体的ASIP设计流程,可以适应优化性能,能耗,或面积。我们将设计空间探索问题转化为一个作业调度过程。采用不同的算法有效地找到相应的最佳自定义指令集。
{"title":"Exploring custom instruction synthesis for application-specific instruction set processors with multiple design objectives","authors":"Hai Lin, Yunsi Fei","doi":"10.1145/1840845.1840875","DOIUrl":"https://doi.org/10.1145/1840845.1840875","url":null,"abstract":"Application-specific instruction set processor (ASIP) has become a promising platform for embedded system design in the past decade. Traditional custom instruction synthesis flows for ASIPs mainly target performance improvement. Other design metrics are not addressed appropriately. In this paper, we show that the existing custom instruction exploration algorithms and cost estimation methods for performance improvement only are not suitable for other important design objectives, such as increasing energy efficiency and reducing area overhead. We propose a holistic ASIP design flow that can be adapted to optimize performance, energy consumption, or area. We formulate the design space exploration problem into an operation scheduling process. Different algorithms are employed to find the corresponding best custom instruction set efficiently.","PeriodicalId":363131,"journal":{"name":"2010 ACM/IEEE International Symposium on Low-Power Electronics and Design (ISLPED)","volume":"14 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-08-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129410336","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Scaling process technology necessitates the introduction of wide design-time guard bands that ensure lifetime reliability as circuits wear out over time. In this paper, we show how to utilize this knowledge of the guard band and a predictive model to absolutely improve processor power consumption and lifetime without impacting the processor performance against Negative Bias Temperature Instability (NBTI) degradation. For the first time, we evaluate the long-term potential and impact of NBTI-aware job-to-core mapping quantitatively and account for process variations in the system. Our approach saves up to 16% of the dynamic energy consumed and improve lifetime by two years.
{"title":"NBTI-aware DVFS: A new approach to saving energy and increasing processor lifetime","authors":"M. Basoglu, M. Orshansky, M. Erez","doi":"10.1145/1840845.1840898","DOIUrl":"https://doi.org/10.1145/1840845.1840898","url":null,"abstract":"Scaling process technology necessitates the introduction of wide design-time guard bands that ensure lifetime reliability as circuits wear out over time. In this paper, we show how to utilize this knowledge of the guard band and a predictive model to absolutely improve processor power consumption and lifetime without impacting the processor performance against Negative Bias Temperature Instability (NBTI) degradation. For the first time, we evaluate the long-term potential and impact of NBTI-aware job-to-core mapping quantitatively and account for process variations in the system. Our approach saves up to 16% of the dynamic energy consumed and improve lifetime by two years.","PeriodicalId":363131,"journal":{"name":"2010 ACM/IEEE International Symposium on Low-Power Electronics and Design (ISLPED)","volume":"22 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-08-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128245341","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
A power gating circuit suffers from large amount of rush current when it wakes up, especially when all switch cells are turned on at the same time. If each switch cell is turned on in different instant of time, the rush current can be reduced. It is shown in this paper that the rush current can be reduced even more if signal transition time (or signal slew) to each switch cell is adjusted. The wakeup synthesis that we define is to determine the turn-on time and signal slew of each switch cell; the goal is to minimize wakeup delay while rush current is kept below the maximum value that is allowed. The corresponding synthesis algorithm is proposed. The determined turn-on time and signal slew are implemented using a buffered tree, where a source is a wakeup signal and sinks are multiple switch cells; the synthesis algorithm to generate the tree is proposed. The wakeup synthesis and buffered tree construction are integrated into a design flow that receives a netlist of power gating circuit as an input and produces a layout of netlist with wakeup network embedded. Experiments in an industrial 1.1 V, 45-nm technology demonstrate that the wakeup delay is reduced by 43% on average of example circuits compared with 2-pass turn-on, which is widely used.
