Pub Date : 2019-04-05DOI: 10.1002/9781119179429.ch6
The first chapter introduces basic concepts of Reliability and their relationships. Four probability functions—reliability function, cumulative distribution function, probability density function, and hazard rate function—that completely characterize the failure process are defined. Three failure rates— MTBF, MTTF, MTTR—that play important role in reliability engineering design process are explained here. The three patterns of failures, DFR, CFR, and IFR, are discussed with reference to the bathtub curve. Two probability models, Exponential and Weibull, are presented. Series and parallel systems and application areas of reliability are also presented.
{"title":"Reliability Concepts","authors":"","doi":"10.1002/9781119179429.ch6","DOIUrl":"https://doi.org/10.1002/9781119179429.ch6","url":null,"abstract":"The first chapter introduces basic concepts of Reliability and their relationships. Four probability functions—reliability function, cumulative distribution function, probability density function, and hazard rate function—that completely characterize the failure process are defined. Three failure rates— MTBF, MTTF, MTTR—that play important role in reliability engineering design process are explained here. The three patterns of failures, DFR, CFR, and IFR, are discussed with reference to the bathtub curve. Two probability models, Exponential and Weibull, are presented. Series and parallel systems and application areas of reliability are also presented.","PeriodicalId":414386,"journal":{"name":"Improving Product Reliability and Software Quality","volume":"89 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-04-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124303484","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2019-04-05DOI: 10.1002/9781119179429.ch2
{"title":"Barriers to Implementing Hardware Reliability and Software Quality","authors":"","doi":"10.1002/9781119179429.ch2","DOIUrl":"https://doi.org/10.1002/9781119179429.ch2","url":null,"abstract":"","PeriodicalId":414386,"journal":{"name":"Improving Product Reliability and Software Quality","volume":"2012 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-04-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121507366","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2019-04-05DOI: 10.1002/9781119179429.ch7
Eberle A. Rambo, Alexander Tschiene, Jonas Diemer, Leonie Ahrendts, Rolf Ernst
{"title":"FMEA","authors":"Eberle A. Rambo, Alexander Tschiene, Jonas Diemer, Leonie Ahrendts, Rolf Ernst","doi":"10.1002/9781119179429.ch7","DOIUrl":"https://doi.org/10.1002/9781119179429.ch7","url":null,"abstract":"","PeriodicalId":414386,"journal":{"name":"Improving Product Reliability and Software Quality","volume":"35 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-04-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131368256","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2019-04-05DOI: 10.1002/9781119179429.ch11
{"title":"Software Life Cycles","authors":"","doi":"10.1002/9781119179429.ch11","DOIUrl":"https://doi.org/10.1002/9781119179429.ch11","url":null,"abstract":"","PeriodicalId":414386,"journal":{"name":"Improving Product Reliability and Software Quality","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-04-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126097292","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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