{"title":"Wakeup synthesis and its buffered tree construction for power gating circuit designs","authors":"Seungwhun Paik, Sangmin Kim, Youngsoo Shin","doi":"10.1145/1840845.1840936","DOIUrl":"https://doi.org/10.1145/1840845.1840936","url":null,"abstract":"A power gating circuit suffers from large amount of rush current when it wakes up, especially when all switch cells are turned on at the same time. If each switch cell is turned on in different instant of time, the rush current can be reduced. It is shown in this paper that the rush current can be reduced even more if signal transition time (or signal slew) to each switch cell is adjusted. The wakeup synthesis that we define is to determine the turn-on time and signal slew of each switch cell; the goal is to minimize wakeup delay while rush current is kept below the maximum value that is allowed. The corresponding synthesis algorithm is proposed. The determined turn-on time and signal slew are implemented using a buffered tree, where a source is a wakeup signal and sinks are multiple switch cells; the synthesis algorithm to generate the tree is proposed. The wakeup synthesis and buffered tree construction are integrated into a design flow that receives a netlist of power gating circuit as an input and produces a layout of netlist with wakeup network embedded. Experiments in an industrial 1.1 V, 45-nm technology demonstrate that the wakeup delay is reduced by 43% on average of example circuits compared with 2-pass turn-on, which is widely used.","PeriodicalId":363131,"journal":{"name":"2010 ACM/IEEE International Symposium on Low-Power Electronics and Design (ISLPED)","volume":"2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-08-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128742204","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
An in-situ power monitoring technique for Dynamic Voltage and Threshold scaling (DVTS) systems is proposed which measures total power consumed by load circuit using sleep transistor acting as power sensor. Design details of power monitor are examined using simulation framework in UMC 90nm CMOS process. Experimental results of test chip fabricated in AMS 0.35µm CMOS process are presented. The test chip has variable activity between 0.05 and 0.5 and has PMOS VTH control through nWell contact. Maximum resolution obtained from power monitor is 0.25mV. Overhead of power monitor in terms of its power consumption is 0.244 mW (2.2% of total power of load circuit). Lastly, power monitor is used to demonstrate closed loop DVTS system. DVTS algorithm shows 46.3% power savings using in-situ power monitor.
{"title":"In-situ power monitoring scheme and its application in dynamic voltage and threshold scaling for digital CMOS integrated circuits","authors":"N. Mehta, G. Naik, B. Amrutur","doi":"10.1145/1840845.1840899","DOIUrl":"https://doi.org/10.1145/1840845.1840899","url":null,"abstract":"An in-situ power monitoring technique for Dynamic Voltage and Threshold scaling (DVTS) systems is proposed which measures total power consumed by load circuit using sleep transistor acting as power sensor. Design details of power monitor are examined using simulation framework in UMC 90nm CMOS process. Experimental results of test chip fabricated in AMS 0.35µm CMOS process are presented. The test chip has variable activity between 0.05 and 0.5 and has PMOS VTH control through nWell contact. Maximum resolution obtained from power monitor is 0.25mV. Overhead of power monitor in terms of its power consumption is 0.244 mW (2.2% of total power of load circuit). Lastly, power monitor is used to demonstrate closed loop DVTS system. DVTS algorithm shows 46.3% power savings using in-situ power monitor.","PeriodicalId":363131,"journal":{"name":"2010 ACM/IEEE International Symposium on Low-Power Electronics and Design (ISLPED)","volume":"7 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-08-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129182808","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Himanshu Markandeya, G. Karakonstantis, S. Raghunathan, P. Irazoqui, K. Roy
In this paper, we have developed a low-complexity algorithm for epileptic seizure detection with a high degree of accuracy. The algorithm has been designed to be feasibly implementable as battery-powered low-power implantable epileptic seizure detection system or epilepsy prosthesis. This is achieved by utilizing design optimization techniques at different levels of abstraction. Particularly, user-specific critical parameters are identified at the algorithmic level and are explicitly used along with multiplier-less implementations at the architecture level. The system has been tested on neural data obtained from in-vivo animal recordings and has been implemented in 90nm bulk-Si technology. The results show up to 90 % savings in power as compared to prevalent wavelet based seizure detection technique while achieving 97% average detection rate.
{"title":"Low-power DWT-based quasi-averaging algorithm and architecture for epileptic seizure detection","authors":"Himanshu Markandeya, G. Karakonstantis, S. Raghunathan, P. Irazoqui, K. Roy","doi":"10.1145/1840845.1840907","DOIUrl":"https://doi.org/10.1145/1840845.1840907","url":null,"abstract":"In this paper, we have developed a low-complexity algorithm for epileptic seizure detection with a high degree of accuracy. The algorithm has been designed to be feasibly implementable as battery-powered low-power implantable epileptic seizure detection system or epilepsy prosthesis. This is achieved by utilizing design optimization techniques at different levels of abstraction. Particularly, user-specific critical parameters are identified at the algorithmic level and are explicitly used along with multiplier-less implementations at the architecture level. The system has been tested on neural data obtained from in-vivo animal recordings and has been implemented in 90nm bulk-Si technology. The results show up to 90 % savings in power as compared to prevalent wavelet based seizure detection technique while achieving 97% average detection rate.","PeriodicalId":363131,"journal":{"name":"2010 ACM/IEEE International Symposium on Low-Power Electronics and Design (ISLPED)","volume":"19 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-08-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123880209","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}